SCAN UNIT FOR ANGULAR MEASUREMENT MECHANISM

To provide a scan unit which can be precisely assembled with a less time and effort by an induction type angular measurement mechanism without bearing and can be attached to a mechanical part.SOLUTION: A scan unit includes a printed board 1 having a first surface 1.1 and a second surface, and a hous...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	GREGOR ROSENEGGER, CHRISTIAN FUNK, STRASSER ERICH, ANDREAS MITTERER
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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