METHOD OF INSPECTING TEMPERATURE-CONTROLLING SYSTEM

To provide a method of inspecting a temperature-controlling system.SOLUTION: The method comprises: generating a measurement matrix based on current measurement values of the temperature-controlling system; calculating a transformation matrix having the same dimensions as the measurement matrix, base...

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Hauptverfasser:	LEE CHUNGWOO, JU YUNSIK
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC HEATING ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES
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creator	LEE CHUNGWOO JU YUNSIK
description	To provide a method of inspecting a temperature-controlling system.SOLUTION: The method comprises: generating a measurement matrix based on current measurement values of the temperature-controlling system; calculating a transformation matrix having the same dimensions as the measurement matrix, based on the measurement matrix; calculating an auxiliary matrix having the same dimensions as the measurement matrix, based on the transformation matrix; and calculating a defect matrix representing defective diodes among multiple diodes, based on a difference operation between the auxiliary matrix and the transformation matrix.SELECTED DRAWING: Figure 1 【課題】温度制御システムの検査方法を提供する。【解決手段】温度制御システムの電流測定値に基づいて計測行列を生成する段階；計測行列に基づいて計測行列と同じ次元を有する変換行列を算出する段階；及び変換行列に基づいて計測行列と同じ次元を有する補助行列を算出する段階；及び補助行列と変換行列との差分演算に基づいて、複数のダイオードのうち、欠陥ダイオードを示す欠陥マトリックスを算出する段階；を含む方法である。【選択図】図１
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calculating a transformation matrix having the same dimensions as the measurement matrix, based on the measurement matrix; calculating an auxiliary matrix having the same dimensions as the measurement matrix, based on the transformation matrix; and calculating a defect matrix representing defective diodes among multiple diodes, based on a difference operation between the auxiliary matrix and the transformation matrix.SELECTED DRAWING: Figure 1 【課題】温度制御システムの検査方法を提供する。【解決手段】温度制御システムの電流測定値に基づいて計測行列を生成する段階；計測行列に基づいて計測行列と同じ次元を有する変換行列を算出する段階；及び変換行列に基づいて計測行列と同じ次元を有する補助行列を算出する段階；及び補助行列と変換行列との差分演算に基づいて、複数のダイオードのうち、欠陥ダイオードを示す欠陥マトリックスを算出する段階；を含む方法である。【選択図】図１</description><language>eng ; jpn</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC HEATING ; ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240117&DB=EPODOC&CC=JP&NR=2024006987A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240117&DB=EPODOC&CC=JP&NR=2024006987A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LEE CHUNGWOO</creatorcontrib><creatorcontrib>JU YUNSIK</creatorcontrib><title>METHOD OF INSPECTING TEMPERATURE-CONTROLLING SYSTEM</title><description>To provide a method of inspecting a temperature-controlling system.SOLUTION: The method comprises: generating a measurement matrix based on current measurement values of the temperature-controlling system; 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JU YUNSIK</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2024006987A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC HEATING</topic><topic>ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>LEE CHUNGWOO</creatorcontrib><creatorcontrib>JU YUNSIK</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LEE CHUNGWOO</au><au>JU YUNSIK</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD OF INSPECTING TEMPERATURE-CONTROLLING SYSTEM</title><date>2024-01-17</date><risdate>2024</risdate><abstract>To provide a method of inspecting a temperature-controlling system.SOLUTION: The method comprises: generating a measurement matrix based on current measurement values of the temperature-controlling system; calculating a transformation matrix having the same dimensions as the measurement matrix, based on the measurement matrix; calculating an auxiliary matrix having the same dimensions as the measurement matrix, based on the transformation matrix; and calculating a defect matrix representing defective diodes among multiple diodes, based on a difference operation between the auxiliary matrix and the transformation matrix.SELECTED DRAWING: Figure 1 【課題】温度制御システムの検査方法を提供する。【解決手段】温度制御システムの電流測定値に基づいて計測行列を生成する段階；計測行列に基づいて計測行列と同じ次元を有する変換行列を算出する段階；及び変換行列に基づいて計測行列と同じ次元を有する補助行列を算出する段階；及び補助行列と変換行列との差分演算に基づいて、複数のダイオードのうち、欠陥ダイオードを示す欠陥マトリックスを算出する段階；を含む方法である。【選択図】図１</abstract><oa>free_for_read</oa></addata></record>
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subjects	BASIC ELECTRIC ELEMENTS ELECTRIC HEATING ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES
title	METHOD OF INSPECTING TEMPERATURE-CONTROLLING SYSTEM
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