SUBSTRATE PROCESSING APPARATUS

To provide a substrate processing apparatus in which crystals (salts) are less likely to be generated in an exhaust pipe.SOLUTION: A substrate processing apparatus 100 includes a board holding unit 3, a board rotating unit 4, a processing liquid supply unit 11, a guard unit 5a, an exhaust unit 7, an...

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1. Verfasser: NAKAI HITOSHI
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:To provide a substrate processing apparatus in which crystals (salts) are less likely to be generated in an exhaust pipe.SOLUTION: A substrate processing apparatus 100 includes a board holding unit 3, a board rotating unit 4, a processing liquid supply unit 11, a guard unit 5a, an exhaust unit 7, and an opening/closing unit 5b. The exhaust unit 7 includes a plurality of downstream exhaust ports 71a to 71c. The exhaust unit 7 is arranged inside the guard unit 5a. The opening/closing unit 5b opens/closes a plurality of downstream exhaust ports 71a to 71c. The guard unit 5a includes a guard 51 and a liquid receiving unit 522. The guard 51 receives processing liquid. The liquid receiving unit 522 receives processing liquid received by the guard 51. The opening/closing unit 5b opens/closes the plurality of downstream exhaust ports 71a to 71c such that gas generated from the liquid receiving unit 522 flows into one of the plurality of downstream exhaust ports 71a to 71c. The guard unit 5a and the opening/closing unit 5b operate independently of each other.SELECTED DRAWING: Figure 3 【課題】排気管において結晶(塩)が発生し難い基板処理装置を提供する。【解決手段】基板処理装置100は、基板保持部3と、基板回転部4と、処理液供給部11と、ガード部5aと、排気部7と、開閉部5bとを備える。排気部7は、複数の下流側排気ポート71a〜71cを有する。排気部7は、ガード部5aの内側に配置される。開閉部5bは、複数の下流側排気ポート71a〜71cを開閉する。ガード部5aは、ガード51と、液受け部522とを有する。ガード51は、処理液を受け止める。液受け部522は、ガード51が受け止めた処理液を受ける。開閉部5bは、液受け部522から発生するガスが複数の下流側排気ポート71a〜71cのうちの1つに流入するように複数の下流側排気ポート71a〜71cを開閉する。ガード部5a及び開閉部5bは互いに独立して動作する。【選択図】図3