PROBE

To provide a probe which ensures a desired stroke amount and needle pressure, and minimizes creeping and breakage of a needle even when a coil spring diameter is reduced.SOLUTION: A probe comprises a core material 3, and a coil spring 22 having one end thereof fixed or locked to the core material 3...

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1. Verfasser:	NAGATA KAZUSHI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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creator	NAGATA KAZUSHI
description	To provide a probe which ensures a desired stroke amount and needle pressure, and minimizes creeping and breakage of a needle even when a coil spring diameter is reduced.SOLUTION: A probe comprises a core material 3, and a coil spring 22 having one end thereof fixed or locked to the core material 3 and the other end fixed or locked to another member. The coil spring 22 is stiffer at the one end and the other end thereof than in a middle section 22b.SELECTED DRAWING: Figure 2 【課題】所望のストローク量と針圧とを確保しつつ、コイルばねの径を細くした場合であっても、クリープや針折れが生じるのを抑制することができるプローブを提供する。【解決手段】芯材３と、軸方向において、一方の端部が芯材３に固定又は係止され、他方の端部が他の部材に固定又は係止されるコイルばね２２とを備える。コイルばね２２は、一方の端部及び他方の端部の剛性が中間部２２ｂの剛性よりも大きい。【選択図】図２
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The coil spring 22 is stiffer at the one end and the other end thereof than in a middle section 22b.SELECTED DRAWING: Figure 2 【課題】所望のストローク量と針圧とを確保しつつ、コイルばねの径を細くした場合であっても、クリープや針折れが生じるのを抑制することができるプローブを提供する。【解決手段】芯材３と、軸方向において、一方の端部が芯材３に固定又は係止され、他方の端部が他の部材に固定又は係止されるコイルばね２２とを備える。コイルばね２２は、一方の端部及び他方の端部の剛性が中間部２２ｂの剛性よりも大きい。【選択図】図２</description><language>eng ; jpn</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190926&DB=EPODOC&CC=JP&NR=2019164152A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190926&DB=EPODOC&CC=JP&NR=2019164152A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NAGATA KAZUSHI</creatorcontrib><title>PROBE</title><description>To provide a probe which ensures a desired stroke amount and needle pressure, and minimizes creeping and breakage of a needle even when a coil spring diameter is reduced.SOLUTION: A probe comprises a core material 3, and a coil spring 22 having one end thereof fixed or locked to the core material 3 and the other end fixed or locked to another member. The coil spring 22 is stiffer at the one end and the other end thereof than in a middle section 22b.SELECTED DRAWING: Figure 2 【課題】所望のストローク量と針圧とを確保しつつ、コイルばねの径を細くした場合であっても、クリープや針折れが生じるのを抑制することができるプローブを提供する。【解決手段】芯材３と、軸方向において、一方の端部が芯材３に固定又は係止され、他方の端部が他の部材に固定又は係止されるコイルばね２２とを備える。コイルばね２２は、一方の端部及び他方の端部の剛性が中間部２２ｂの剛性よりも大きい。【選択図】図２</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZGANCPJ3cuVhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGhpaGZiaGpkaOxkQpAgAChhrW</recordid><startdate>20190926</startdate><enddate>20190926</enddate><creator>NAGATA KAZUSHI</creator><scope>EVB</scope></search><sort><creationdate>20190926</creationdate><title>PROBE</title><author>NAGATA KAZUSHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2019164152A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2019</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NAGATA KAZUSHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAGATA KAZUSHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PROBE</title><date>2019-09-26</date><risdate>2019</risdate><abstract>To provide a probe which ensures a desired stroke amount and needle pressure, and minimizes creeping and breakage of a needle even when a coil spring diameter is reduced.SOLUTION: A probe comprises a core material 3, and a coil spring 22 having one end thereof fixed or locked to the core material 3 and the other end fixed or locked to another member. The coil spring 22 is stiffer at the one end and the other end thereof than in a middle section 22b.SELECTED DRAWING: Figure 2 【課題】所望のストローク量と針圧とを確保しつつ、コイルばねの径を細くした場合であっても、クリープや針折れが生じるのを抑制することができるプローブを提供する。【解決手段】芯材３と、軸方向において、一方の端部が芯材３に固定又は係止され、他方の端部が他の部材に固定又は係止されるコイルばね２２とを備える。コイルばね２２は、一方の端部及び他方の端部の剛性が中間部２２ｂの剛性よりも大きい。【選択図】図２</abstract><oa>free_for_read</oa></addata></record>
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language	eng ; jpn
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subjects	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
title	PROBE
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