CONTACT PROBE AND INSPECTION SOCKET HAVING THE SAME

To provide a contact probe which has a simple shape and can be manufactured at a low cost.SOLUTION: The present invention includes: a barrel 15; an upper plunger 16; a lower plunger 17; and a coil spring 18. The upper plunger 16 is a moving terminal, which moves in a direction of a center axis line...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SUZUKI KATSUMI, YAMAMOTO SEIYA
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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