ANALYZER AND METHOD FOR ANALYSIS
To provide an analyzer and a method for analysis that can easily supply an inspection liquid to a desired inspection region or recover the inspection liquid from the desired inspection region and can perform a correct mass analysis of a material.SOLUTION: The analyzer according to an embodiment has...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng ; jpn |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | TAKIMOTO MIKI |
| description | To provide an analyzer and a method for analysis that can easily supply an inspection liquid to a desired inspection region or recover the inspection liquid from the desired inspection region and can perform a correct mass analysis of a material.SOLUTION: The analyzer according to an embodiment has a stage on which a sample can be placed. A first supply unit defines an inspection region surrounded by a lyophobic material by applying or supplying the lyophobic material to the sample. A second supply unit supplies an inspection liquid into an inspection region on the sample. A recovery unit recovers the inspection liquid in the inspection region. The analysis unit analyzes components in the recovered inspection liquid.SELECTED DRAWING: Figure 1
【課題】検査液を所望の検査領域に容易に供給および回収し、正確に材料を質量分析することができる分析装置および分析方法を提供する。【解決手段】本実施形態による分析装置は、試料を載置可能なステージを備える。第１供給部は、試料上に疎液材を供給または塗布して疎液材で囲まれた検査領域を規定する。第２供給部は、試料上の検査領域内に検査液を供給する。回収部は、検査領域の検査液を回収する。分析部は、回収された検査液に含まれる成分を分析する。【選択図】図１ |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2022024306A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2022024306A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2022024306A3</originalsourceid><addsrcrecordid>eNrjZFBw9HP0iYxyDQIyXBR8XUM8_F0U3PyDIOLBnsE8DKxpiTnFqbxQmptByc01xNlDN7UgPz61uCAxOTUvtSTeK8DIwAiITIwNzByNiVIEACtbIio</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ANALYZER AND METHOD FOR ANALYSIS</title><source>esp@cenet</source><creator>TAKIMOTO MIKI</creator><creatorcontrib>TAKIMOTO MIKI</creatorcontrib><description>To provide an analyzer and a method for analysis that can easily supply an inspection liquid to a desired inspection region or recover the inspection liquid from the desired inspection region and can perform a correct mass analysis of a material.SOLUTION: The analyzer according to an embodiment has a stage on which a sample can be placed. A first supply unit defines an inspection region surrounded by a lyophobic material by applying or supplying the lyophobic material to the sample. A second supply unit supplies an inspection liquid into an inspection region on the sample. A recovery unit recovers the inspection liquid in the inspection region. The analysis unit analyzes components in the recovered inspection liquid.SELECTED DRAWING: Figure 1
【課題】検査液を所望の検査領域に容易に供給および回収し、正確に材料を質量分析することができる分析装置および分析方法を提供する。【解決手段】本実施形態による分析装置は、試料を載置可能なステージを備える。第１供給部は、試料上に疎液材を供給または塗布して疎液材で囲まれた検査領域を規定する。第２供給部は、試料上の検査領域内に検査液を供給する。回収部は、検査領域の検査液を回収する。分析部は、回収された検査液に含まれる成分を分析する。【選択図】図１</description><language>eng ; jpn</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220209&DB=EPODOC&CC=JP&NR=2022024306A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220209&DB=EPODOC&CC=JP&NR=2022024306A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TAKIMOTO MIKI</creatorcontrib><title>ANALYZER AND METHOD FOR ANALYSIS</title><description>To provide an analyzer and a method for analysis that can easily supply an inspection liquid to a desired inspection region or recover the inspection liquid from the desired inspection region and can perform a correct mass analysis of a material.SOLUTION: The analyzer according to an embodiment has a stage on which a sample can be placed. A first supply unit defines an inspection region surrounded by a lyophobic material by applying or supplying the lyophobic material to the sample. A second supply unit supplies an inspection liquid into an inspection region on the sample. A recovery unit recovers the inspection liquid in the inspection region. The analysis unit analyzes components in the recovered inspection liquid.SELECTED DRAWING: Figure 1
【課題】検査液を所望の検査領域に容易に供給および回収し、正確に材料を質量分析することができる分析装置および分析方法を提供する。【解決手段】本実施形態による分析装置は、試料を載置可能なステージを備える。第１供給部は、試料上に疎液材を供給または塗布して疎液材で囲まれた検査領域を規定する。第２供給部は、試料上の検査領域内に検査液を供給する。回収部は、検査領域の検査液を回収する。分析部は、回収された検査液に含まれる成分を分析する。【選択図】図１</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFBw9HP0iYxyDQIyXBR8XUM8_F0U3PyDIOLBnsE8DKxpiTnFqbxQmptByc01xNlDN7UgPz61uCAxOTUvtSTeK8DIwAiITIwNzByNiVIEACtbIio</recordid><startdate>20220209</startdate><enddate>20220209</enddate><creator>TAKIMOTO MIKI</creator><scope>EVB</scope></search><sort><creationdate>20220209</creationdate><title>ANALYZER AND METHOD FOR ANALYSIS</title><author>TAKIMOTO MIKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2022024306A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2022</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TAKIMOTO MIKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TAKIMOTO MIKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ANALYZER AND METHOD FOR ANALYSIS</title><date>2022-02-09</date><risdate>2022</risdate><abstract>To provide an analyzer and a method for analysis that can easily supply an inspection liquid to a desired inspection region or recover the inspection liquid from the desired inspection region and can perform a correct mass analysis of a material.SOLUTION: The analyzer according to an embodiment has a stage on which a sample can be placed. A first supply unit defines an inspection region surrounded by a lyophobic material by applying or supplying the lyophobic material to the sample. A second supply unit supplies an inspection liquid into an inspection region on the sample. A recovery unit recovers the inspection liquid in the inspection region. The analysis unit analyzes components in the recovered inspection liquid.SELECTED DRAWING: Figure 1
【課題】検査液を所望の検査領域に容易に供給および回収し、正確に材料を質量分析することができる分析装置および分析方法を提供する。【解決手段】本実施形態による分析装置は、試料を載置可能なステージを備える。第１供給部は、試料上に疎液材を供給または塗布して疎液材で囲まれた検査領域を規定する。第２供給部は、試料上の検査領域内に検査液を供給する。回収部は、検査領域の検査液を回収する。分析部は、回収された検査液に含まれる成分を分析する。【選択図】図１</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; jpn |
| recordid | cdi_epo_espacenet_JP2022024306A |
| source | esp@cenet |
| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | ANALYZER AND METHOD FOR ANALYSIS |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T19%3A27%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=TAKIMOTO%20MIKI&rft.date=2022-02-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2022024306A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |