COORDINATE MEASURING MACHINE WITH VISION PROBE FOR PERFORMING POINTS-FROM-FOCUS TYPE MEASUREMENT OPERATIONS
To provide a coordinate measuring machine (CMM) system that includes use of a vision probe (e.g., for performing operations or the like for determining and/or measuring surface profiles of workpieces).SOLUTION: An angular direction of a vision probe can be adjusted by using a rotation mechanism so t...
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creator | TRAVIS MATTHEW EILES |
description | To provide a coordinate measuring machine (CMM) system that includes use of a vision probe (e.g., for performing operations or the like for determining and/or measuring surface profiles of workpieces).SOLUTION: An angular direction of a vision probe can be adjusted by using a rotation mechanism so that an optical axis of the vision probe is directed toward an angled surface of a workpiece (e.g., in some implementations, the optical axis can be approximately perpendicular to an angled workpiece surface). X-axis, y-axis, and z-axis slide mechanisms (e.g., moving in mutually orthogonal directions) can in conjunction move the vision probe to image acquisition positions along an image stack acquisition axis (which may approximately coincide with the optical axis) for acquiring a stack of images of the angled workpiece surface. Focus curve data can be determined, from analysis of the image stack, which indicates 3-dimensional positions of surface points on the angled surface of the workpiece.SELECTED DRAWING: Figure 1A
【課題】 ビジョンプローブの利用を含む座標測定機(CMM)システムが提供される(例えば、ワークピースの表面プロファイルを決定及び/又は測定するための動作等を実行するため)。【解決手段】 ビジョンプローブの光軸をワークピースの傾斜表面に向けるように、回転機構を用いてビジョンプローブの角度方向を調整することができる(例えば、いくつかの実施例では、光軸は傾斜ワークピース表面に対してほぼ直交することができる)。x軸、y軸、及びz軸スライド機構(例えば相互に直交する方向に移動する)は、連携して、傾斜ワークピース表面の画像のスタックを取得するための画像スタック取得軸(光軸とほぼ一致し得る)に沿った画像取得位置へビジョンプローブを移動させることができる。画像スタックの解析から、ワークピースの傾斜表面上の表面点の3次元位置を示す合焦曲線データを決定することができる。【選択図】 図1A |
format | Patent |
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【課題】 ビジョンプローブの利用を含む座標測定機(CMM)システムが提供される(例えば、ワークピースの表面プロファイルを決定及び/又は測定するための動作等を実行するため)。【解決手段】 ビジョンプローブの光軸をワークピースの傾斜表面に向けるように、回転機構を用いてビジョンプローブの角度方向を調整することができる(例えば、いくつかの実施例では、光軸は傾斜ワークピース表面に対してほぼ直交することができる)。x軸、y軸、及びz軸スライド機構(例えば相互に直交する方向に移動する)は、連携して、傾斜ワークピース表面の画像のスタックを取得するための画像スタック取得軸(光軸とほぼ一致し得る)に沿った画像取得位置へビジョンプローブを移動させることができる。画像スタックの解析から、ワークピースの傾斜表面上の表面点の3次元位置を示す合焦曲線データを決定することができる。【選択図】 図1A</description><language>eng ; jpn</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211213&DB=EPODOC&CC=JP&NR=2021189179A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211213&DB=EPODOC&CC=JP&NR=2021189179A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TRAVIS MATTHEW EILES</creatorcontrib><title>COORDINATE MEASURING MACHINE WITH VISION PROBE FOR PERFORMING POINTS-FROM-FOCUS TYPE MEASUREMENT OPERATIONS</title><description>To provide a coordinate measuring machine (CMM) system that includes use of a vision probe (e.g., for performing operations or the like for determining and/or measuring surface profiles of workpieces).SOLUTION: An angular direction of a vision probe can be adjusted by using a rotation mechanism so that an optical axis of the vision probe is directed toward an angled surface of a workpiece (e.g., in some implementations, the optical axis can be approximately perpendicular to an angled workpiece surface). X-axis, y-axis, and z-axis slide mechanisms (e.g., moving in mutually orthogonal directions) can in conjunction move the vision probe to image acquisition positions along an image stack acquisition axis (which may approximately coincide with the optical axis) for acquiring a stack of images of the angled workpiece surface. Focus curve data can be determined, from analysis of the image stack, which indicates 3-dimensional positions of surface points on the angled surface of the workpiece.SELECTED DRAWING: Figure 1A
