MICROSCOPE AUXILIARY DEVICE, CONTROL METHOD OF THE SAME AND PROGRAM
To shorten the time required for the work of arranging operation means in the vicinity of a work surface without requiring particular means for observing the operation means.SOLUTION: After making a main operation part 10M and a subordinate operation part 10S focused on a focus region of a microscop...
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creator | NISHITANI HITOSHI TSUKABE NAOKI DEGAWA TAKAMASA |
description | To shorten the time required for the work of arranging operation means in the vicinity of a work surface without requiring particular means for observing the operation means.SOLUTION: After making a main operation part 10M and a subordinate operation part 10S focused on a focus region of a microscope 100 in an observation range by using a result of analyzing an image obtained by imaging the main operation part 10M and the subordinate operation part 10S operating an object 103 under a visual field of the microscope 100 within the observation range in the microscope 100, the main operation part 10M is moved in the optical axis direction of the microscope 100 to bring it into contact with a work surface 102f or to position it in the vicinity of the work surface in such a state that the focus of the microscope 100 is placed on the work surface 102f where there is the object 103 or the vicinity of the work surface, then, the subordinate operation part 10S is moved in the optical axis direction to a prescribed position according to the position of the main operation part 10M or the object 103, the work preparation for the main operation part 10M and the subordinate operation part 10S to the object 103 is performed.SELECTED DRAWING: Figure 1
【課題】操作手段を観察するための別段の手段を必要とすることなく、操作手段を作業面近傍に配置させる作業に要する時間を短縮する。【解決手段】顕微鏡100の視野下で対象物103を操作する主操作部10Mと従操作部10Sを顕微鏡100での観察範囲を撮像して得られる画像を解析した結果を用いて、観察範囲において主操作部10Mと従操作部10Sを顕微鏡100の合焦領域に合焦させた状態とした後、対象物103のある作業面102f又はその近傍に顕微鏡100の焦点を合わせた状態で主操作部10Mを顕微鏡100の光軸方向に移動させて作業面102fに接触させるか又はその近傍に位置させ、その後、主操作部10M又は対象物103の位置に応じた所定の位置へ従操作部10Sを光軸方向に移動させることで、対象物103に対する主操作部10Mと従操作部10Sの作業準備を行う。【選択図】図1 |
format | Patent |
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【課題】操作手段を観察するための別段の手段を必要とすることなく、操作手段を作業面近傍に配置させる作業に要する時間を短縮する。【解決手段】顕微鏡100の視野下で対象物103を操作する主操作部10Mと従操作部10Sを顕微鏡100での観察範囲を撮像して得られる画像を解析した結果を用いて、観察範囲において主操作部10Mと従操作部10Sを顕微鏡100の合焦領域に合焦させた状態とした後、対象物103のある作業面102f又はその近傍に顕微鏡100の焦点を合わせた状態で主操作部10Mを顕微鏡100の光軸方向に移動させて作業面102fに接触させるか又はその近傍に位置させ、その後、主操作部10M又は対象物103の位置に応じた所定の位置へ従操作部10Sを光軸方向に移動させることで、対象物103に対する主操作部10Mと従操作部10Sの作業準備を行う。【選択図】図1</description><language>eng ; jpn</language><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230309&DB=EPODOC&CC=JP&NR=2023032674A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230309&DB=EPODOC&CC=JP&NR=2023032674A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NISHITANI HITOSHI</creatorcontrib><creatorcontrib>TSUKABE NAOKI</creatorcontrib><creatorcontrib>DEGAWA TAKAMASA</creatorcontrib><title>MICROSCOPE AUXILIARY DEVICE, CONTROL METHOD OF THE SAME AND PROGRAM</title><description>To shorten the time required for the work of arranging operation means in the vicinity of a work surface without requiring particular means for observing the operation means.SOLUTION: After making a main operation part 10M and a subordinate operation part 10S focused on a focus region of a microscope 100 in an observation range by using a result of analyzing an image obtained by imaging the main operation part 10M and the subordinate operation part 10S operating an object 103 under a visual field of the microscope 100 within the observation range in the microscope 100, the main operation part 10M is moved in the optical axis direction of the microscope 100 to bring it into contact with a work surface 102f or to position it in the vicinity of the work surface in such a state that the focus of the microscope 100 is placed on the work surface 102f where there is the object 103 or the vicinity of the work surface, then, the subordinate operation part 10S is moved in the optical axis direction to a prescribed position according to the position of the main operation part 10M or the object 103, the work preparation for the main operation part 10M and the subordinate operation part 10S to the object 103 is performed.SELECTED DRAWING: Figure 1
