STRUCTURE INSPECTION PROCESSING SYSTEM AND STRUCTURE INSPECTION PROCESSING METHOD

To provide a structure inspection processing system and a structure inspection processing method, capable of reducing a load of inspection work, inspection result report creation or database recording by an inspector, and significantly reducing efforts and time during inspection of a structure such...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SATO HISASHI, KANEKO HIROAKI, IBAYASHI YASUSHI, KOBAYASHI TOSHIHIRO, TAKATSU SOTA, FUJIEDA AKIRA, ENOMOTO TAICHI
Format: Patent
Sprache:eng ; jpn
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