WIRING JIG FOR TEST

To reduce persons and time required for a preparation for start of a system test.SOLUTION: A wiring jig for test, according to an embodiment, connects: a target device as a test target; and a simulation device for test, by which a status determined by a testing condition is set in a plurality of inp...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: IDE KOSHIRO, MIMATSU YOHEI, ISHIZU YOSHIHIRO, TANAKA KAZUTO
Format: Patent
Sprache:eng ; jpn
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator IDE KOSHIRO
MIMATSU YOHEI
ISHIZU YOSHIHIRO
TANAKA KAZUTO
description To reduce persons and time required for a preparation for start of a system test.SOLUTION: A wiring jig for test, according to an embodiment, connects: a target device as a test target; and a simulation device for test, by which a status determined by a testing condition is set in a plurality of input terminals of the target device. The wiring jig for test comprises: a connector that can be connected to a connector of the simulation device for test; a plurality of connection terminals that can be respectively connected to the plurality of input terminals of the target device; a plurality of cables, one ends of which are connected to a plurality of terminals of the connector and the other ends of which are connected to the connection terminals; and a tag attached to each of the plurality of cables and on which information specifying a connection destination for each of the plurality of cables is recorded.SELECTED DRAWING: Figure 8 【課題】システム試験を開始するまでの準備に要する人と時間を削減する。【解決手段】実施形態に係る試験用配線治具は、試験対象とする対象装置と、対象装置が有する複数の入力端子に試験条件で定められた状態を設定する試験用模擬装置と、を接続する試験用配線治具である。試験用配線治具は、試験用模擬装置のコネクタに接続可能な接続コネクタと、対象装置の複数の入力端子にそれぞれ接続可能な複数の接続端子と、一端が、接続コネクタの複数の端子にそれぞれ接続され、他端が、接続端子にそれぞれ接続された複数のケーブルと、複数のケーブルそれぞれに取り付けられ、複数のケーブルそれぞれの接続先を特定する情報が記載されたタグと、を備える。【選択図】図8
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2019149085A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2019149085A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2019149085A3</originalsourceid><addsrcrecordid>eNrjZBAO9wzy9HNX8PJ0V3DzD1IIcQ0O4WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgaGloYmlgYWpo7GRCkCAIl7Hq0</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>WIRING JIG FOR TEST</title><source>esp@cenet</source><creator>IDE KOSHIRO ; MIMATSU YOHEI ; ISHIZU YOSHIHIRO ; TANAKA KAZUTO</creator><creatorcontrib>IDE KOSHIRO ; MIMATSU YOHEI ; ISHIZU YOSHIHIRO ; TANAKA KAZUTO</creatorcontrib><description>To reduce persons and time required for a preparation for start of a system test.SOLUTION: A wiring jig for test, according to an embodiment, connects: a target device as a test target; and a simulation device for test, by which a status determined by a testing condition is set in a plurality of input terminals of the target device. The wiring jig for test comprises: a connector that can be connected to a connector of the simulation device for test; a plurality of connection terminals that can be respectively connected to the plurality of input terminals of the target device; a plurality of cables, one ends of which are connected to a plurality of terminals of the connector and the other ends of which are connected to the connection terminals; and a tag attached to each of the plurality of cables and on which information specifying a connection destination for each of the plurality of cables is recorded.SELECTED DRAWING: Figure 8 【課題】システム試験を開始するまでの準備に要する人と時間を削減する。【解決手段】実施形態に係る試験用配線治具は、試験対象とする対象装置と、対象装置が有する複数の入力端子に試験条件で定められた状態を設定する試験用模擬装置と、を接続する試験用配線治具である。試験用配線治具は、試験用模擬装置のコネクタに接続可能な接続コネクタと、対象装置の複数の入力端子にそれぞれ接続可能な複数の接続端子と、一端が、接続コネクタの複数の端子にそれぞれ接続され、他端が、接続端子にそれぞれ接続された複数のケーブルと、複数のケーブルそれぞれに取り付けられ、複数のケーブルそれぞれの接続先を特定する情報が記載されたタグと、を備える。