AUTOMATIC SELECTING METHOD
PURPOSE:To measure and select a succeeding metallic particle without influences of a preceding metallic particle thereby to avoid an erroneous detection by directing a probe of a color sensor to a metallic particle found at a terminal of a passage immediately before it falls down and checking said m...
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| creator | OKU NORIAKI SUZUKI SHIGEO ISHIMOTO HAYAHARU |
| description | PURPOSE:To measure and select a succeeding metallic particle without influences of a preceding metallic particle thereby to avoid an erroneous detection by directing a probe of a color sensor to a metallic particle found at a terminal of a passage immediately before it falls down and checking said metallic particle. CONSTITUTION:An upper surface of an electromagnetic feeder 22 is formed semi-circular in cross section to obtain a flow passage 21. Metallic particles S1-S3... run the central portion in a widthwise direction of the passage 21 and fall one by one from a terminal of the passage 21. The metallic particles S1-S3 at the terminal of the passage 21 immediately before falling down are caught by a probe 23a of a color sensor 23 so as to be checked and selected. At this time, the metallic particle S2 to be checked is not in touch with the preceding metallic particle S1, and therefore the particle S2 is not influenced by the particle S1. In other words, data can be obtained in the state where no erroneous detection takes place, whereby the selecting reliability can be improved. |
| format | Patent |
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In other words, data can be obtained in the state where no erroneous detection takes place, whereby the selecting reliability can be improved.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1990</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19900316&DB=EPODOC&CC=JP&NR=H0277639A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19900316&DB=EPODOC&CC=JP&NR=H0277639A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OKU NORIAKI</creatorcontrib><creatorcontrib>SUZUKI SHIGEO</creatorcontrib><creatorcontrib>ISHIMOTO HAYAHARU</creatorcontrib><title>AUTOMATIC SELECTING METHOD</title><description>PURPOSE:To measure and select a succeeding metallic particle without influences of a preceding metallic particle thereby to avoid an erroneous detection by directing a probe of a color sensor to a metallic particle found at a terminal of a passage immediately before it falls down and checking said metallic particle. 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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | AUTOMATIC SELECTING METHOD |
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