LOW TEMPERATURE PROBER

PURPOSE:To speedily and accurately measure the characteristics of a wafer type infrared-ray detecting element by fitting a holding jig to a probe and holding an aperture, and cooling the aperture with liquid nitrogen through the holding jig. CONSTITUTION:The wafer type infrared-ray detecting element...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	MURASHIMA SUSUMU
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS COLORIMETRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY SEMICONDUCTOR DEVICES TESTING
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