MATERIAL IDENTIFICATION SYSTEM, MATERIAL IDENTIFICATION DEVICE AND MATERIAL IDENTIFICATION PROGRAM
To provide a material identification system, a material identification device and a material identification program, configured to identify a material of an object with high accuracy and reduce a cost.SOLUTION: A material identification system according to one aspect includes a visible light data ac...
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| creator | WATANABE YOSHIO MURAKAMI YASUKI MIYAZAKI TAKAHIRO |
| description | To provide a material identification system, a material identification device and a material identification program, configured to identify a material of an object with high accuracy and reduce a cost.SOLUTION: A material identification system according to one aspect includes a visible light data acquisition device that acquires visible light data of a visible light image. The material identification system includes an infrared data acquisition device that emits infrared rays having specific waves to acquire infrared data. Further, the material identification system includes a material identification unit that identifies a kind of the object and a material of the object included in the visible light image on the basis of the visible light data, and when the material of the object cannot be not identified on the basis of the visible light data, identifies the material of the object on the basis of the infrared data.SELECTED DRAWING: Figure 1
【課題】物体の材質を精度よく特定するとともに、コストを低減させるようにした材質特定システム、材質特定装置、及び材質特定プログラムを提供する。【解決手段】一態様に材質特定システムは、可視光画像の可視光データを取得する可視光データ取得装置を含む。また、前記材質特定システムは、特定波長の赤外線を照射して、赤外線データを取得する赤外線データ取得装置を含む。更に、前記材質特定システムは、可視光データに基づいて、可視光画像に含まれる物体の種別と物体の材質とを特定し、可視光データに基づいて物体の材質を特定することができなかったとき、赤外線データに基づいて、物体の材質を特定する材質特定部を含む。【選択図】図１ |
| format | Patent |
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【課題】物体の材質を精度よく特定するとともに、コストを低減させるようにした材質特定システム、材質特定装置、及び材質特定プログラムを提供する。【解決手段】一態様に材質特定システムは、可視光画像の可視光データを取得する可視光データ取得装置を含む。また、前記材質特定システムは、特定波長の赤外線を照射して、赤外線データを取得する赤外線データ取得装置を含む。更に、前記材質特定システムは、可視光データに基づいて、可視光画像に含まれる物体の種別と物体の材質とを特定し、可視光データに基づいて物体の材質を特定することができなかったとき、赤外線データに基づいて、物体の材質を特定する材質特定部を含む。【選択図】図１</description><language>eng ; jpn</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240115&DB=EPODOC&CC=JP&NR=2024003694A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240115&DB=EPODOC&CC=JP&NR=2024003694A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WATANABE YOSHIO</creatorcontrib><creatorcontrib>MURAKAMI YASUKI</creatorcontrib><creatorcontrib>MIYAZAKI TAKAHIRO</creatorcontrib><title>MATERIAL IDENTIFICATION SYSTEM, MATERIAL IDENTIFICATION DEVICE AND MATERIAL IDENTIFICATION PROGRAM</title><description>To provide a material identification system, a material identification device and a material identification program, configured to identify a material of an object with high accuracy and reduce a cost.SOLUTION: A material identification system according to one aspect includes a visible light data acquisition device that acquires visible light data of a visible light image. The material identification system includes an infrared data acquisition device that emits infrared rays having specific waves to acquire infrared data. Further, the material identification system includes a material identification unit that identifies a kind of the object and a material of the object included in the visible light image on the basis of the visible light data, and when the material of the object cannot be not identified on the basis of the visible light data, identifies the material of the object on the basis of the infrared data.SELECTED DRAWING: Figure 1
【課題】物体の材質を精度よく特定するとともに、コストを低減させるようにした材質特定システム、材質特定装置、及び材質特定プログラムを提供する。【解決手段】一態様に材質特定システムは、可視光画像の可視光データを取得する可視光データ取得装置を含む。また、前記材質特定システムは、特定波長の赤外線を照射して、赤外線データを取得する赤外線データ取得装置を含む。更に、前記材質特定システムは、可視光データに基づいて、可視光画像に含まれる物体の種別と物体の材質とを特定し、可視光データに基づいて物体の材質を特定することができなかったとき、赤外線データに基づいて、物体の材質を特定する材質特定部を含む。【選択図】図１</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZEjydQxxDfJ09FHwdHH1C_F083R2DPH091MIjgwOcfXVUcAl7-Ia5unsquDo54JTSUCQv3uQoy8PA2taYk5xKi-U5mZQcnMNcfbQTS3Ij08tLkhMTs1LLYn3CjAyMDIxMDA2szRxNCZKEQBlWTSQ</recordid><startdate>20240115</startdate><enddate>20240115</enddate><creator>WATANABE YOSHIO</creator><creator>MURAKAMI YASUKI</creator><creator>MIYAZAKI TAKAHIRO</creator><scope>EVB</scope></search><sort><creationdate>20240115</creationdate><title>MATERIAL IDENTIFICATION SYSTEM, MATERIAL IDENTIFICATION DEVICE AND MATERIAL IDENTIFICATION PROGRAM</title><author>WATANABE YOSHIO ; MURAKAMI YASUKI ; MIYAZAKI TAKAHIRO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2024003694A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2024</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WATANABE YOSHIO</creatorcontrib><creatorcontrib>MURAKAMI YASUKI</creatorcontrib><creatorcontrib>MIYAZAKI TAKAHIRO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WATANABE YOSHIO</au><au>MURAKAMI YASUKI</au><au>MIYAZAKI TAKAHIRO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MATERIAL IDENTIFICATION SYSTEM, MATERIAL IDENTIFICATION DEVICE AND MATERIAL IDENTIFICATION PROGRAM</title><date>2024-01-15</date><risdate>2024</risdate><abstract>To provide a material identification system, a material identification device and a material identification program, configured to identify a material of an object with high accuracy and reduce a cost.SOLUTION: A material identification system according to one aspect includes a visible light data acquisition device that acquires visible light data of a visible light image. The material identification system includes an infrared data acquisition device that emits infrared rays having specific waves to acquire infrared data. Further, the material identification system includes a material identification unit that identifies a kind of the object and a material of the object included in the visible light image on the basis of the visible light data, and when the material of the object cannot be not identified on the basis of the visible light data, identifies the material of the object on the basis of the infrared data.SELECTED DRAWING: Figure 1
【課題】物体の材質を精度よく特定するとともに、コストを低減させるようにした材質特定システム、材質特定装置、及び材質特定プログラムを提供する。【解決手段】一態様に材質特定システムは、可視光画像の可視光データを取得する可視光データ取得装置を含む。また、前記材質特定システムは、特定波長の赤外線を照射して、赤外線データを取得する赤外線データ取得装置を含む。更に、前記材質特定システムは、可視光データに基づいて、可視光画像に含まれる物体の種別と物体の材質とを特定し、可視光データに基づいて物体の材質を特定することができなかったとき、赤外線データに基づいて、物体の材質を特定する材質特定部を含む。【選択図】図１</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | MATERIAL IDENTIFICATION SYSTEM, MATERIAL IDENTIFICATION DEVICE AND MATERIAL IDENTIFICATION PROGRAM |
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