SEMICONDUCTOR SUBSTRATE, MANUFACTURE THEREOF AND SEMICONDUCTOR DEVICE
PURPOSE:To obtain a semiconductor substrate by a pasting method which is suitable for manufacturing an element by a method wherein the plane orientation of main faces of a semiconductor crystal sheet and a semiconductor single-crystal thin film is a 100 plane and directions of inner-plane orientatio...
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creator | KETSUSAKO MITSUNORI |
description | PURPOSE:To obtain a semiconductor substrate by a pasting method which is suitable for manufacturing an element by a method wherein the plane orientation of main faces of a semiconductor crystal sheet and a semiconductor single-crystal thin film is a 100 plane and directions of inner-plane orientations of both are at mutually different angles. CONSTITUTION:At a semiconductor substrate in which a semiconductor single-crystal thin film 21 of a diamond-type crystal structure has been formed, via an insulator 24, on a semiconductor crystal sheet 22 having the same crystal structure, the plane orientation of main faces of the semiconductor crystal sheet 22 and the semiconductor single-crystal thin film 21 is a {100} plane; directions of inner-plane orientations of both are at mutually different angles. For example, two wafers whose surface is a 100 plane and which have orientation flats 23 in directions of and of Si wafers whose one face has been mirror-polished are prepared; oxide films whose thickness is 0.5mum are formed on their surface. The two wafers are piled up in such a way that mirror-polished faces are opposed. At this time, the orientation flats 23 are aligned. While the wafers are brought into close contact, they are heat-treated in a wet oxidizing atmosphere at 800 deg.C or higher. The oxide films between them are united and an insulating film 24 is formed. |
format | Patent |
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CONSTITUTION:At a semiconductor substrate in which a semiconductor single-crystal thin film 21 of a diamond-type crystal structure has been formed, via an insulator 24, on a semiconductor crystal sheet 22 having the same crystal structure, the plane orientation of main faces of the semiconductor crystal sheet 22 and the semiconductor single-crystal thin film 21 is a {100} plane; directions of inner-plane orientations of both are at mutually different angles. For example, two wafers whose surface is a 100 plane and which have orientation flats 23 in directions of and of Si wafers whose one face has been mirror-polished are prepared; oxide films whose thickness is 0.5mum are formed on their surface. The two wafers are piled up in such a way that mirror-polished faces are opposed. At this time, the orientation flats 23 are aligned. While the wafers are brought into close contact, they are heat-treated in a wet oxidizing atmosphere at 800 deg.C or higher. The oxide films between them are united and an insulating film 24 is formed.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>1991</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19911125&DB=EPODOC&CC=JP&NR=H03263809A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19911125&DB=EPODOC&CC=JP&NR=H03263809A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KETSUSAKO MITSUNORI</creatorcontrib><title>SEMICONDUCTOR SUBSTRATE, MANUFACTURE THEREOF AND SEMICONDUCTOR DEVICE</title><description>PURPOSE:To obtain a semiconductor substrate by a pasting method which is suitable for manufacturing an element by a method wherein the plane orientation of main faces of a semiconductor crystal sheet and a semiconductor single-crystal thin film is a 100 plane and directions of inner-plane orientations of both are at mutually different angles. CONSTITUTION:At a semiconductor substrate in which a semiconductor single-crystal thin film 21 of a diamond-type crystal structure has been formed, via an insulator 24, on a semiconductor crystal sheet 22 having the same crystal structure, the plane orientation of main faces of the semiconductor crystal sheet 22 and the semiconductor single-crystal thin film 21 is a {100} plane; directions of inner-plane orientations of both are at mutually different angles. For example, two wafers whose surface is a 100 plane and which have orientation flats 23 in directions of and of Si wafers whose one face has been mirror-polished are prepared; oxide films whose thickness is 0.5mum are formed on their surface. The two wafers are piled up in such a way that mirror-polished faces are opposed. At this time, the orientation flats 23 are aligned. While the wafers are brought into close contact, they are heat-treated in a wet oxidizing atmosphere at 800 deg.C or higher. 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CONSTITUTION:At a semiconductor substrate in which a semiconductor single-crystal thin film 21 of a diamond-type crystal structure has been formed, via an insulator 24, on a semiconductor crystal sheet 22 having the same crystal structure, the plane orientation of main faces of the semiconductor crystal sheet 22 and the semiconductor single-crystal thin film 21 is a {100} plane; directions of inner-plane orientations of both are at mutually different angles. For example, two wafers whose surface is a 100 plane and which have orientation flats 23 in directions of and of Si wafers whose one face has been mirror-polished are prepared; oxide films whose thickness is 0.5mum are formed on their surface. The two wafers are piled up in such a way that mirror-polished faces are opposed. At this time, the orientation flats 23 are aligned. While the wafers are brought into close contact, they are heat-treated in a wet oxidizing atmosphere at 800 deg.C or higher. The oxide films between them are united and an insulating film 24 is formed.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | SEMICONDUCTOR SUBSTRATE, MANUFACTURE THEREOF AND SEMICONDUCTOR DEVICE |
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