JP2557583B
A chip-lifetime testing instrument for semiconductor devices which can detect defective chips by testing the performance and electrical lifetime of the chips in manufacturing process of the semiconductor devices, so that the manufacturing cost can be reduced and unnecessary processes for packaging o...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | JON GIIYON PAKU KI YUN JINNHYUN KUON OO SHIKU |
| description | A chip-lifetime testing instrument for semiconductor devices which can detect defective chips by testing the performance and electrical lifetime of the chips in manufacturing process of the semiconductor devices, so that the manufacturing cost can be reduced and unnecessary processes for packaging of defective chips can be avoided, thereby reducing the necessary space for the set-up of the testing instrument. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2557583BB2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2557583BB2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2557583BB23</originalsourceid><addsrcrecordid>eNrjZODyCjAyNTU3tTB24mFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8QgNTkbGxKgBACoNG4I</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>JP2557583B</title><source>esp@cenet</source><creator>JON GIIYON ; PAKU KI ; YUN JINNHYUN ; KUON OO SHIKU</creator><creatorcontrib>JON GIIYON ; PAKU KI ; YUN JINNHYUN ; KUON OO SHIKU</creatorcontrib><description>A chip-lifetime testing instrument for semiconductor devices which can detect defective chips by testing the performance and electrical lifetime of the chips in manufacturing process of the semiconductor devices, so that the manufacturing cost can be reduced and unnecessary processes for packaging of defective chips can be avoided, thereby reducing the necessary space for the set-up of the testing instrument.</description><edition>6</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>1996</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19961127&DB=EPODOC&CC=JP&NR=2557583B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25568,76551</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19961127&DB=EPODOC&CC=JP&NR=2557583B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JON GIIYON</creatorcontrib><creatorcontrib>PAKU KI</creatorcontrib><creatorcontrib>YUN JINNHYUN</creatorcontrib><creatorcontrib>KUON OO SHIKU</creatorcontrib><title>JP2557583B</title><description>A chip-lifetime testing instrument for semiconductor devices which can detect defective chips by testing the performance and electrical lifetime of the chips in manufacturing process of the semiconductor devices, so that the manufacturing cost can be reduced and unnecessary processes for packaging of defective chips can be avoided, thereby reducing the necessary space for the set-up of the testing instrument.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1996</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZODyCjAyNTU3tTB24mFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8QgNTkbGxKgBACoNG4I</recordid><startdate>19961127</startdate><enddate>19961127</enddate><creator>JON GIIYON</creator><creator>PAKU KI</creator><creator>YUN JINNHYUN</creator><creator>KUON OO SHIKU</creator><scope>EVB</scope></search><sort><creationdate>19961127</creationdate><title>JP2557583B</title><author>JON GIIYON ; PAKU KI ; YUN JINNHYUN ; KUON OO SHIKU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2557583BB23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1996</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>JON GIIYON</creatorcontrib><creatorcontrib>PAKU KI</creatorcontrib><creatorcontrib>YUN JINNHYUN</creatorcontrib><creatorcontrib>KUON OO SHIKU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JON GIIYON</au><au>PAKU KI</au><au>YUN JINNHYUN</au><au>KUON OO SHIKU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>JP2557583B</title><date>1996-11-27</date><risdate>1996</risdate><abstract>A chip-lifetime testing instrument for semiconductor devices which can detect defective chips by testing the performance and electrical lifetime of the chips in manufacturing process of the semiconductor devices, so that the manufacturing cost can be reduced and unnecessary processes for packaging of defective chips can be avoided, thereby reducing the necessary space for the set-up of the testing instrument.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_JP2557583BB2 |
| source | esp@cenet |
| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | JP2557583B |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-17T03%3A58%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=JON%20GIIYON&rft.date=1996-11-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2557583BB2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |