APPEARANCE INSPECTION DEVICE AND APPEARANCE INSPECTION METHOD
To provide an appearance inspection device capable of performing an appearance inspection with high precision in a short time while roughly determining the position of the workpiece with a relatively simple configuration.SOLUTION: An appearance inspection device (1) includes, in an imaging room (2)...
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| creator | AIBA TAKASHI KANAI SHIGERU |
| description | To provide an appearance inspection device capable of performing an appearance inspection with high precision in a short time while roughly determining the position of the workpiece with a relatively simple configuration.SOLUTION: An appearance inspection device (1) includes, in an imaging room (2) that has a workpiece setting part (3) where the workpiece (W) is placed, multiple lighting units (7, 8, 9, 10) for irradiating a workpiece with illumination light, and multiple imaging units (4, 5, 6) for capturing images from multiple directions of the workpiece. An image processing unit (12) processes the captured image information of the imaging device to detect positional deviation with respect to a reference image of the workpiece. An imaging condition adjustment device (13) adjusts the conditions for imaging according to the detected positional deviation of the workpiece in the image processing unit.SELECTED DRAWING: Figure 1
【課題】ワークの位置決めをラフに行いながらも、比較的簡単な構成で、短時間で精度良く外観検査を行うことを可能とする。【解決手段】外観検査装置（１）は、ワーク（Ｗ）が配置されるワークセット部（３）を有する撮像室（２）に、ワークに対し照明光を照射する照明装置（７、８、９、１０）と、ワークの複数方向から画像を取込む複数の撮像装置（４、５、６）とを備え、画像処理装置（１２）により、撮像装置の撮影画像情報を処理し、ワークの基準画像との位置ずれを検出し、撮像条件調整装置（１３）により、画像処理装置において検出されたワークの位置ずれに応じて撮像のための条件を調整する。【選択図】図１ |
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【課題】ワークの位置決めをラフに行いながらも、比較的簡単な構成で、短時間で精度良く外観検査を行うことを可能とする。【解決手段】外観検査装置（１）は、ワーク（Ｗ）が配置されるワークセット部（３）を有する撮像室（２）に、ワークに対し照明光を照射する照明装置（７、８、９、１０）と、ワークの複数方向から画像を取込む複数の撮像装置（４、５、６）とを備え、画像処理装置（１２）により、撮像装置の撮影画像情報を処理し、ワークの基準画像との位置ずれを検出し、撮像条件調整装置（１３）により、画像処理装置において検出されたワークの位置ずれに応じて撮像のための条件を調整する。【選択図】図１</description><language>eng ; jpn</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230518&DB=EPODOC&CC=JP&NR=2023069348A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230518&DB=EPODOC&CC=JP&NR=2023069348A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>AIBA TAKASHI</creatorcontrib><creatorcontrib>KANAI SHIGERU</creatorcontrib><title>APPEARANCE INSPECTION DEVICE AND APPEARANCE INSPECTION METHOD</title><description>To provide an appearance inspection device capable of performing an appearance inspection with high precision in a short time while roughly determining the position of the workpiece with a relatively simple configuration.SOLUTION: An appearance inspection device (1) includes, in an imaging room (2) that has a workpiece setting part (3) where the workpiece (W) is placed, multiple lighting units (7, 8, 9, 10) for irradiating a workpiece with illumination light, and multiple imaging units (4, 5, 6) for capturing images from multiple directions of the workpiece. An image processing unit (12) processes the captured image information of the imaging device to detect positional deviation with respect to a reference image of the workpiece. An imaging condition adjustment device (13) adjusts the conditions for imaging according to the detected positional deviation of the workpiece in the image processing unit.SELECTED DRAWING: Figure 1
【課題】ワークの位置決めをラフに行いながらも、比較的簡単な構成で、短時間で精度良く外観検査を行うことを可能とする。【解決手段】外観検査装置（１）は、ワーク（Ｗ）が配置されるワークセット部（３）を有する撮像室（２）に、ワークに対し照明光を照射する照明装置（７、８、９、１０）と、ワークの複数方向から画像を取込む複数の撮像装置（４、５、６）とを備え、画像処理装置（１２）により、撮像装置の撮影画像情報を処理し、ワークの基準画像との位置ずれを検出し、撮像条件調整装置（１３）により、画像処理装置において検出されたワークの位置ずれに応じて撮像のための条件を調整する。【選択図】図１</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB1DAhwdQxy9HN2VfD0Cw5wdQ7x9PdTcHEN8wSKOPq5KGBX4Osa4uHvwsPAmpaYU5zKC6W5GZTcXEOcPXRTC_LjU4sLEpNT81JL4r0CjAyMjA3MLI1NLByNiVIEAHhVKj4</recordid><startdate>20230518</startdate><enddate>20230518</enddate><creator>AIBA TAKASHI</creator><creator>KANAI SHIGERU</creator><scope>EVB</scope></search><sort><creationdate>20230518</creationdate><title>APPEARANCE INSPECTION DEVICE AND APPEARANCE INSPECTION METHOD</title><author>AIBA TAKASHI ; KANAI SHIGERU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2023069348A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2023</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>AIBA TAKASHI</creatorcontrib><creatorcontrib>KANAI SHIGERU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>AIBA TAKASHI</au><au>KANAI SHIGERU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>APPEARANCE INSPECTION DEVICE AND APPEARANCE INSPECTION METHOD</title><date>2023-05-18</date><risdate>2023</risdate><abstract>To provide an appearance inspection device capable of performing an appearance inspection with high precision in a short time while roughly determining the position of the workpiece with a relatively simple configuration.SOLUTION: An appearance inspection device (1) includes, in an imaging room (2) that has a workpiece setting part (3) where the workpiece (W) is placed, multiple lighting units (7, 8, 9, 10) for irradiating a workpiece with illumination light, and multiple imaging units (4, 5, 6) for capturing images from multiple directions of the workpiece. An image processing unit (12) processes the captured image information of the imaging device to detect positional deviation with respect to a reference image of the workpiece. An imaging condition adjustment device (13) adjusts the conditions for imaging according to the detected positional deviation of the workpiece in the image processing unit.SELECTED DRAWING: Figure 1
【課題】ワークの位置決めをラフに行いながらも、比較的簡単な構成で、短時間で精度良く外観検査を行うことを可能とする。【解決手段】外観検査装置（１）は、ワーク（Ｗ）が配置されるワークセット部（３）を有する撮像室（２）に、ワークに対し照明光を照射する照明装置（７、８、９、１０）と、ワークの複数方向から画像を取込む複数の撮像装置（４、５、６）とを備え、画像処理装置（１２）により、撮像装置の撮影画像情報を処理し、ワークの基準画像との位置ずれを検出し、撮像条件調整装置（１３）により、画像処理装置において検出されたワークの位置ずれに応じて撮像のための条件を調整する。【選択図】図１</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | APPEARANCE INSPECTION DEVICE AND APPEARANCE INSPECTION METHOD |
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