POLARIZED LIGHT SHEET
To provide a method for measuring a polarized light laminate with less optical distortion measured by MIL-DTL-43511D.SOLUTION: A method for measuring optical distortion of a subject comprises the steps of: placing a subject in an optical tester having a diffraction grating; acquiring an image of a b...
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creator | MATSUNO YUYA KIMURA HIDEAKI OKAZAKI KOTA AKAKI MASAYUKI |
description | To provide a method for measuring a polarized light laminate with less optical distortion measured by MIL-DTL-43511D.SOLUTION: A method for measuring optical distortion of a subject comprises the steps of: placing a subject in an optical tester having a diffraction grating; acquiring an image of a bright line of the subject passing through the diffraction grating set in the optical tester; determining a shape of one or more bright lines transmitted through the diffraction grating; and determining a degree of optical distortion of a polarized light laminate using the shape of the bright line.SELECTED DRAWING: Figure 3
【課題】MIL-DTL-43511Dにて測定される光学歪みが少ない偏光積層体を測定する方法を提供する。【解決手段】回折格子を備える光学テスターに被検体を設置する工程と、光学テスターにセットされた回折格子を透過する被検体の明線の画像を取得する工程と、回折格子を透過した1つ以上の明線の形状を決定する工程と、明線の形状を用いて、偏光積層体の光学歪みの程度を決定する工程と、を含む、被検体の光学歪みを測定する方法。【選択図】図3 |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2024101781A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2024101781A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2024101781A3</originalsourceid><addsrcrecordid>eNrjZBAN8PdxDPKMcnVR8PF09whRCPZwdQ3hYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBkYmhgaG5haGjsZEKQIA0OUfPw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>POLARIZED LIGHT SHEET</title><source>esp@cenet</source><creator>MATSUNO YUYA ; KIMURA HIDEAKI ; OKAZAKI KOTA ; AKAKI MASAYUKI</creator><creatorcontrib>MATSUNO YUYA ; KIMURA HIDEAKI ; OKAZAKI KOTA ; AKAKI MASAYUKI</creatorcontrib><description>To provide a method for measuring a polarized light laminate with less optical distortion measured by MIL-DTL-43511D.SOLUTION: A method for measuring optical distortion of a subject comprises the steps of: placing a subject in an optical tester having a diffraction grating; acquiring an image of a bright line of the subject passing through the diffraction grating set in the optical tester; determining a shape of one or more bright lines transmitted through the diffraction grating; and determining a degree of optical distortion of a polarized light laminate using the shape of the bright line.SELECTED DRAWING: Figure 3
【課題】MIL-DTL-43511Dにて測定される光学歪みが少ない偏光積層体を測定する方法を提供する。【解決手段】回折格子を備える光学テスターに被検体を設置する工程と、光学テスターにセットされた回折格子を透過する被検体の明線の画像を取得する工程と、回折格子を透過した1つ以上の明線の形状を決定する工程と、明線の形状を用いて、偏光積層体の光学歪みの程度を決定する工程と、を含む、被検体の光学歪みを測定する方法。【選択図】図3</description><language>eng ; jpn</language><subject>CONTACT LENSES ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; SPECTACLES ; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURESAS SPECTACLES ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240730&DB=EPODOC&CC=JP&NR=2024101781A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240730&DB=EPODOC&CC=JP&NR=2024101781A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MATSUNO YUYA</creatorcontrib><creatorcontrib>KIMURA HIDEAKI</creatorcontrib><creatorcontrib>OKAZAKI KOTA</creatorcontrib><creatorcontrib>AKAKI MASAYUKI</creatorcontrib><title>POLARIZED LIGHT SHEET</title><description>To provide a method for measuring a polarized light laminate with less optical distortion measured by MIL-DTL-43511D.SOLUTION: A method for measuring optical distortion of a subject comprises the steps of: placing a subject in an optical tester having a diffraction grating; acquiring an image of a bright line of the subject passing through the diffraction grating set in the optical tester; determining a shape of one or more bright lines transmitted through the diffraction grating; and determining a degree of optical distortion of a polarized light laminate using the shape of the bright line.SELECTED DRAWING: Figure 3
【課題】MIL-DTL-43511Dにて測定される光学歪みが少ない偏光積層体を測定する方法を提供する。【解決手段】回折格子を備える光学テスターに被検体を設置する工程と、光学テスターにセットされた回折格子を透過する被検体の明線の画像を取得する工程と、回折格子を透過した1つ以上の明線の形状を決定する工程と、明線の形状を用いて、偏光積層体の光学歪みの程度を決定する工程と、を含む、被検体の光学歪みを測定する方法。【選択図】図3</description><subject>CONTACT LENSES</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>SPECTACLES</subject><subject>SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURESAS SPECTACLES</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBAN8PdxDPKMcnVR8PF09whRCPZwdQ3hYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBkYmhgaG5haGjsZEKQIA0OUfPw</recordid><startdate>20240730</startdate><enddate>20240730</enddate><creator>MATSUNO YUYA</creator><creator>KIMURA HIDEAKI</creator><creator>OKAZAKI KOTA</creator><creator>AKAKI MASAYUKI</creator><scope>EVB</scope></search><sort><creationdate>20240730</creationdate><title>POLARIZED LIGHT SHEET</title><author>MATSUNO YUYA ; KIMURA HIDEAKI ; OKAZAKI KOTA ; AKAKI MASAYUKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2024101781A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2024</creationdate><topic>CONTACT LENSES</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>SPECTACLES</topic><topic>SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURESAS SPECTACLES</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>MATSUNO YUYA</creatorcontrib><creatorcontrib>KIMURA HIDEAKI</creatorcontrib><creatorcontrib>OKAZAKI KOTA</creatorcontrib><creatorcontrib>AKAKI MASAYUKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MATSUNO YUYA</au><au>KIMURA HIDEAKI</au><au>OKAZAKI KOTA</au><au>AKAKI MASAYUKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>POLARIZED LIGHT SHEET</title><date>2024-07-30</date><risdate>2024</risdate><abstract>To provide a method for measuring a polarized light laminate with less optical distortion measured by MIL-DTL-43511D.SOLUTION: A method for measuring optical distortion of a subject comprises the steps of: placing a subject in an optical tester having a diffraction grating; acquiring an image of a bright line of the subject passing through the diffraction grating set in the optical tester; determining a shape of one or more bright lines transmitted through the diffraction grating; and determining a degree of optical distortion of a polarized light laminate using the shape of the bright line.SELECTED DRAWING: Figure 3
【課題】MIL-DTL-43511Dにて測定される光学歪みが少ない偏光積層体を測定する方法を提供する。【解決手段】回折格子を備える光学テスターに被検体を設置する工程と、光学テスターにセットされた回折格子を透過する被検体の明線の画像を取得する工程と、回折格子を透過した1つ以上の明線の形状を決定する工程と、明線の形状を用いて、偏光積層体の光学歪みの程度を決定する工程と、を含む、被検体の光学歪みを測定する方法。【選択図】図3</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CONTACT LENSES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS SPECTACLES SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURESAS SPECTACLES TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
title | POLARIZED LIGHT SHEET |
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