INSPECTION SYSTEM
To reduce a footprint per inspection unit in an inspection system having a plurality of inspection units arranged in a plurality of shelves in the lateral direction.SOLUTION: The inspection system includes: an inspection region which includes a plurality of inspection units performing the electrical...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Patent |
Sprache: | eng ; jpn |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | FUJIWARA JUN KONISHI KENTARO SHIKAGAWA HIROKI |
description | To reduce a footprint per inspection unit in an inspection system having a plurality of inspection units arranged in a plurality of shelves in the lateral direction.SOLUTION: The inspection system includes: an inspection region which includes a plurality of inspection units performing the electrical testing of an inspection target body; an arrangement part in which a container for accommodating the inspection target body is arranged; and a loader region having a loader to transfer the inspection target body between the accommodation container and the inspection region. The inspection unit is constituted by that a plurality of inspection unit rows, each having a plurality of inspection units arrayed in one direction of the horizontal direction, are arranged in a plurality of shelves in the vertical direction. The inspection region is provided adjacent to each shelves of the inspection unit rows of the inspection units, and includes: a plurality of carriage paths extending in one direction; a plurality of transfer mechanisms which are movably provided along each carriage path to transfer the inspection target body carried in from the loader to/from the inspection units; and a guide rail which is arranged along the plurality of carriage paths. The plurality of transfer mechanisms are supported in a manner capable of moving up and down by the guide rail.SELECTED DRAWING: Figure 3
【課題】複数の検査ユニットを複数段かつ横方向に複数配置した検査システムにおいて、一つの検査ユニットあたりのフットプリントを小さくする。【解決手段】検査システムは、被検査体の電気的検査を行う複数の検査ユニットを有する検査部を備えた検査領域と、被検査体の収容容器が配置される配置部、および収容容器と検査領域との間で被検査体の受け渡しを行うローダを有するローダ領域とを備える。検査部は、検査ユニットが水平方向の一方向に複数配列されて形成された検査ユニット列が、垂直方向に複数段配置されて構成され、検査領域は、検査部の検査ユニット列の各段に隣接して設けられ、一方向に延びる複数の搬送路と、各搬送路に沿って移動可能に設けられ、ローダから搬入された被検査体を検査ユニットとの間で受け渡す複数の搬送機構と、複数の搬送路に沿って配置されるガイドレールとを有し、複数の搬送機構は、昇降可能にガイドレールに支持される。【選択図】図3 |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2021119638A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2021119638A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2021119638A3</originalsourceid><addsrcrecordid>eNrjZBD09AsOcHUO8fT3UwiODA5x9eVhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGRoaGhpZmxhaOxkQpAgBu9R5v</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>INSPECTION SYSTEM</title><source>esp@cenet</source><creator>FUJIWARA JUN ; KONISHI KENTARO ; SHIKAGAWA HIROKI</creator><creatorcontrib>FUJIWARA JUN ; KONISHI KENTARO ; SHIKAGAWA HIROKI</creatorcontrib><description>To reduce a footprint per inspection unit in an inspection system having a plurality of inspection units arranged in a plurality of shelves in the lateral direction.SOLUTION: The inspection system includes: an inspection region which includes a plurality of inspection units performing the electrical testing of an inspection target body; an arrangement part in which a container for accommodating the inspection target body is arranged; and a loader region having a loader to transfer the inspection target body between the accommodation container and the inspection region. The inspection unit is constituted by that a plurality of inspection unit rows, each having a plurality of inspection units arrayed in one direction of the horizontal direction, are arranged in a plurality of shelves in the vertical direction. The inspection region is provided adjacent to each shelves of the inspection unit rows of the inspection units, and includes: a plurality of carriage paths extending in one direction; a plurality of transfer mechanisms which are movably provided along each carriage path to transfer the inspection target body carried in from the loader to/from the inspection units; and a guide rail which is arranged along the plurality of carriage paths. The plurality of transfer mechanisms are supported in a manner capable of moving up and down by the guide rail.SELECTED DRAWING: Figure 3
