MEASUREMENT DEVICE AND CONTROLLER

To obtain precise information more easily from a result alone of reception of light in a light reception section after the light is emitted from a light emission section corresponding to the light reception section and is reflected than when obtaining information on a region irradiated with light.SO...

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Bibliographische Detailangaben
Hauptverfasser: TAKEYAMA KEI, OI KAHO, SHIRAISHI EMIKO, HAYAKAWA JUNICHIRO, MORITA YOHEI
Format: Patent
Sprache:eng ; jpn
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Beschreibung
Zusammenfassung:To obtain precise information more easily from a result alone of reception of light in a light reception section after the light is emitted from a light emission section corresponding to the light reception section and is reflected than when obtaining information on a region irradiated with light.SOLUTION: A measurement device includes: a light emission unit including a first light emission section for emitting light to a first region and a second light emission section for emitting light to a second region different from the first region; a light reception unit including a first light reception section for receiving light reflected from the first region and a second light reception section for receiving light reflected from the second region; and an acquisition unit for acquiring information on the second region from a result of reception of light in the second light reception section after the light is emitted from the first light emission section and is reflected from the second region.SELECTED DRAWING: Figure 8 【課題】受光区画に対応する発光区画から出射された光が反射しこの受光区画で受光された結果のみから、光が照射された領域に関する情報を取得する場合と比べて、精度が高い情報を得やすくする。【解決手段】測定装置は、第1の領域に向けて光を出射する第1の発光区画と、第1の領域とは異なる第2の領域に向けて光を出射する第2の発光区画とを含む発光部と、第1の領域にて反射した光を受光する第1の受光区画と、第2の領域にて反射した光を受光する第2の受光区画とを含む受光部と、第1の発光区画から出射された光が第2の領域にて反射し第2の受光区画で受光された結果から、第2の領域に関する情報を取得する取得部とを備える。【選択図】図8