DATA PROCESSING SYSTEM FOR ANALYZING DEVICE

DATA PROCESSING SYSTEM FOR ANALYZING DEVICE

PURPOSE:To offer the data processing system which can be separated from the analyzing device by sending data from the analyzing device to a data processor through a data gathering terminal. CONSTITUTION:A handy terminal 3 is connected to an X-ray diffracting device 1 through a cable 4 first and an i...

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1. Verfasser: YOSHIZAWA KAZUYUKI
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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description PURPOSE:To offer the data processing system which can be separated from the analyzing device by sending data from the analyzing device to a data processor through a data gathering terminal. CONSTITUTION:A handy terminal 3 is connected to an X-ray diffracting device 1 through a cable 4 first and an indication for measuring operation is supplied with an input key to the device 1. Consequently, the device 1 obtains diffraction data on a sample. The obtained data is stored in the internal memory in the handy terminal 3 through the cable 4. Then the handy terminal 3 is detached from the device 1 and the data processor 2 is connected by the cable 4 similarly. The data processor 2 receives the data from the handy terminal 3 and takes a necessary analysis. Thus, the data processor 2 is disconnected from the X-ray diffracting device 1 and an operator performs data analyzing operation in living room, etc., and is prevented from being exposed to X rays leaking from the X-ray diffracting device 1.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title DATA PROCESSING SYSTEM FOR ANALYZING DEVICE
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