【課題】複数の検査ユニットを複数段かつ横方向に複数配置した検査システムにおいて、一つの検査ユニットあたりのフットプリントを小さくする。【解決手段】検査システムは、被検査体の電気的検査を行う複数の検査ユニットを有する検査部を備えた検査領域と、被検査体の収容容器が配置される配置部、および収容容器と検査領域との間で被検査体の受け渡しを行うローダを有するローダ領域とを備える。検査部は、検査ユニットが水平方向の一方向に複数配列されて形成された検査ユニット列が、垂直方向に複数段配置されて構成され、検査領域は、検査部の検査ユニット列の各段に隣接して設けられ、一方向に延びる複数の搬送路と、各搬送路に沿って移動可能に設けられ、ローダから搬入された被検査体を検査ユニットとの間で受け渡す複数の搬送機構と、複数の搬送路に沿って配置されるガイドレールとを有し、複数の搬送機構は、昇降可能にガイドレールに支持される。【選択図】図3</description><language>eng ; jpn</language><subject>BASIC ELECTRIC ELEMENTS ; CONVEYING ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; HANDLING THIN OR FILAMENTARY MATERIAL ; PACKING ; PERFORMING OPERATIONS ; PNEUMATIC TUBE CONVEYORS ; SEMICONDUCTOR DEVICES ; SHOP CONVEYOR SYSTEMS ; STORING ; TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING ORTIPPING ; TRANSPORTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210812&DB=EPODOC&CC=JP&NR=2021119638A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210812&DB=EPODOC&CC=JP&NR=2021119638A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FUJIWARA JUN</creatorcontrib><creatorcontrib>KONISHI KENTARO</creatorcontrib><creatorcontrib>SHIKAGAWA HIROKI</creatorcontrib><title>INSPECTION SYSTEM</title><description>To reduce a footprint per inspection unit in an inspection system having a plurality of inspection units arranged in a plurality of shelves in the lateral direction.SOLUTION: The inspection system includes: an inspection region which includes a plurality of inspection units performing the electrical testing of an inspection target body; an arrangement part in which a container for accommodating the inspection target body is arranged; and a loader region having a loader to transfer the inspection target body between the accommodation container and the inspection region. The inspection unit is constituted by that a plurality of inspection unit rows, each having a plurality of inspection units arrayed in one direction of the horizontal direction, are arranged in a plurality of shelves in the vertical direction. The inspection region is provided adjacent to each shelves of the inspection unit rows of the inspection units, and includes: a plurality of carriage paths extending in one direction; a plurality of transfer mechanisms which are movably provided along each carriage path to transfer the inspection target body carried in from the loader to/from the inspection units; and a guide rail which is arranged along the plurality of carriage paths. The plurality of transfer mechanisms are supported in a manner capable of moving up and down by the guide rail.SELECTED DRAWING: Figure 3
【課題】複数の検査ユニットを複数段かつ横方向に複数配置した検査システムにおいて、一つの検査ユニットあたりのフットプリントを小さくする。【解決手段】検査システムは、被検査体の電気的検査を行う複数の検査ユニットを有する検査部を備えた検査領域と、被検査体の収容容器が配置される配置部、および収容容器と検査領域との間で被検査体の受け渡しを行うローダを有するローダ領域とを備える。検査部は、検査ユニットが水平方向の一方向に複数配列されて形成された検査ユニット列が、垂直方向に複数段配置されて構成され、検査領域は、検査部の検査ユニット列の各段に隣接して設けられ、一方向に延びる複数の搬送路と、各搬送路に沿って移動可能に設けられ、ローダから搬入された被検査体を検査ユニットとの間で受け渡す複数の搬送機構と、複数の搬送路に沿って配置されるガイドレールとを有し、複数の搬送機構は、昇降可能にガイドレールに支持される。