ANALYSIS SUPPORT DEVICE, ANALYSIS SUPPORT METHOD, AND COMPUTER PROGRAM
To provide a technique which allows for easily grasping a relation between factors contributing to quality of a product.SOLUTION: An analysis support device comprises: an input operation unit; an acquisition unit which acquires a dataset; an objective variable setting unit which sets first acquired...
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| creator | HIRAOKA MASAKI KAJIMA MITSUNORI |
| description | To provide a technique which allows for easily grasping a relation between factors contributing to quality of a product.SOLUTION: An analysis support device comprises: an input operation unit; an acquisition unit which acquires a dataset; an objective variable setting unit which sets first acquired data received as a target of factor analysis from two or more pieces of acquired data included in the dataset, as an objective variable; a calculation unit which calculates correlation values indicating correlations between respective pieces of second acquired data out of pieces of acquired data included in the dataset and the objective variable; an extraction unit which extracts a piece of second acquired data as an explanatory variable and generates extraction data associating the objective variable and the explanatory variable, wherein a degree of correlation between the piece of second acquired data and the objective variable indicated by the correlation value exceeds a predetermined reference degree of correlation; and a visualizing unit which uses the extraction data to generate visualizing data hierarchically representing term names of the objective variable and term names of the explanatory variable.SELECTED DRAWING: Figure 17
【課題】製造物の品質に寄与する要因同士の関係を容易に把握できる技術を提供する。【解決手段】分析支援装置は、入力操作部と、データセットを取得する取得部と、データセットに含まれる２以上の取得データの中から要因分析の対象として受け付けた第１取得データを目的変数に設定する目的変数設定部と、データセットに含まれる取得データのうち、第２取得データのそれぞれと目的変数との相関関係を示す相関値を算出する算出部と、相関値によって示される相関関係の程度が予め定められた相関関係の基準程度より大きい第２取得データを説明変数として抽出して、目的変数と説明変数とを関連付けた抽出データを生成する抽出部と、抽出データを用いて、目的変数の項目名と説明変数の項目名とを階層的に示す可視化データを生成する可視化部と、を備える。【選択図】図１７ |
| format | Patent |
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【課題】製造物の品質に寄与する要因同士の関係を容易に把握できる技術を提供する。【解決手段】分析支援装置は、入力操作部と、データセットを取得する取得部と、データセットに含まれる２以上の取得データの中から要因分析の対象として受け付けた第１取得データを目的変数に設定する目的変数設定部と、データセットに含まれる取得データのうち、第２取得データのそれぞれと目的変数との相関関係を示す相関値を算出する算出部と、相関値によって示される相関関係の程度が予め定められた相関関係の基準程度より大きい第２取得データを説明変数として抽出して、目的変数と説明変数とを関連付けた抽出データを生成する抽出部と、抽出データを用いて、目的変数の項目名と説明変数の項目名とを階層的に示す可視化データを生成する可視化部と、を備える。【選択図】図１７</description><language>eng ; jpn</language><subject>CALCULATING ; COMPUTING ; CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; COUNTING ; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING ; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240913&DB=EPODOC&CC=JP&NR=2024124720A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240913&DB=EPODOC&CC=JP&NR=2024124720A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HIRAOKA MASAKI</creatorcontrib><creatorcontrib>KAJIMA MITSUNORI</creatorcontrib><title>ANALYSIS SUPPORT DEVICE, ANALYSIS SUPPORT METHOD, AND COMPUTER PROGRAM</title><description>To provide a technique which allows for easily grasping a relation between factors contributing to quality of a product.SOLUTION: An analysis support device comprises: an input operation unit; an acquisition unit which acquires a dataset; an objective variable setting unit which sets first acquired data received as a target of factor analysis from two or more pieces of acquired data included in the dataset, as an objective variable; a calculation unit which calculates correlation values indicating correlations between respective pieces of second acquired data out of pieces of acquired data included in the dataset and the objective variable; an extraction unit which extracts a piece of second acquired data as an explanatory variable and generates extraction data associating the objective variable and the explanatory variable, wherein a degree of correlation between the piece of second acquired data and the objective variable indicated by the correlation value exceeds a predetermined reference degree of correlation; and a visualizing unit which uses the extraction data to generate visualizing data hierarchically representing term names of the objective variable and term names of the explanatory variable.SELECTED DRAWING: Figure 17