【課題】 ビジョンプローブの利用を含む座標測定機(CMM)システムが提供される(例えば、ワークピースの表面プロファイルを決定及び/又は測定するための動作等を実行するため)。【解決手段】 ビジョンプローブの光軸をワークピースの傾斜表面に向けるように、回転機構を用いてビジョンプローブの角度方向を調整することができる(例えば、いくつかの実施例では、光軸は傾斜ワークピース表面に対してほぼ直交することができる)。x軸、y軸、及びz軸スライド機構(例えば相互に直交する方向に移動する)は、連携して、傾斜ワークピース表面の画像のスタックを取得するための画像スタック取得軸(光軸とほぼ一致し得る)に沿った画像取得位置へビジョンプローブを移動させることができる。画像スタックの解析から、ワークピースの傾斜表面上の表面点の3次元位置を示す合焦曲線データを決定することができる。【選択図】 図1A</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNzLEKwjAQgOEuDqK-w-FesDpoxxgv9oTkQnJVnEqRuChaqO-PFXR3-pePf5zdNHPYkVOCYFHFOpDbg1W6IodwIqngSJHYgQ-8RTAcwGMYYj_QMzmJuQlsc8O6jiBn_zuhRSfAA1cyHOI0G13be59m306yuUHRVZ66Z5P6rr2kR3o1B79cLItiUxbrUq3-Qm-GJTeh</recordid><startdate>20211213</startdate><enddate>20211213</enddate><creator>TRAVIS MATTHEW EILES</creator><scope>EVB</scope></search><sort><creationdate>20211213</creationdate><title>COORDINATE MEASURING MACHINE WITH VISION PROBE FOR PERFORMING POINTS-FROM-FOCUS TYPE MEASUREMENT OPERATIONS</title><author>TRAVIS MATTHEW EILES</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2021189179A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2021</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TRAVIS MATTHEW EILES</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TRAVIS MATTHEW EILES</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>COORDINATE MEASURING MACHINE WITH VISION PROBE FOR PERFORMING POINTS-FROM-FOCUS TYPE MEASUREMENT OPERATIONS</title><date>2021-12-13</date><risdate>2021</risdate><abstract>To provide a coordinate measuring machine (CMM) system that includes use of a vision probe (e.g., for performing operations or the like for determining and/or measuring surface profiles of workpieces).SOLUTION: An angular direction of a vision probe can be adjusted by using a rotation mechanism so that an optical axis of the vision probe is directed toward an angled surface of a workpiece (e.g., in some implementations, the optical axis can be approximately perpendicular to an angled workpiece surface). X-axis, y-axis, and z-axis slide mechanisms (e.g., moving in mutually orthogonal directions) can in conjunction move the vision probe to image acquisition positions along an image stack acquisition axis (which may approximately coincide with the optical axis) for acquiring a stack of images of the angled workpiece surface. Focus curve data can be determined, from analysis of the image stack, which indicates 3-dimensional positions of surface points on the angled surface of the workpiece.SELECTED DRAWING: Figure 1A
【課題】 ビジョンプローブの利用を含む座標測定機(CMM)システムが提供される(例えば、ワークピースの表面プロファイルを決定及び/又は測定するための動作等を実行するため)。【解決手段】 ビジョンプローブの光軸をワークピースの傾斜表面に向けるように、回転機構を用いてビジョンプローブの角度方向を調整することができる(例えば、いくつかの実施例では、光軸は傾斜ワークピース表面に対してほぼ直交することができる)。x軸、y軸、及びz軸スライド機構(例えば相互に直交する方向に移動する)は、連携して、傾斜ワークピース表面の画像のスタックを取得するための画像スタック取得軸(光軸とほぼ一致し得る)に沿った画像取得位置へビジョンプローブを移動させることができる。画像スタックの解析から、ワークピースの傾斜表面上の表面点の3次元位置を示す合焦曲線データを決定することができる。【選択図】 図1A</abstract><oa>free_for_read</oa></addata></record> |
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subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
title | COORDINATE MEASURING MACHINE WITH VISION PROBE FOR PERFORMING POINTS-FROM-FOCUS TYPE MEASUREMENT OPERATIONS |
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