METHOD FOR INSPECTING OR IDENTIFYING PROCESSING STATION AND TABULAR WORKPIECE

To provide a table capable of inspecting a circuit board perfectly for material test using X-rays, and fixing the circuit board quickly and reliably in a processing station.SOLUTION: A processing station comprises at least one X-ray source, at least one detector, and a table that can be arranged bet...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	PETER KNIEF, MARKUS WINTERSCHLADEN, ABDULLAH TAYMUREE
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!