SPECTRAL PHOTOMETER, SPECTROSCOPIC MEASUREMENT METHOD, AND PROGRAM
To carry out efficiently in a short time a measurement having high S/N ratio and accuracy when measuring a measurement sample the absorbance of which changes significantly depending on a wavelength region.SOLUTION: A spectral photometer 100 changes, for each wavelength region, the scan speed of one...
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| creator | WAKUI TAKAYUKI MARUYAMA KAI |
| description | To carry out efficiently in a short time a measurement having high S/N ratio and accuracy when measuring a measurement sample the absorbance of which changes significantly depending on a wavelength region.SOLUTION: A spectral photometer 100 changes, for each wavelength region, the scan speed of one of a plurality of light-reducing plates 16a-16e in accordance with a measurement condition, with regard to a plurality of wavelength regions in the wavelength scanning measurement of a measurement sample, when executing a wavelength scanning measurement that scans the entire measurement wavelength region at a time that includes all of a plurality of wavelength regions, on the basis of a measurement condition that includes one of the plurality of light-reducing plates 16a-16e to be located in each wavelength region and the scan speed of the wavelength to be set in each wavelength region.SELECTED DRAWING: Figure 3
【課題】波長域によって吸光度が大きく変化する測定試料を測定する場合に、Ｓ／Ｎ比および精度の高い測定を、効率よく、短時間で実施する。【解決手段】分光光度計１００は、測定試料の波長走査測定における複数の波長域について、各波長域において配置すべき複数の減光板１６ａ～１６ｅのうちの１つと、各波長域において設定すべき波長の走査速度とを含む測定条件に基づいて、複数の波長域のすべてを含む全測定波長域を一度にて走査する波長走査測定を実行する際に、波長域ごとに、測定条件に従い、複数の減光板１６ａ～１６ｅのうちの１つおよび走査速度を変更する。【選択図】図３ |
| format | Patent |
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【課題】波長域によって吸光度が大きく変化する測定試料を測定する場合に、Ｓ／Ｎ比および精度の高い測定を、効率よく、短時間で実施する。【解決手段】分光光度計１００は、測定試料の波長走査測定における複数の波長域について、各波長域において配置すべき複数の減光板１６ａ～１６ｅのうちの１つと、各波長域において設定すべき波長の走査速度とを含む測定条件に基づいて、複数の波長域のすべてを含む全測定波長域を一度にて走査する波長走査測定を実行する際に、波長域ごとに、測定条件に従い、複数の減光板１６ａ～１６ｅのうちの１つおよび走査速度を変更する。【選択図】図３</description><language>eng ; jpn</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230117&DB=EPODOC&CC=JP&NR=2023004226A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230117&DB=EPODOC&CC=JP&NR=2023004226A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WAKUI TAKAYUKI</creatorcontrib><creatorcontrib>MARUYAMA KAI</creatorcontrib><title>SPECTRAL PHOTOMETER, SPECTROSCOPIC MEASUREMENT METHOD, AND PROGRAM</title><description>To carry out efficiently in a short time a measurement having high S/N ratio and accuracy when measuring a measurement sample the absorbance of which changes significantly depending on a wavelength region.SOLUTION: A spectral photometer 100 changes, for each wavelength region, the scan speed of one of a plurality of light-reducing plates 16a-16e in accordance with a measurement condition, with regard to a plurality of wavelength regions in the wavelength scanning measurement of a measurement sample, when executing a wavelength scanning measurement that scans the entire measurement wavelength region at a time that includes all of a plurality of wavelength regions, on the basis of a measurement condition that includes one of the plurality of light-reducing plates 16a-16e to be located in each wavelength region and the scan speed of the wavelength to be set in each wavelength region.SELECTED DRAWING: Figure 3
【課題】波長域によって吸光度が大きく変化する測定試料を測定する場合に、Ｓ／Ｎ比および精度の高い測定を、効率よく、短時間で実施する。【解決手段】分光光度計１００は、測定試料の波長走査測定における複数の波長域について、各波長域において配置すべき複数の減光板１６ａ～１６ｅのうちの１つと、各波長域において設定すべき波長の走査速度とを含む測定条件に基づいて、複数の波長域のすべてを含む全測定波長域を一度にて走査する波長走査測定を実行する際に、波長域ごとに、測定条件に従い、複数の減光板１６ａ～１６ｅのうちの１つおよび走査速度を変更する。【選択図】図３</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAKDnB1Dgly9FEI8PAP8fd1DXEN0lGACPoHO_sHeDor-Lo6BocGufq6-oUA2SEe_i46Co5-LgoBQf7uQY6-PAysaYk5xam8UJqbQcnNNcTZQze1ID8-tbggMTk1L7Uk3ivAyMDI2MDAxMjIzNGYKEUAftor1w</recordid><startdate>20230117</startdate><enddate>20230117</enddate><creator>WAKUI TAKAYUKI</creator><creator>MARUYAMA KAI</creator><scope>EVB</scope></search><sort><creationdate>20230117</creationdate><title>SPECTRAL PHOTOMETER, SPECTROSCOPIC MEASUREMENT METHOD, AND PROGRAM</title><author>WAKUI TAKAYUKI ; MARUYAMA KAI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2023004226A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2023</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WAKUI TAKAYUKI</creatorcontrib><creatorcontrib>MARUYAMA KAI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WAKUI TAKAYUKI</au><au>MARUYAMA KAI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SPECTRAL PHOTOMETER, SPECTROSCOPIC MEASUREMENT METHOD, AND PROGRAM</title><date>2023-01-17</date><risdate>2023</risdate><abstract>To carry out efficiently in a short time a measurement having high S/N ratio and accuracy when measuring a measurement sample the absorbance of which changes significantly depending on a wavelength region.SOLUTION: A spectral photometer 100 changes, for each wavelength region, the scan speed of one of a plurality of light-reducing plates 16a-16e in accordance with a measurement condition, with regard to a plurality of wavelength regions in the wavelength scanning measurement of a measurement sample, when executing a wavelength scanning measurement that scans the entire measurement wavelength region at a time that includes all of a plurality of wavelength regions, on the basis of a measurement condition that includes one of the plurality of light-reducing plates 16a-16e to be located in each wavelength region and the scan speed of the wavelength to be set in each wavelength region.SELECTED DRAWING: Figure 3
【課題】波長域によって吸光度が大きく変化する測定試料を測定する場合に、Ｓ／Ｎ比および精度の高い測定を、効率よく、短時間で実施する。【解決手段】分光光度計１００は、測定試料の波長走査測定における複数の波長域について、各波長域において配置すべき複数の減光板１６ａ～１６ｅのうちの１つと、各波長域において設定すべき波長の走査速度とを含む測定条件に基づいて、複数の波長域のすべてを含む全測定波長域を一度にて走査する波長走査測定を実行する際に、波長域ごとに、測定条件に従い、複数の減光板１６ａ～１６ｅのうちの１つおよび走査速度を変更する。【選択図】図３</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | SPECTRAL PHOTOMETER, SPECTROSCOPIC MEASUREMENT METHOD, AND PROGRAM |
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