【選択図】図8</description><language>eng ; jpn</language><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190905&amp;DB=EPODOC&amp;CC=JP&amp;NR=2019149085A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25544,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190905&amp;DB=EPODOC&amp;CC=JP&amp;NR=2019149085A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>IDE KOSHIRO</creatorcontrib><creatorcontrib>MIMATSU YOHEI</creatorcontrib><creatorcontrib>ISHIZU YOSHIHIRO</creatorcontrib><creatorcontrib>TANAKA KAZUTO</creatorcontrib><title>WIRING JIG FOR TEST</title><description>To reduce persons and time required for a preparation for start of a system test.SOLUTION: A wiring jig for test, according to an embodiment, connects: a target device as a test target; and a simulation device for test, by which a status determined by a testing condition is set in a plurality of input terminals of the target device. The wiring jig for test comprises: a connector that can be connected to a connector of the simulation device for test; a plurality of connection terminals that can be respectively connected to the plurality of input terminals of the target device; a plurality of cables, one ends of which are connected to a plurality of terminals of the connector and the other ends of which are connected to the connection terminals; and a tag attached to each of the plurality of cables and on which information specifying a connection destination for each of the plurality of cables is recorded.SELECTED DRAWING: Figure 8 【課題】システム試験を開始するまでの準備に要する人と時間を削減する。【解決手段】実施形態に係る試験用配線治具は、試験対象とする対象装置と、対象装置が有する複数の入力端子に試験条件で定められた状態を設定する試験用模擬装置と、を接続する試験用配線治具である。試験用配線治具は、試験用模擬装置のコネクタに接続可能な接続コネクタと、対象装置の複数の入力端子にそれぞれ接続可能な複数の接続端子と、一端が、接続コネクタの複数の端子にそれぞれ接続され、他端が、接続端子にそれぞれ接続された複数のケーブルと、複数のケーブルそれぞれに取り付けられ、複数のケーブルそれぞれの接続先を特定する情報が記載されたタグと、を備える。【選択図】図8</description><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBAO9wzy9HNX8PJ0V3DzD1IIcQ0O4WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgaGloYmlgYWpo7GRCkCAIl7Hq0</recordid><startdate>20190905</startdate><enddate>20190905</enddate><creator>IDE KOSHIRO</creator><creator>MIMATSU YOHEI</creator><creator>ISHIZU YOSHIHIRO</creator><creator>TANAKA KAZUTO</creator><scope>EVB</scope></search><sort><creationdate>20190905</creationdate><title>WIRING JIG FOR TEST</title><author>IDE KOSHIRO ; MIMATSU YOHEI ; ISHIZU YOSHIHIRO ; TANAKA KAZUTO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2019149085A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2019</creationdate><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><toplevel>online_resources</toplevel><creatorcontrib>IDE KOSHIRO</creatorcontrib><creatorcontrib>MIMATSU YOHEI</creatorcontrib><creatorcontrib>ISHIZU YOSHIHIRO</creatorcontrib><creatorcontrib>TANAKA KAZUTO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>IDE KOSHIRO</au><au>MIMATSU YOHEI</au><au>ISHIZU YOSHIHIRO</au><au>TANAKA KAZUTO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>WIRING JIG FOR TEST</title><date>2019-09-05</date><risdate>2019</risdate><abstract>To reduce persons and time required for a preparation for start of a system test.SOLUTION: A wiring jig for test, according to an embodiment, connects: a target device as a test target; and a simulation device for test, by which a status determined by a testing condition is set in a plurality of input terminals of the target device. The wiring jig for test comprises: a connector that can be connected to a connector of the simulation device for test; a plurality of connection terminals that can be respectively connected to the plurality of input terminals of the target device; a plurality of cables, one ends of which are connected to a plurality of terminals of the connector and the other ends of which are connected to the connection terminals; and a tag attached to each of the plurality of cables and on which information specifying a connection destination for each of the plurality of cables is recorded.SELECTED DRAWING: Figure 8 【課題】システム試験を開始するまでの準備に要する人と時間を削減する。【解決手段】実施形態に係る試験用配線治具は、試験対象とする対象装置と、対象装置が有する複数の入力端子に試験条件で定められた状態を設定する試験用模擬装置と、を接続する試験用配線治具である。試験用配線治具は、試験用模擬装置のコネクタに接続可能な接続コネクタと、対象装置の複数の入力端子にそれぞれ接続可能な複数の接続端子と、一端が、接続コネクタの複数の端子にそれぞれ接続され、他端が、接続端子にそれぞれ接続された複数のケーブルと、複数のケーブルそれぞれに取り付けられ、複数のケーブルそれぞれの接続先を特定する情報が記載されたタグと、を備える。【選択図】図8</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; jpn
recordid cdi_epo_espacenet_JP2019149085A
source esp@cenet
subjects CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
title WIRING JIG FOR TEST
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T22%3A29%3A03IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=IDE%20KOSHIRO&rft.date=2019-09-05&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2019149085A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true