PROCESSOR
To appropriately discriminate an abnormal value from among measurement values of the thickness of an object by a pulse eddy current flaw detection.SOLUTION: A processor 5 includes: a collector 54 for continuously collecting measurement values of the thickness of an object 9 measured by pulse eddy cu...
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creator | TOKIOKA YOSHINORI |
description | To appropriately discriminate an abnormal value from among measurement values of the thickness of an object by a pulse eddy current flaw detection.SOLUTION: A processor 5 includes: a collector 54 for continuously collecting measurement values of the thickness of an object 9 measured by pulse eddy current flaw detection; and a discriminator 55 for discriminating an abnormal value from among measurement value groups as sets of measurement values collected by the collector 54. The discriminator 55 executes first discrimination for discriminating a first abnormal value from among measurement value groups on the basis of measurement values during a first predetermined period from among measurement value groups, and second discrimination for removing the first abnormal value from measurement values during a second period longer than the first period from among measurement value groups and discriminating a second abnormal value from among measurement value groups on the basis of a change with time of measurement values during the second period when the first abnormal value is removed.SELECTED DRAWING: Figure 5
【課題】パルス渦流探傷による対象物の厚さの測定値の中から異常値を適切に判別する。【解決手段】処理装置5は、パルス渦流探傷によって測定された対象物9の厚さの測定値を継続的に収集する収集器54と、収集器54によって収集された測定値の集合である測定値群の中から異常値を判別する判別器55とを備えている。判別器55は、測定値群のうちの所定の第1期間中の測定値に基づいて測定値群の中から第1異常値を判別する第1判別と、測定値群のうちの第1期間よりも長い第2期間中の測定値から第1異常値を除去して、第1異常値が除去された第2期間中の測定値の経時変化に基づいて測定値群の中から第2異常値を判別する第2判別とを実行する。【選択図】図5 |
format | Patent |
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【課題】パルス渦流探傷による対象物の厚さの測定値の中から異常値を適切に判別する。【解決手段】処理装置5は、パルス渦流探傷によって測定された対象物9の厚さの測定値を継続的に収集する収集器54と、収集器54によって収集された測定値の集合である測定値群の中から異常値を判別する判別器55とを備えている。判別器55は、測定値群のうちの所定の第1期間中の測定値に基づいて測定値群の中から第1異常値を判別する第1判別と、測定値群のうちの第1期間よりも長い第2期間中の測定値から第1異常値を除去して、第1異常値が除去された第2期間中の測定値の経時変化に基づいて測定値群の中から第2異常値を判別する第2判別とを実行する。【選択図】図5</description><language>eng ; jpn</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240430&DB=EPODOC&CC=JP&NR=2024059042A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25544,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240430&DB=EPODOC&CC=JP&NR=2024059042A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TOKIOKA YOSHINORI</creatorcontrib><title>PROCESSOR</title><description>To appropriately discriminate an abnormal value from among measurement values of the thickness of an object by a pulse eddy current flaw detection.SOLUTION: A processor 5 includes: a collector 54 for continuously collecting measurement values of the thickness of an object 9 measured by pulse eddy current flaw detection; and a discriminator 55 for discriminating an abnormal value from among measurement value groups as sets of measurement values collected by the collector 54. The discriminator 55 executes first discrimination for discriminating a first abnormal value from among measurement value groups on the basis of measurement values during a first predetermined period from among measurement value groups, and second discrimination for removing the first abnormal value from measurement values during a second period longer than the first period from among measurement value groups and discriminating a second abnormal value from among measurement value groups on the basis of a change with time of measurement values during the second period when the first abnormal value is removed.SELECTED DRAWING: Figure 5
【課題】パルス渦流探傷による対象物の厚さの測定値の中から異常値を適切に判別する。【解決手段】処理装置5は、パルス渦流探傷によって測定された対象物9の厚さの測定値を継続的に収集する収集器54と、収集器54によって収集された測定値の集合である測定値群の中から異常値を判別する判別器55とを備えている。判別器55は、測定値群のうちの所定の第1期間中の測定値に基づいて測定値群の中から第1異常値を判別する第1判別と、測定値群のうちの第1期間よりも長い第2期間中の測定値から第1異常値を除去して、第1異常値が除去された第2期間中の測定値の経時変化に基づいて測定値群の中から第2異常値を判別する第2判別とを実行する。【選択図】図5</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZOAMCPJ3dg0O9g_iYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBkYmBqaWBiZGjsZEKQIAgBQcHA</recordid><startdate>20240430</startdate><enddate>20240430</enddate><creator>TOKIOKA YOSHINORI</creator><scope>EVB</scope></search><sort><creationdate>20240430</creationdate><title>PROCESSOR</title><author>TOKIOKA YOSHINORI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2024059042A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TOKIOKA YOSHINORI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TOKIOKA YOSHINORI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PROCESSOR</title><date>2024-04-30</date><risdate>2024</risdate><abstract>To appropriately discriminate an abnormal value from among measurement values of the thickness of an object by a pulse eddy current flaw detection.SOLUTION: A processor 5 includes: a collector 54 for continuously collecting measurement values of the thickness of an object 9 measured by pulse eddy current flaw detection; and a discriminator 55 for discriminating an abnormal value from among measurement value groups as sets of measurement values collected by the collector 54. The discriminator 55 executes first discrimination for discriminating a first abnormal value from among measurement value groups on the basis of measurement values during a first predetermined period from among measurement value groups, and second discrimination for removing the first abnormal value from measurement values during a second period longer than the first period from among measurement value groups and discriminating a second abnormal value from among measurement value groups on the basis of a change with time of measurement values during the second period when the first abnormal value is removed.SELECTED DRAWING: Figure 5
【課題】パルス渦流探傷による対象物の厚さの測定値の中から異常値を適切に判別する。【解決手段】処理装置5は、パルス渦流探傷によって測定された対象物9の厚さの測定値を継続的に収集する収集器54と、収集器54によって収集された測定値の集合である測定値群の中から異常値を判別する判別器55とを備えている。判別器55は、測定値群のうちの所定の第1期間中の測定値に基づいて測定値群の中から第1異常値を判別する第1判別と、測定値群のうちの第1期間よりも長い第2期間中の測定値から第1異常値を除去して、第1異常値が除去された第2期間中の測定値の経時変化に基づいて測定値群の中から第2異常値を判別する第2判別とを実行する。【選択図】図5</abstract><oa>free_for_read</oa></addata></record> |
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subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
title | PROCESSOR |
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