PATTERN ESTIMATION DEVICE, PATTERN ESTIMATION METHOD, PATTERN REFERENCE INFORMATION GENERATION DEVICE, PATTERN REFERENCE INFORMATION GENERATION METHOD, PROGRAM, AND RECORDING MEDIUM

PATTERN ESTIMATION DEVICE, PATTERN ESTIMATION METHOD, PATTERN REFERENCE INFORMATION GENERATION DEVICE, PATTERN REFERENCE INFORMATION GENERATION METHOD, PROGRAM, AND RECORDING MEDIUM

To allow for extracting specific elements from various surrounding situations to estimate events in specific patterns.SOLUTION: A pattern estimation device 10 of the present invention comprises a measured data generation unit 20 configured to generate measured data including category scores and meas...

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Hauptverfasser: INOUE SHUNSUKE, SAITO MINAE, TAKENAKA SOHEI, YAMAKI MASAYUKI, TAKAHASHI YURIKO
Format: Patent
Sprache:eng ; jpn
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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creator INOUE SHUNSUKE
SAITO MINAE
TAKENAKA SOHEI
YAMAKI MASAYUKI
TAKAHASHI YURIKO
description To allow for extracting specific elements from various surrounding situations to estimate events in specific patterns.SOLUTION: A pattern estimation device 10 of the present invention comprises a measured data generation unit 20 configured to generate measured data including category scores and measured values as measured data for a subject, and an estimation unit 30 configured to compare the measurement values with reference values included in preset pattern reference information to estimate a pattern involving reference values satisfying preset conditions.SELECTED DRAWING: Figure 1 【課題】 様々な周辺状況から特定の要素を抽出し、特定のパターンの事象を推定すること。【解決手段】 本発明のパターン推定装置１０において、実測データ生成部２０は、調査対象者における実測データとして、カテゴリ点数及び実測値を含む実測データを生成し、推定部３０は、予め設定されたパターン基準情報に含まれる基準値と、前記実測値とを比較し、予め設定した条件を満たす基準値の属するパターンを推定する。【選択図】 図１
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title PATTERN ESTIMATION DEVICE, PATTERN ESTIMATION METHOD, PATTERN REFERENCE INFORMATION GENERATION DEVICE, PATTERN REFERENCE INFORMATION GENERATION METHOD, PROGRAM, AND RECORDING MEDIUM
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