RADIATION IMAGE ENLARGEMENT OBSERVATION DEVICE

PURPOSE:To obtain radiation images in the wavelength ranges of visible light and X rays at the same time with good reproducibility by providing detecting means for the X-ray image and visible light image to the titled device consisting of a radiation source, a radiation image enlargement part, and a...

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1. Verfasser: OSUGA SHINJI
Format: Patent
Sprache:eng
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Zusammenfassung:PURPOSE:To obtain radiation images in the wavelength ranges of visible light and X rays at the same time with good reproducibility by providing detecting means for the X-ray image and visible light image to the titled device consisting of a radiation source, a radiation image enlargement part, and a visible light path changing means. CONSTITUTION:The titled device consisting of the radiation source 1, a sample setting member 3, the radiation image enlargement part 6, and the visible light path changing means (oblique incidence reflecting mirror 7, reflecting mirror 10, light shield plate 8, etc.) is provided with an X-ray image pickup device 9 and a visible light image pickup device 110. Radiation projected on the sample 4 contains X rays and a visible light beam, which are enlarged by the oblique incidence reflecting mirror 7 and imaged on the X-ray image pickup device 9 after unnecessary radiation is cut by the light shield plate 8. Then an enlarged radiation image formed by reflected light (visible light) of the part cut off by the reflecting mirror 10 is formed on the photodetection surface of the visible-light image pickup device 110. Then the image pickup device 9 has sensitivity only to the X rays, so the X-ray image and visible-light image are obtained at the same time in parallel.