DEVICE AND METHOD FOR ULTRASONIC INSPECTION
To provide an ultrasonic inspection device that can increase the accuracy of inspecting an inspection target for defects.SOLUTION: The ultrasonic inspection device includes: an acquisition unit for acquiring, for each scan position, a signal that shows a basic wave and a secondary harmonic of an ult...
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| creator | ITO YUKA OKUBO MIZUKI HORIE NAYUTA YAMAGUCHI EIJI |
| description | To provide an ultrasonic inspection device that can increase the accuracy of inspecting an inspection target for defects.SOLUTION: The ultrasonic inspection device includes: an acquisition unit for acquiring, for each scan position, a signal that shows a basic wave and a secondary harmonic of an ultrasonic wave obtained by a scan by an ultrasonic wave on the inspection target through a medium; a calculation unit for calculating, for each scan position, a value obtained by dividing the amplitude of the secondary harmonic by the square of the amplitude of the basic wave; and an output unit for outputting information on defects of the inspection target on the basis of the value obtained by dividing the amplitude of the secondary harmonic by the square of the amplitude of the basic wave.SELECTED DRAWING: Figure 2
【課題】検査対象の欠陥の検査精度を向上できる超音波検査装置を提供する。【解決手段】超音波検査装置は、検査対象に媒質を介して超音波が走査されて得られる超音波の基本波と二次高調波とを示す信号を、走査位置ごとに取得する取得部と、走査位置ごとに、二次高調波振幅を基本波振幅の二乗で除算した値を算出する算出部と、基本波振幅の二乗で除算した値に基づいて検査対象の欠陥の情報を出力する出力部とを備える。【選択図】図２ |
| format | Patent |
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【課題】検査対象の欠陥の検査精度を向上できる超音波検査装置を提供する。【解決手段】超音波検査装置は、検査対象に媒質を介して超音波が走査されて得られる超音波の基本波と二次高調波とを示す信号を、走査位置ごとに取得する取得部と、走査位置ごとに、二次高調波振幅を基本波振幅の二乗で除算した値を算出する算出部と、基本波振幅の二乗で除算した値に基づいて検査対象の欠陥の情報を出力する出力部とを備える。【選択図】図２</description><language>eng ; jpn</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210422&DB=EPODOC&CC=JP&NR=2021063803A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210422&DB=EPODOC&CC=JP&NR=2021063803A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ITO YUKA</creatorcontrib><creatorcontrib>OKUBO MIZUKI</creatorcontrib><creatorcontrib>HORIE NAYUTA</creatorcontrib><creatorcontrib>YAMAGUCHI EIJI</creatorcontrib><title>DEVICE AND METHOD FOR ULTRASONIC INSPECTION</title><description>To provide an ultrasonic inspection device that can increase the accuracy of inspecting an inspection target for defects.SOLUTION: The ultrasonic inspection device includes: an acquisition unit for acquiring, for each scan position, a signal that shows a basic wave and a secondary harmonic of an ultrasonic wave obtained by a scan by an ultrasonic wave on the inspection target through a medium; a calculation unit for calculating, for each scan position, a value obtained by dividing the amplitude of the secondary harmonic by the square of the amplitude of the basic wave; and an output unit for outputting information on defects of the inspection target on the basis of the value obtained by dividing the amplitude of the secondary harmonic by the square of the amplitude of the basic wave.SELECTED DRAWING: Figure 2
【課題】検査対象の欠陥の検査精度を向上できる超音波検査装置を提供する。【解決手段】超音波検査装置は、検査対象に媒質を介して超音波が走査されて得られる超音波の基本波と二次高調波とを示す信号を、走査位置ごとに取得する取得部と、走査位置ごとに、二次高調波振幅を基本波振幅の二乗で除算した値を算出する算出部と、基本波振幅の二乗で除算した値に基づいて検査対象の欠陥の情報を出力する出力部とを備える。【選択図】図２</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNB2cQ3zdHZVcPRzUfB1DfHwd1Fw8w9SCPUJCXIM9vfzdFbw9AsOcHUO8fT342FgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgZGhgZmxhYGxo7GRCkCALF2JUM</recordid><startdate>20210422</startdate><enddate>20210422</enddate><creator>ITO YUKA</creator><creator>OKUBO MIZUKI</creator><creator>HORIE NAYUTA</creator><creator>YAMAGUCHI EIJI</creator><scope>EVB</scope></search><sort><creationdate>20210422</creationdate><title>DEVICE AND METHOD FOR ULTRASONIC INSPECTION</title><author>ITO YUKA ; OKUBO MIZUKI ; HORIE NAYUTA ; YAMAGUCHI EIJI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2021063803A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2021</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ITO YUKA</creatorcontrib><creatorcontrib>OKUBO MIZUKI</creatorcontrib><creatorcontrib>HORIE NAYUTA</creatorcontrib><creatorcontrib>YAMAGUCHI EIJI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ITO YUKA</au><au>OKUBO MIZUKI</au><au>HORIE NAYUTA</au><au>YAMAGUCHI EIJI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DEVICE AND METHOD FOR ULTRASONIC INSPECTION</title><date>2021-04-22</date><risdate>2021</risdate><abstract>To provide an ultrasonic inspection device that can increase the accuracy of inspecting an inspection target for defects.SOLUTION: The ultrasonic inspection device includes: an acquisition unit for acquiring, for each scan position, a signal that shows a basic wave and a secondary harmonic of an ultrasonic wave obtained by a scan by an ultrasonic wave on the inspection target through a medium; a calculation unit for calculating, for each scan position, a value obtained by dividing the amplitude of the secondary harmonic by the square of the amplitude of the basic wave; and an output unit for outputting information on defects of the inspection target on the basis of the value obtained by dividing the amplitude of the secondary harmonic by the square of the amplitude of the basic wave.SELECTED DRAWING: Figure 2
【課題】検査対象の欠陥の検査精度を向上できる超音波検査装置を提供する。【解決手段】超音波検査装置は、検査対象に媒質を介して超音波が走査されて得られる超音波の基本波と二次高調波とを示す信号を、走査位置ごとに取得する取得部と、走査位置ごとに、二次高調波振幅を基本波振幅の二乗で除算した値を算出する算出部と、基本波振幅の二乗で除算した値に基づいて検査対象の欠陥の情報を出力する出力部とを備える。【選択図】図２</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | DEVICE AND METHOD FOR ULTRASONIC INSPECTION |
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