MEASURING METHOD FOR CENTER OF LASER DIODE LIGHT-EMITTING PATTERN

PURPOSE:To measure the center point of a light emission pattern precisely by sensing the max. brightness point, and also performing sensing of the center point position due to following of an arc of circle. CONSTITUTION:When the light from an LD element 1 is photographed by an infrared camera 2 and...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TAKANO SHIZUKA, OKAMURA KOJI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS DEVICES USING STIMULATED EMISSION ELECTRICITY MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!