FLUORESCENCE X-RAY ANALYZER

PURPOSE:To achieve a higher analysis at a quantitative analysis or the like by correcting counts considering the effect of higher order rays of a coexistent element. CONSTITUTION:As Cu other than P coexists in an analysis, higher order rays (4-order rays) of CuKalpha are detected with an X-ray detec...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	NAKATANI TAKEHIKO
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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