APPARATUSES, SYSTEMS AND METHODS FOR SAMPLE TESTING

APPARATUSES, SYSTEMS AND METHODS FOR SAMPLE TESTING

To provide methods, apparatuses and systems associated with a sample testing device for overcoming challenges and limitations in existing methods, apparatuses and systems, for example, various factors such as structural limitations, environmental temperature and/or contamination that may affect effi...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MOIN SHAFAI, LUST LISA M, FENG CHEN, GIORGIO CARLO ISELLA, JAMES A LOPAC, MATTHEW WADE PUCKETT, ROBERT TIMOTHY KESTER, SURESH VENKATARAYALU, BENJAMIN P HEPPNER, JENNIFER BURNETT, WILLIAM MCGRAW, MARY KATHERINE SALIT
Format: Patent
Sprache:eng ; jpn
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:To provide methods, apparatuses and systems associated with a sample testing device for overcoming challenges and limitations in existing methods, apparatuses and systems, for example, various factors such as structural limitations, environmental temperature and/or contamination that may affect efficiency and/or accuracy of many devices.SOLUTION: For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, and a waveguide that is disposed on the substrate layer and includes at least one reference channel and at least one sample channel.SELECTED DRAWING: Figure 19 【課題】サンプル検査デバイスに関連する方法、装置およびシステムを提供する。既存の方法、装置およびシステムには課題および限界がある。例えば、多くのデバイスの効率および／または精度は、構造的限界、環境温度、および／または汚染などの様々な要因により影響を受けることがある。【解決手段】例えば、例示のサンプル検査デバイスは、サンプル検査デバイスの底面を画定する基板層と、基板層上に配置され、少なくとも１つの参照チャネルと少なくとも１つのサンプルチャネルとを含む導波路とを含み得る。【選択図】図１９