SEMICONDUCTOR ELEMENT CONTROL DEVICE
To provide a semiconductor element control device that determines correctly the deterioration due to temperature change of a semiconductor element and protect the semiconductor element.SOLUTION: A semiconductor element control device includes an element temperature sensor that detects the temperatur...
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| creator | HATASA KEITA |
| description | To provide a semiconductor element control device that determines correctly the deterioration due to temperature change of a semiconductor element and protect the semiconductor element.SOLUTION: A semiconductor element control device includes an element temperature sensor that detects the temperature of a semiconductor element, a protection unit that performs predetermined protecting operation for the semiconductor element, and a determination unit that determines whether to perform the protecting operation by the protection unit by comparing the detection temperature by the element temperature sensor and the upper limit threshold. The determination unit decreases the upper limit threshold when the detection temperature by the element temperature sensor becomes lower than the lower limit threshold.SELECTED DRAWING: Figure 3
【課題】半導体素子の制御装置において、半導体素子の温度変化による劣化を正確に判断し保護する。【解決手段】半導体素子の制御装置は、半導体素子の温度を検出する素子温度センサと、半導体素子に対して所定の保護動作を実行するための保護部と、素子温度センサによる検出温度と、上限閾値とを比較することにより、保護部による保護動作の要否を判断する判断部とを備え、判断部は、素子温度センサによる検出温度が下限閾値を下回ったときに、上限閾値を低下させる。【選択図】図３ |
| format | Patent |
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【課題】半導体素子の制御装置において、半導体素子の温度変化による劣化を正確に判断し保護する。【解決手段】半導体素子の制御装置は、半導体素子の温度を検出する素子温度センサと、半導体素子に対して所定の保護動作を実行するための保護部と、素子温度センサによる検出温度と、上限閾値とを比較することにより、保護部による保護動作の要否を判断する判断部とを備え、判断部は、素子温度センサによる検出温度が下限閾値を下回ったときに、上限閾値を低下させる。【選択図】図３</description><language>eng ; jpn</language><subject>APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS ; CONTROL OR REGULATION THEREOF ; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER ; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ; ELECTRICITY ; GENERATION</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210430&DB=EPODOC&CC=JP&NR=2021069234A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210430&DB=EPODOC&CC=JP&NR=2021069234A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HATASA KEITA</creatorcontrib><title>SEMICONDUCTOR ELEMENT CONTROL DEVICE</title><description>To provide a semiconductor element control device that determines correctly the deterioration due to temperature change of a semiconductor element and protect the semiconductor element.SOLUTION: A semiconductor element control device includes an element temperature sensor that detects the temperature of a semiconductor element, a protection unit that performs predetermined protecting operation for the semiconductor element, and a determination unit that determines whether to perform the protecting operation by the protection unit by comparing the detection temperature by the element temperature sensor and the upper limit threshold. The determination unit decreases the upper limit threshold when the detection temperature by the element temperature sensor becomes lower than the lower limit threshold.SELECTED DRAWING: Figure 3
【課題】半導体素子の制御装置において、半導体素子の温度変化による劣化を正確に判断し保護する。【解決手段】半導体素子の制御装置は、半導体素子の温度を検出する素子温度センサと、半導体素子に対して所定の保護動作を実行するための保護部と、素子温度センサによる検出温度と、上限閾値とを比較することにより、保護部による保護動作の要否を判断する判断部とを備え、判断部は、素子温度センサによる検出温度が下限閾値を下回ったときに、上限閾値を低下させる。【選択図】図３</description><subject>APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS</subject><subject>CONTROL OR REGULATION THEREOF</subject><subject>CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER</subject><subject>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</subject><subject>ELECTRICITY</subject><subject>GENERATION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAJdvX1dPb3cwl1DvEPUnD1cfV19QtRAIqEBPn7KLi4hnk6u_IwsKYl5hSn8kJpbgYlN9cQZw_d1IL8-NTigsTk1LzUknivACMDI0MDM0sjYxNHY6IUAQDU8iOT</recordid><startdate>20210430</startdate><enddate>20210430</enddate><creator>HATASA KEITA</creator><scope>EVB</scope></search><sort><creationdate>20210430</creationdate><title>SEMICONDUCTOR ELEMENT CONTROL DEVICE</title><author>HATASA KEITA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2021069234A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2021</creationdate><topic>APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS</topic><topic>CONTROL OR REGULATION THEREOF</topic><topic>CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER</topic><topic>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</topic><topic>ELECTRICITY</topic><topic>GENERATION</topic><toplevel>online_resources</toplevel><creatorcontrib>HATASA KEITA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HATASA KEITA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SEMICONDUCTOR ELEMENT CONTROL DEVICE</title><date>2021-04-30</date><risdate>2021</risdate><abstract>To provide a semiconductor element control device that determines correctly the deterioration due to temperature change of a semiconductor element and protect the semiconductor element.SOLUTION: A semiconductor element control device includes an element temperature sensor that detects the temperature of a semiconductor element, a protection unit that performs predetermined protecting operation for the semiconductor element, and a determination unit that determines whether to perform the protecting operation by the protection unit by comparing the detection temperature by the element temperature sensor and the upper limit threshold. The determination unit decreases the upper limit threshold when the detection temperature by the element temperature sensor becomes lower than the lower limit threshold.SELECTED DRAWING: Figure 3
【課題】半導体素子の制御装置において、半導体素子の温度変化による劣化を正確に判断し保護する。【解決手段】半導体素子の制御装置は、半導体素子の温度を検出する素子温度センサと、半導体素子に対して所定の保護動作を実行するための保護部と、素子温度センサによる検出温度と、上限閾値とを比較することにより、保護部による保護動作の要否を判断する判断部とを備え、判断部は、素子温度センサによる検出温度が下限閾値を下回ったときに、上限閾値を低下させる。【選択図】図３</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS CONTROL OR REGULATION THEREOF CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ELECTRICITY GENERATION |
| title | SEMICONDUCTOR ELEMENT CONTROL DEVICE |
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