SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD AND PROGRAM

To provide a surface inspection device, a surface inspection method and a program that can speedily detect foreign matter and a flaw on a surface of a cylindrical object.SOLUTION: A surface inspection device 1 comprises: a camera 21 which is arranged facing a surface of a cylindrical object, and ima...

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Bibliographische Detailangaben
Hauptverfasser:	FUJII SHIGETO, ASAKAWA ATSUYA, ASADA YUTAKA, INATANI TADASHI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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