【課題】操作手段を観察するための別段の手段を必要とすることなく、操作手段を作業面近傍に配置させる作業に要する時間を短縮する。【解決手段】顕微鏡100の視野下で対象物103を操作する主操作部10Mと従操作部10Sを顕微鏡100での観察範囲を撮像して得られる画像を解析した結果を用いて、観察範囲において主操作部10Mと従操作部10Sを顕微鏡100の合焦領域に合焦させた状態とした後、対象物103のある作業面102f又はその近傍に顕微鏡100の焦点を合わせた状態で主操作部10Mを顕微鏡100の光軸方向に移動させて作業面102fに接触させるか又はその近傍に位置させ、その後、主操作部10M又は対象物103の位置に応じた所定の位置へ従操作部10Sを光軸方向に移動させることで、対象物103に対する主操作部10Mと従操作部10Sの作業準備を行う。【選択図】図1</description><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHD29XQO8g929g9wVXAMjfD08XQMilRwcQ3zdHbVUXD29wsJ8vdR8HUN8fB3UfB3UwjxcFUIdvQFKvZzUQgI8ncPcvTlYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBkbGBsZGZuYmjsZEKQIAbZkrqQ</recordid><startdate>20230309</startdate><enddate>20230309</enddate><creator>NISHITANI HITOSHI</creator><creator>TSUKABE NAOKI</creator><creator>DEGAWA TAKAMASA</creator><scope>EVB</scope></search><sort><creationdate>20230309</creationdate><title>MICROSCOPE AUXILIARY DEVICE, CONTROL METHOD OF THE SAME AND PROGRAM</title><author>NISHITANI HITOSHI ; TSUKABE NAOKI ; DEGAWA TAKAMASA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2023032674A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2023</creationdate><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>NISHITANI HITOSHI</creatorcontrib><creatorcontrib>TSUKABE NAOKI</creatorcontrib><creatorcontrib>DEGAWA TAKAMASA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NISHITANI HITOSHI</au><au>TSUKABE NAOKI</au><au>DEGAWA TAKAMASA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MICROSCOPE AUXILIARY DEVICE, CONTROL METHOD OF THE SAME AND PROGRAM</title><date>2023-03-09</date><risdate>2023</risdate><abstract>To shorten the time required for the work of arranging operation means in the vicinity of a work surface without requiring particular means for observing the operation means.SOLUTION: After making a main operation part 10M and a subordinate operation part 10S focused on a focus region of a microscope 100 in an observation range by using a result of analyzing an image obtained by imaging the main operation part 10M and the subordinate operation part 10S operating an object 103 under a visual field of the microscope 100 within the observation range in the microscope 100, the main operation part 10M is moved in the optical axis direction of the microscope 100 to bring it into contact with a work surface 102f or to position it in the vicinity of the work surface in such a state that the focus of the microscope 100 is placed on the work surface 102f where there is the object 103 or the vicinity of the work surface, then, the subordinate operation part 10S is moved in the optical axis direction to a prescribed position according to the position of the main operation part 10M or the object 103, the work preparation for the main operation part 10M and the subordinate operation part 10S to the object 103 is performed.SELECTED DRAWING: Figure 1
【課題】操作手段を観察するための別段の手段を必要とすることなく、操作手段を作業面近傍に配置させる作業に要する時間を短縮する。【解決手段】顕微鏡100の視野下で対象物103を操作する主操作部10Mと従操作部10Sを顕微鏡100での観察範囲を撮像して得られる画像を解析した結果を用いて、観察範囲において主操作部10Mと従操作部10Sを顕微鏡100の合焦領域に合焦させた状態とした後、対象物103のある作業面102f又はその近傍に顕微鏡100の焦点を合わせた状態で主操作部10Mを顕微鏡100の光軸方向に移動させて作業面102fに接触させるか又はその近傍に位置させ、その後、主操作部10M又は対象物103の位置に応じた所定の位置へ従操作部10Sを光軸方向に移動させることで、対象物103に対する主操作部10Mと従操作部10Sの作業準備を行う。【選択図】図1</abstract><oa>free_for_read</oa></addata></record> |
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title | MICROSCOPE AUXILIARY DEVICE, CONTROL METHOD OF THE SAME AND PROGRAM |
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