INDUCTION HEATING FLAW DETECTOR

PURPOSE:To obtain an induction heating flaw detector which enables the prevention of erroneous detection in a surface flaw detection of a bar-like material to be inspected even when a part with a lover infrared emissivity and a pin angle exists on a surface. CONSTITUTION:This apparatus is provided w...

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description PURPOSE:To obtain an induction heating flaw detector which enables the prevention of erroneous detection in a surface flaw detection of a bar-like material to be inspected even when a part with a lover infrared emissivity and a pin angle exists on a surface. CONSTITUTION:This apparatus is provided with an infrared camera 5 which takes infrared rays 4 to be radiated from the surface of a material 1 to be inspected heated by electromagnetic induction to obtain an image data and a video interface 6 and an image memory 7. Moreover, a normal-way differentiating part 8 and an opposite- way differentiating part 9 are arranged to perform a differentiation processing of a width-wise image date of the material 1 to be inspected from two directions while a synthesizing section 10 is provided to perform an AND processing of a bidirectional data obtained. A flaw judging section 11 is provided to judge flaws by the resulting synthetic data and a judgment level setting section 12 to set a judgment level. On the other hands, as a measure for erroneous detection because of a pin angle, a flaw histogram preparing section 13 is provided which totalizes a flaw judgment data for the overall length to obtain a flaw value distribution data per width position. Thus, a width-wise flaw judgment level is changed based on the flaw value distribution data to accomplish a rejudgment processing.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPH05142171A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPH05142171A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPH05142171A3</originalsourceid><addsrcrecordid>eNrjZJD39HMJdQ7x9PdT8HB1DPH0c1dw83EMV3BxDXF1DvEP4mFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8V4BHgamhiZGhuaGjsbEqAEA1xYhww</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>INDUCTION HEATING FLAW DETECTOR</title><source>esp@cenet</source><creator>FUJIMURA SHIGEO</creator><creatorcontrib>FUJIMURA SHIGEO</creatorcontrib><description>PURPOSE:To obtain an induction heating flaw detector which enables the prevention of erroneous detection in a surface flaw detection of a bar-like material to be inspected even when a part with a lover infrared emissivity and a pin angle exists on a surface. CONSTITUTION:This apparatus is provided with an infrared camera 5 which takes infrared rays 4 to be radiated from the surface of a material 1 to be inspected heated by electromagnetic induction to obtain an image data and a video interface 6 and an image memory 7. Moreover, a normal-way differentiating part 8 and an opposite- way differentiating part 9 are arranged to perform a differentiation processing of a width-wise image date of the material 1 to be inspected from two directions while a synthesizing section 10 is provided to perform an AND processing of a bidirectional data obtained. A flaw judging section 11 is provided to judge flaws by the resulting synthetic data and a judgment level setting section 12 to set a judgment level. On the other hands, as a measure for erroneous detection because of a pin angle, a flaw histogram preparing section 13 is provided which totalizes a flaw judgment data for the overall length to obtain a flaw value distribution data per width position. Thus, a width-wise flaw judgment level is changed based on the flaw value distribution data to accomplish a rejudgment processing.</description><language>eng</language><subject>ALARM SYSTEMS ; CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; ORDER TELEGRAPHS ; PHYSICS ; SIGNALLING ; SIGNALLING OR CALLING SYSTEMS ; TESTING</subject><creationdate>1993</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19930608&amp;DB=EPODOC&amp;CC=JP&amp;NR=H05142171A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19930608&amp;DB=EPODOC&amp;CC=JP&amp;NR=H05142171A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FUJIMURA SHIGEO</creatorcontrib><title>INDUCTION HEATING FLAW DETECTOR</title><description>PURPOSE:To obtain an induction heating flaw detector which enables the prevention of erroneous detection in a surface flaw detection of a bar-like material to be inspected even when a part with a lover infrared emissivity and a pin angle exists on a surface. CONSTITUTION:This apparatus is provided with an infrared camera 5 which takes infrared rays 4 to be radiated from the surface of a material 1 to be inspected heated by electromagnetic induction to obtain an image data and a video interface 6 and an image memory 7. Moreover, a normal-way differentiating part 8 and an opposite- way differentiating part 9 are arranged to perform a differentiation processing of a width-wise image date of the material 1 to be inspected from two directions while a synthesizing section 10 is provided to perform an AND processing of a bidirectional data obtained. A flaw judging section 11 is provided to judge flaws by the resulting synthetic data and a judgment level setting section 12 to set a judgment level. On the other hands, as a measure for erroneous detection because of a pin angle, a flaw histogram preparing section 13 is provided which totalizes a flaw judgment data for the overall length to obtain a flaw value distribution data per width position. Thus, a width-wise flaw judgment level is changed based on the flaw value distribution data to accomplish a rejudgment processing.</description><subject>ALARM SYSTEMS</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>ORDER TELEGRAPHS</subject><subject>PHYSICS</subject><subject>SIGNALLING</subject><subject>SIGNALLING OR CALLING SYSTEMS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1993</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJD39HMJdQ7x9PdT8HB1DPH0c1dw83EMV3BxDXF1DvEP4mFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8V4BHgamhiZGhuaGjsbEqAEA1xYhww</recordid><startdate>19930608</startdate><enddate>19930608</enddate><creator>FUJIMURA SHIGEO</creator><scope>EVB</scope></search><sort><creationdate>19930608</creationdate><title>INDUCTION HEATING FLAW DETECTOR</title><author>FUJIMURA SHIGEO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPH05142171A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1993</creationdate><topic>ALARM SYSTEMS</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>ORDER TELEGRAPHS</topic><topic>PHYSICS</topic><topic>SIGNALLING</topic><topic>SIGNALLING OR CALLING SYSTEMS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>FUJIMURA SHIGEO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FUJIMURA SHIGEO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INDUCTION HEATING FLAW DETECTOR</title><date>1993-06-08</date><risdate>1993</risdate><abstract>PURPOSE:To obtain an induction heating flaw detector which enables the prevention of erroneous detection in a surface flaw detection of a bar-like material to be inspected even when a part with a lover infrared emissivity and a pin angle exists on a surface. CONSTITUTION:This apparatus is provided with an infrared camera 5 which takes infrared rays 4 to be radiated from the surface of a material 1 to be inspected heated by electromagnetic induction to obtain an image data and a video interface 6 and an image memory 7. Moreover, a normal-way differentiating part 8 and an opposite- way differentiating part 9 are arranged to perform a differentiation processing of a width-wise image date of the material 1 to be inspected from two directions while a synthesizing section 10 is provided to perform an AND processing of a bidirectional data obtained. A flaw judging section 11 is provided to judge flaws by the resulting synthetic data and a judgment level setting section 12 to set a judgment level. On the other hands, as a measure for erroneous detection because of a pin angle, a flaw histogram preparing section 13 is provided which totalizes a flaw judgment data for the overall length to obtain a flaw value distribution data per width position. Thus, a width-wise flaw judgment level is changed based on the flaw value distribution data to accomplish a rejudgment processing.</abstract><oa>free_for_read</oa></addata></record>
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subjects ALARM SYSTEMS
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
ORDER TELEGRAPHS
PHYSICS
SIGNALLING
SIGNALLING OR CALLING SYSTEMS
TESTING
title INDUCTION HEATING FLAW DETECTOR
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