FAILURE DETECTOR, FAILURE DETECTION METHOD AND SEMICONDUCTOR SWITCH DEVICE
To provide a failure detector, failure detection method and semiconductor switch device, capable of detecting states of a plurality of semiconductor element chips connected in parallel to each other.SOLUTION: A failure detector is a failure detector for semiconductor switch device with a plurality o...
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| creator | YOSHIDA SADAHIRO TSUKAGOSHI MASAHIKO YONEMURA NAOKI |
| description | To provide a failure detector, failure detection method and semiconductor switch device, capable of detecting states of a plurality of semiconductor element chips connected in parallel to each other.SOLUTION: A failure detector is a failure detector for semiconductor switch device with a plurality of semiconductor element chips for power conversion. The failure detector includes a determination section. The determination section detects occurrence of a failure in one or the plurality of semiconductor element chips, using a detection result of an electric current running through each of the semiconductor element chips arranged in the semiconductor switch device, a detection result with a voltage applied to the plurality of semiconductor element chips and data of determination criterion capable of identifying occurrence of the failure. The plurality of semiconductor element chips are connected in parallel to each other.SELECTED DRAWING: Figure 1B
【課題】互いに並列接続されている複数の半導体素子チップの状態を検出することが可能な故障検出装置、故障検出方法及び半導体スイッチ装置を提供する。【解決手段】故障検出装置は、電力変換用の複数の半導体素子チップを備える半導体スイッチ装置の故障検出装置である。故障検出装置は、判定部を備える。判定部は、半導体スイッチ装置内に配置された各半導体素子チップに流れる電流の検出結果と、前記複数の半導体素子チップに掛る電圧との検出結果と、前記故障が発生したことを識別可能にする判定基準のデータとを用いて、前記複数の半導体素子チップのうちの１又は複数の半導体素子チップに故障が発生したことを検出する。前記複数の半導体素子チップが互いに並列に接続されている。【選択図】図１Ｂ |
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【課題】互いに並列接続されている複数の半導体素子チップの状態を検出することが可能な故障検出装置、故障検出方法及び半導体スイッチ装置を提供する。【解決手段】故障検出装置は、電力変換用の複数の半導体素子チップを備える半導体スイッチ装置の故障検出装置である。故障検出装置は、判定部を備える。判定部は、半導体スイッチ装置内に配置された各半導体素子チップに流れる電流の検出結果と、前記複数の半導体素子チップに掛る電圧との検出結果と、前記故障が発生したことを識別可能にする判定基準のデータとを用いて、前記複数の半導体素子チップのうちの１又は複数の半導体素子チップに故障が発生したことを検出する。前記複数の半導体素子チップが互いに並列に接続されている。【選択図】図１Ｂ</description><language>eng ; jpn</language><subject>APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS ; BASIC ELECTRONIC CIRCUITRY ; CONTROL OR REGULATION THEREOF ; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER ; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ; ELECTRICITY ; GENERATION ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; PULSE TECHNIQUE ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220914&DB=EPODOC&CC=JP&NR=2022133720A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220914&DB=EPODOC&CC=JP&NR=2022133720A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YOSHIDA SADAHIRO</creatorcontrib><creatorcontrib>TSUKAGOSHI MASAHIKO</creatorcontrib><creatorcontrib>YONEMURA NAOKI</creatorcontrib><title>FAILURE DETECTOR, FAILURE DETECTION METHOD AND SEMICONDUCTOR SWITCH DEVICE</title><description>To provide a failure detector, failure detection method and semiconductor switch device, capable of detecting states of a plurality of semiconductor element chips connected in parallel to each other.SOLUTION: A failure detector is a failure detector for semiconductor switch device with a plurality of semiconductor element chips for power conversion. The failure detector includes a determination section. The determination section detects occurrence of a failure in one or the plurality of semiconductor element chips, using a detection result of an electric current running through each of the semiconductor element chips arranged in the semiconductor switch device, a detection result with a voltage applied to the plurality of semiconductor element chips and data of determination criterion capable of identifying occurrence of the failure. The plurality of semiconductor element chips are connected in parallel to each other.SELECTED DRAWING: Figure 1B
