JP2842281B
A flux transformer comprises a pickup coil 1, an input coil 2 and a pair of lines 3, 4. The line 4 contains a bridge part 4a intersecting the input coil 2. The pickup coil 1, input coil 2 and a pair of lines 3, 4 are formed of a first and a second oxide superconducting thin films 11, 12. Furthermore...
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creator | HISAGAI JUICHI NAGAISHI RYUKI |
description | A flux transformer comprises a pickup coil 1, an input coil 2 and a pair of lines 3, 4. The line 4 contains a bridge part 4a intersecting the input coil 2. The pickup coil 1, input coil 2 and a pair of lines 3, 4 are formed of a first and a second oxide superconducting thin films 11, 12. Furthermore, the flux transformer comprises a non-superconducting thin film 13. The non-superconducting thin film 13 is disposed between the first and the second oxide superconducting thin films 11, 12 and is located in a domain where the line 4 intersects the input coil 2. A pattern of the first oxide superconducting thin film 11 corresponds to the pickup coil 1, the input coil 2 and the lines 3, 4 except the bridge part 4a. The pattern of the second oxide superconducting thin film 12 corresponds to the input coil 2 except the domain where the non-superconducting thin film exists, the pickup coil 1 and the lines 3, 4. Except in the domain where the non-superconducting thin film 13 exists, the second oxide superconducting thin film 12 are piled up directly atop the first oxide superconducting thin film 11 in all domains. |
format | Patent |
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The pickup coil 1, input coil 2 and a pair of lines 3, 4 are formed of a first and a second oxide superconducting thin films 11, 12. Furthermore, the flux transformer comprises a non-superconducting thin film 13. The non-superconducting thin film 13 is disposed between the first and the second oxide superconducting thin films 11, 12 and is located in a domain where the line 4 intersects the input coil 2. A pattern of the first oxide superconducting thin film 11 corresponds to the pickup coil 1, the input coil 2 and the lines 3, 4 except the bridge part 4a. The pattern of the second oxide superconducting thin film 12 corresponds to the input coil 2 except the domain where the non-superconducting thin film exists, the pickup coil 1 and the lines 3, 4. Except in the domain where the non-superconducting thin film 13 exists, the second oxide superconducting thin film 12 are piled up directly atop the first oxide superconducting thin film 11 in all domains.</description><edition>6</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INDUCTANCES ; MAGNETS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES ; SEMICONDUCTOR DEVICES ; TESTING ; TRANSFORMERS</subject><creationdate>1998</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19981224&DB=EPODOC&CC=JP&NR=2842281B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19981224&DB=EPODOC&CC=JP&NR=2842281B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HISAGAI JUICHI</creatorcontrib><creatorcontrib>NAGAISHI RYUKI</creatorcontrib><title>JP2842281B</title><description>A flux transformer comprises a pickup coil 1, an input coil 2 and a pair of lines 3, 4. The line 4 contains a bridge part 4a intersecting the input coil 2. The pickup coil 1, input coil 2 and a pair of lines 3, 4 are formed of a first and a second oxide superconducting thin films 11, 12. Furthermore, the flux transformer comprises a non-superconducting thin film 13. The non-superconducting thin film 13 is disposed between the first and the second oxide superconducting thin films 11, 12 and is located in a domain where the line 4 intersects the input coil 2. A pattern of the first oxide superconducting thin film 11 corresponds to the pickup coil 1, the input coil 2 and the lines 3, 4 except the bridge part 4a. The pattern of the second oxide superconducting thin film 12 corresponds to the input coil 2 except the domain where the non-superconducting thin film exists, the pickup coil 1 and the lines 3, 4. Except in the domain where the non-superconducting thin film 13 exists, the second oxide superconducting thin film 12 are piled up directly atop the first oxide superconducting thin film 11 in all domains.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INDUCTANCES</subject><subject>MAGNETS</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><subject>TRANSFORMERS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1998</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZODyCjCyMDEysjB04mFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8QgNTkbGxKgBACWvG2o</recordid><startdate>19981224</startdate><enddate>19981224</enddate><creator>HISAGAI JUICHI</creator><creator>NAGAISHI RYUKI</creator><scope>EVB</scope></search><sort><creationdate>19981224</creationdate><title>JP2842281B</title><author>HISAGAI JUICHI ; NAGAISHI RYUKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2842281BB23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1998</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INDUCTANCES</topic><topic>MAGNETS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><topic>TRANSFORMERS</topic><toplevel>online_resources</toplevel><creatorcontrib>HISAGAI JUICHI</creatorcontrib><creatorcontrib>NAGAISHI RYUKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HISAGAI JUICHI</au><au>NAGAISHI RYUKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>JP2842281B</title><date>1998-12-24</date><risdate>1998</risdate><abstract>A flux transformer comprises a pickup coil 1, an input coil 2 and a pair of lines 3, 4. The line 4 contains a bridge part 4a intersecting the input coil 2. The pickup coil 1, input coil 2 and a pair of lines 3, 4 are formed of a first and a second oxide superconducting thin films 11, 12. Furthermore, the flux transformer comprises a non-superconducting thin film 13. The non-superconducting thin film 13 is disposed between the first and the second oxide superconducting thin films 11, 12 and is located in a domain where the line 4 intersects the input coil 2. A pattern of the first oxide superconducting thin film 11 corresponds to the pickup coil 1, the input coil 2 and the lines 3, 4 except the bridge part 4a. The pattern of the second oxide superconducting thin film 12 corresponds to the input coil 2 except the domain where the non-superconducting thin film exists, the pickup coil 1 and the lines 3, 4. Except in the domain where the non-superconducting thin film 13 exists, the second oxide superconducting thin film 12 are piled up directly atop the first oxide superconducting thin film 11 in all domains.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INDUCTANCES MAGNETS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES SEMICONDUCTOR DEVICES TESTING TRANSFORMERS |
title | JP2842281B |
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