CONTACT PROBE

PURPOSE:To enhance inspection capacity by using an oxide high temp. superconductor body in the contact pin in contact with the part of an object to be measured. CONSTITUTION:A substrate 3 having an electronic part 1 mounted thereon is set above a contact pin 4 and, when the substrate 3 is moved towa...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	NAGANO TOSHIKI, TAKEI TOSHIYASU
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!