【課題】互いに並列接続されている複数の半導体素子チップの状態を検出することが可能な故障検出装置、故障検出方法及び半導体スイッチ装置を提供する。【解決手段】故障検出装置は、電力変換用の複数の半導体素子チップを備える半導体スイッチ装置の故障検出装置である。故障検出装置は、判定部を備える。判定部は、半導体スイッチ装置内に配置された各半導体素子チップに流れる電流の検出結果と、前記複数の半導体素子チップに掛る電圧との検出結果と、前記故障が発生したことを識別可能にする判定基準のデータとを用いて、前記複数の半導体素子チップのうちの１又は複数の半導体素子チップに故障が発生したことを検出する。前記複数の半導体素子チップが互いに並列に接続されている。【選択図】図１Ｂ</description><subject>APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS</subject><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>CONTROL OR REGULATION THEREOF</subject><subject>CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER</subject><subject>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</subject><subject>ELECTRICITY</subject><subject>GENERATION</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>PULSE TECHNIQUE</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPByc_T0CQ1yVXBxDXF1DvEP0lFAFfH091PwdQ3x8HdRcPRzUQh29fV09vdzCQWpVQgO9wxx9gCqDPN0duVhYE1LzClO5YXS3AxKbq5Aad3Ugvz41OKCxOTUvNSSeK8AIwMjI0NjY3MjA0djohQBALDtLbs</recordid><startdate>20220914</startdate><enddate>20220914</enddate><creator>YOSHIDA SADAHIRO</creator><creator>TSUKAGOSHI MASAHIKO</creator><creator>YONEMURA NAOKI</creator><scope>EVB</scope></search><sort><creationdate>20220914</creationdate><title>FAILURE DETECTOR, FAILURE DETECTION METHOD AND SEMICONDUCTOR SWITCH DEVICE</title><author>YOSHIDA SADAHIRO ; TSUKAGOSHI MASAHIKO ; YONEMURA NAOKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2022133720A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2022</creationdate><topic>APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS</topic><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>CONTROL OR REGULATION THEREOF</topic><topic>CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER</topic><topic>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</topic><topic>ELECTRICITY</topic><topic>GENERATION</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>PULSE TECHNIQUE</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YOSHIDA SADAHIRO</creatorcontrib><creatorcontrib>TSUKAGOSHI MASAHIKO</creatorcontrib><creatorcontrib>YONEMURA NAOKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YOSHIDA SADAHIRO</au><au>TSUKAGOSHI MASAHIKO</au><au>YONEMURA NAOKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>FAILURE DETECTOR, FAILURE DETECTION METHOD AND SEMICONDUCTOR SWITCH DEVICE</title><date>2022-09-14</date><risdate>2022</risdate><abstract>To provide a failure detector, failure detection method and semiconductor switch device, capable of detecting states of a plurality of semiconductor element chips connected in parallel to each other.SOLUTION: A failure detector is a failure detector for semiconductor switch device with a plurality of semiconductor element chips for power conversion. The failure detector includes a determination section. The determination section detects occurrence of a failure in one or the plurality of semiconductor element chips, using a detection result of an electric current running through each of the semiconductor element chips arranged in the semiconductor switch device, a detection result with a voltage applied to the plurality of semiconductor element chips and data of determination criterion capable of identifying occurrence of the failure. The plurality of semiconductor element chips are connected in parallel to each other.SELECTED DRAWING: Figure 1B
【課題】互いに並列接続されている複数の半導体素子チップの状態を検出することが可能な故障検出装置、故障検出方法及び半導体スイッチ装置を提供する。【解決手段】故障検出装置は、電力変換用の複数の半導体素子チップを備える半導体スイッチ装置の故障検出装置である。故障検出装置は、判定部を備える。判定部は、半導体スイッチ装置内に配置された各半導体素子チップに流れる電流の検出結果と、前記複数の半導体素子チップに掛る電圧との検出結果と、前記故障が発生したことを識別可能にする判定基準のデータとを用いて、前記複数の半導体素子チップのうちの１又は複数の半導体素子チップに故障が発生したことを検出する。前記複数の半導体素子チップが互いに並列に接続されている。【選択図】図１Ｂ</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS BASIC ELECTRONIC CIRCUITRY CONTROL OR REGULATION THEREOF CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ELECTRICITY GENERATION MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE TESTING |
| title | FAILURE DETECTOR, FAILURE DETECTION METHOD AND SEMICONDUCTOR SWITCH DEVICE |
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