【選択図】図3</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CONVEYING</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>HANDLING THIN OR FILAMENTARY MATERIAL</subject><subject>PACKING</subject><subject>PERFORMING OPERATIONS</subject><subject>PNEUMATIC TUBE CONVEYORS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SHOP CONVEYOR SYSTEMS</subject><subject>STORING</subject><subject>TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING ORTIPPING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBD09AsOcHUO8fT3UwiODA5x9eVhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGRoaGhpZmxhaOxkQpAgBu9R5v</recordid><startdate>20210812</startdate><enddate>20210812</enddate><creator>FUJIWARA JUN</creator><creator>KONISHI KENTARO</creator><creator>SHIKAGAWA HIROKI</creator><scope>EVB</scope></search><sort><creationdate>20210812</creationdate><title>INSPECTION SYSTEM</title><author>FUJIWARA JUN ; KONISHI KENTARO ; SHIKAGAWA HIROKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2021119638A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2021</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CONVEYING</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>HANDLING THIN OR FILAMENTARY MATERIAL</topic><topic>PACKING</topic><topic>PERFORMING OPERATIONS</topic><topic>PNEUMATIC TUBE CONVEYORS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SHOP CONVEYOR SYSTEMS</topic><topic>STORING</topic><topic>TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING ORTIPPING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>FUJIWARA JUN</creatorcontrib><creatorcontrib>KONISHI KENTARO</creatorcontrib><creatorcontrib>SHIKAGAWA HIROKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FUJIWARA JUN</au><au>KONISHI KENTARO</au><au>SHIKAGAWA HIROKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INSPECTION SYSTEM</title><date>2021-08-12</date><risdate>2021</risdate><abstract>To reduce a footprint per inspection unit in an inspection system having a plurality of inspection units arranged in a plurality of shelves in the lateral direction.SOLUTION: The inspection system includes: an inspection region which includes a plurality of inspection units performing the electrical testing of an inspection target body; an arrangement part in which a container for accommodating the inspection target body is arranged; and a loader region having a loader to transfer the inspection target body between the accommodation container and the inspection region. The inspection unit is constituted by that a plurality of inspection unit rows, each having a plurality of inspection units arrayed in one direction of the horizontal direction, are arranged in a plurality of shelves in the vertical direction. The inspection region is provided adjacent to each shelves of the inspection unit rows of the inspection units, and includes: a plurality of carriage paths extending in one direction; a plurality of transfer mechanisms which are movably provided along each carriage path to transfer the inspection target body carried in from the loader to/from the inspection units; and a guide rail which is arranged along the plurality of carriage paths. The plurality of transfer mechanisms are supported in a manner capable of moving up and down by the guide rail.SELECTED DRAWING: Figure 3
【課題】複数の検査ユニットを複数段かつ横方向に複数配置した検査システムにおいて、一つの検査ユニットあたりのフットプリントを小さくする。【解決手段】検査システムは、被検査体の電気的検査を行う複数の検査ユニットを有する検査部を備えた検査領域と、被検査体の収容容器が配置される配置部、および収容容器と検査領域との間で被検査体の受け渡しを行うローダを有するローダ領域とを備える。検査部は、検査ユニットが水平方向の一方向に複数配列されて形成された検査ユニット列が、垂直方向に複数段配置されて構成され、検査領域は、検査部の検査ユニット列の各段に隣接して設けられ、一方向に延びる複数の搬送路と、各搬送路に沿って移動可能に設けられ、ローダから搬入された被検査体を検査ユニットとの間で受け渡す複数の搬送機構と、複数の搬送路に沿って配置されるガイドレールとを有し、複数の搬送機構は、昇降可能にガイドレールに支持される。【選択図】図3</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng ; jpn |
recordid | cdi_epo_espacenet_JP2021119638A |
source | esp@cenet |
subjects | BASIC ELECTRIC ELEMENTS CONVEYING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY HANDLING THIN OR FILAMENTARY MATERIAL PACKING PERFORMING OPERATIONS PNEUMATIC TUBE CONVEYORS SEMICONDUCTOR DEVICES SHOP CONVEYOR SYSTEMS STORING TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING ORTIPPING TRANSPORTING |
title | INSPECTION SYSTEM |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T15%3A34%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=FUJIWARA%20JUN&rft.date=2021-08-12&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2021119638A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |