FAIL-SAFE IC PRODUCTION TEST

To provide methods and systems for using non-volatile memory to improve quality of integrated circuit testing.SOLUTION: An integrated circuit (IC) comprises a non-volatile memory and boot circuitry configured to boot the IC, read from the non-volatile memory one or more values indicative of whether...

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1. Verfasser:	YUVAL KIRSCHNER
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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creator	YUVAL KIRSCHNER
description	To provide methods and systems for using non-volatile memory to improve quality of integrated circuit testing.SOLUTION: An integrated circuit (IC) comprises a non-volatile memory and boot circuitry configured to boot the IC, read from the non-volatile memory one or more values indicative of whether production testing of the IC was completed successfully, and initiate a responsive action if the one or more values indicate that the production testing was not completed successfully.SELECTED DRAWING: Figure 3 【課題】不揮発性メモリを用いて集積回路テストの品質を向上させる方法およびシステムを提供する。【解決手段】不揮発性メモリ、および集積回路を起動するように構成され、前記集積回路の製造テストが正常に完了したかどうかを示す１つ以上の値を前記不揮発性メモリから読み取り、前記１つ以上の値が、前記製造テストが正常に完了されなかったことを示した場合、応答動作を開始する起動回路を含む集積回路（ＩＣ）。【選択図】図３
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jpn</language><subject>BASIC ELECTRIC ELEMENTS ; CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230313&DB=EPODOC&CC=JP&NR=2023035864A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230313&DB=EPODOC&CC=JP&NR=2023035864A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YUVAL KIRSCHNER</creatorcontrib><title>FAIL-SAFE IC PRODUCTION TEST</title><description>To provide methods and systems for using non-volatile memory to improve quality of integrated circuit testing.SOLUTION: An integrated circuit (IC) comprises a non-volatile memory and boot circuitry configured to boot the IC, read from the non-volatile memory one or more values indicative of whether production testing of the IC was completed successfully, and initiate a responsive action if the one or more values indicate that the production testing was not completed successfully.SELECTED DRAWING: Figure 3 【課題】不揮発性メモリを用いて集積回路テストの品質を向上させる方法およびシステムを提供する。【解決手段】不揮発性メモリ、および集積回路を起動するように構成され、前記集積回路の製造テストが正常に完了したかどうかを示す１つ以上の値を前記不揮発性メモリから読み取り、前記１つ以上の値が、前記製造テストが正常に完了されなかったことを示した場合、応答動作を開始する起動回路を含む集積回路（ＩＣ）。【選択図】図３</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJBxc_T00Q12dHNV8HRWCAjydwl1DvH091MIcQ0O4WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgZGxgbGphZmJo7GRCkCAJ3VIRQ</recordid><startdate>20230313</startdate><enddate>20230313</enddate><creator>YUVAL KIRSCHNER</creator><scope>EVB</scope></search><sort><creationdate>20230313</creationdate><title>FAIL-SAFE IC PRODUCTION TEST</title><author>YUVAL KIRSCHNER</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2023035864A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2023</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YUVAL KIRSCHNER</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YUVAL KIRSCHNER</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>FAIL-SAFE IC PRODUCTION TEST</title><date>2023-03-13</date><risdate>2023</risdate><abstract>To provide methods and systems for using non-volatile memory to improve quality of integrated circuit testing.SOLUTION: An integrated circuit (IC) comprises a non-volatile memory and boot circuitry configured to boot the IC, read from the non-volatile memory one or more values indicative of whether production testing of the IC was completed successfully, and initiate a responsive action if the one or more values indicate that the production testing was not completed successfully.SELECTED DRAWING: Figure 3 【課題】不揮発性メモリを用いて集積回路テストの品質を向上させる方法およびシステムを提供する。【解決手段】不揮発性メモリ、および集積回路を起動するように構成され、前記集積回路の製造テストが正常に完了したかどうかを示す１つ以上の値を前記不揮発性メモリから読み取り、前記１つ以上の値が、前記製造テストが正常に完了されなかったことを示した場合、応答動作を開始する起動回路を含む集積回路（ＩＣ）。【選択図】図３</abstract><oa>free_for_read</oa></addata></record>
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subjects	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
title	FAIL-SAFE IC PRODUCTION TEST
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