SEMICONDUCTOR INTEGRATED CIRCUIT

PURPOSE:To test a high speed signal stably at the outside by writing a high- speed internal signal into a memory, and performing reading operation at a low speed. CONSTITUTION:A logic circuit 4 receives a control signal 3 from an input circuit 2 and also receives a data signal 18 for tests from a te...

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1. Verfasser:	ARIMOTO AKIYA
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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creator	ARIMOTO AKIYA
description	PURPOSE:To test a high speed signal stably at the outside by writing a high- speed internal signal into a memory, and performing reading operation at a low speed. CONSTITUTION:A logic circuit 4 receives a control signal 3 from an input circuit 2 and also receives a data signal 18 for tests from a test control circuit 16 as a data input 7 which can be read out and written (RWM). The logic circuit generates an output 9. The output 9 is written into an RWM 8 through an RWM-data input switch 22 under the control of an RWM control output 17 for the test. The verification of the output 9 is performed as follows. The change in state of the output 9 is sequentially written in the RWM 8, and the data are read out of the RWM 8 at a low speed. An RWM data output 14 is sent out through an input switch 24 for an output circuit. Thus the normal/ abnormal states can be judged.
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CONSTITUTION:A logic circuit 4 receives a control signal 3 from an input circuit 2 and also receives a data signal 18 for tests from a test control circuit 16 as a data input 7 which can be read out and written (RWM). The logic circuit generates an output 9. The output 9 is written into an RWM 8 through an RWM-data input switch 22 under the control of an RWM control output 17 for the test. The verification of the output 9 is performed as follows. The change in state of the output 9 is sequentially written in the RWM 8, and the data are read out of the RWM 8 at a low speed. An RWM data output 14 is sent out through an input switch 24 for an output circuit. 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CONSTITUTION:A logic circuit 4 receives a control signal 3 from an input circuit 2 and also receives a data signal 18 for tests from a test control circuit 16 as a data input 7 which can be read out and written (RWM). The logic circuit generates an output 9. The output 9 is written into an RWM 8 through an RWM-data input switch 22 under the control of an RWM control output 17 for the test. The verification of the output 9 is performed as follows. The change in state of the output 9 is sequentially written in the RWM 8, and the data are read out of the RWM 8 at a low speed. An RWM data output 14 is sent out through an input switch 24 for an output circuit. 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CONSTITUTION:A logic circuit 4 receives a control signal 3 from an input circuit 2 and also receives a data signal 18 for tests from a test control circuit 16 as a data input 7 which can be read out and written (RWM). The logic circuit generates an output 9. The output 9 is written into an RWM 8 through an RWM-data input switch 22 under the control of an RWM control output 17 for the test. The verification of the output 9 is performed as follows. The change in state of the output 9 is sequentially written in the RWM 8, and the data are read out of the RWM 8 at a low speed. An RWM data output 14 is sent out through an input switch 24 for an output circuit. Thus the normal/ abnormal states can be judged.</abstract><oa>free_for_read</oa></addata></record>
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subjects	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
title	SEMICONDUCTOR INTEGRATED CIRCUIT
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