【課題】製造物の品質に寄与する要因同士の関係を容易に把握できる技術を提供する。【解決手段】分析支援装置は、入力操作部と、データセットを取得する取得部と、データセットに含まれる２以上の取得データの中から要因分析の対象として受け付けた第１取得データを目的変数に設定する目的変数設定部と、データセットに含まれる取得データのうち、第２取得データのそれぞれと目的変数との相関関係を示す相関値を算出する算出部と、相関値によって示される相関関係の程度が予め定められた相関関係の基準程度より大きい第２取得データを説明変数として抽出して、目的変数と説明変数とを関連付けた抽出データを生成する抽出部と、抽出データを用いて、目的変数の項目名と説明変数の項目名とを階層的に示す可視化データを生成する可視化部と、を備える。【選択図】図１７</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>COUNTING</subject><subject>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><subject>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHBz9HP0iQz2DFYIDg0I8A8KUXBxDfN0dtVRwJDwdQ3x8HcBSbgoOPv7BoSGuAYpBAT5uwc5-vIwsKYl5hSn8kJpbgYlN9cQZw_d1IL8-NTigsTk1LzUknivACMDIxNDIxNzIwNHY6IUAQAq6iz2</recordid><startdate>20240913</startdate><enddate>20240913</enddate><creator>HIRAOKA MASAKI</creator><creator>KAJIMA MITSUNORI</creator><scope>EVB</scope></search><sort><creationdate>20240913</creationdate><title>ANALYSIS SUPPORT DEVICE, ANALYSIS SUPPORT METHOD, AND COMPUTER PROGRAM</title><author>HIRAOKA MASAKI ; KAJIMA MITSUNORI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2024124720A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>COUNTING</topic><topic>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><topic>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>HIRAOKA MASAKI</creatorcontrib><creatorcontrib>KAJIMA MITSUNORI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HIRAOKA MASAKI</au><au>KAJIMA MITSUNORI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ANALYSIS SUPPORT DEVICE, ANALYSIS SUPPORT METHOD, AND COMPUTER PROGRAM</title><date>2024-09-13</date><risdate>2024</risdate><abstract>To provide a technique which allows for easily grasping a relation between factors contributing to quality of a product.SOLUTION: An analysis support device comprises: an input operation unit; an acquisition unit which acquires a dataset; an objective variable setting unit which sets first acquired data received as a target of factor analysis from two or more pieces of acquired data included in the dataset, as an objective variable; a calculation unit which calculates correlation values indicating correlations between respective pieces of second acquired data out of pieces of acquired data included in the dataset and the objective variable; an extraction unit which extracts a piece of second acquired data as an explanatory variable and generates extraction data associating the objective variable and the explanatory variable, wherein a degree of correlation between the piece of second acquired data and the objective variable indicated by the correlation value exceeds a predetermined reference degree of correlation; and a visualizing unit which uses the extraction data to generate visualizing data hierarchically representing term names of the objective variable and term names of the explanatory variable.SELECTED DRAWING: Figure 17
【課題】製造物の品質に寄与する要因同士の関係を容易に把握できる技術を提供する。【解決手段】分析支援装置は、入力操作部と、データセットを取得する取得部と、データセットに含まれる２以上の取得データの中から要因分析の対象として受け付けた第１取得データを目的変数に設定する目的変数設定部と、データセットに含まれる取得データのうち、第２取得データのそれぞれと目的変数との相関関係を示す相関値を算出する算出部と、相関値によって示される相関関係の程度が予め定められた相関関係の基準程度より大きい第２取得データを説明変数として抽出して、目的変数と説明変数とを関連付けた抽出データを生成する抽出部と、抽出データを用いて、目的変数の項目名と説明変数の項目名とを階層的に示す可視化データを生成する可視化部と、を備える。【選択図】図１７</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR |
| title | ANALYSIS SUPPORT DEVICE, ANALYSIS SUPPORT METHOD, AND COMPUTER PROGRAM |
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