ANALYZER AND METHOD FOR ANALYSIS

To provide an analyzer and a method for analysis that can easily supply an inspection liquid to a desired inspection region or recover the inspection liquid from the desired inspection region and can perform a correct mass analysis of a material.SOLUTION: The analyzer according to an embodiment has...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	TAKIMOTO MIKI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SEMICONDUCTOR DEVICES TESTING
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