CONTACT PROBE

PURPOSE:To enhance inspection capacity by using an oxide high temp. superconductor body in the contact pin in contact with the part of an object to be measured. CONSTITUTION:A substrate 3 having an electronic part 1 mounted thereon is set above a contact pin 4 and, when the substrate 3 is moved toward a pin board 9, a part lead 1a is brought into contact with the pin 4. In this case, the pin 4 is composed of an oxide high temp. superconductor material having the characteristics shown by a drawing, and a spring 5, a plunger 6 and a sleeve 7 are constituted of a metal material. Therefore, continuity is generated between the electronic part 1 and a lead wire 8 to make it possible to inspect the part 1. Since this superconductor material shows a superconductor phenomenon at superconductor transition temp. Tc or less as shown by the drawing, electric resistance becomes zero at temp. equal to or less than said temp. Tc and contact resistance becomes zero at the inspection time of the part 1 and contact inferiority is eliminated. Since this substance shows the properties of ceramic, there is almost no oxidation at high temp. and the reaction with water frozen on the surface, electric resistance is not increased and varied even during an environmental test.