ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM
To identify an error factor of a prediction error.SOLUTION: An analysis apparatus has a processor and a storage device storing a prediction model formula for predicting results for event group factors, and the processor executes: prediction error calculation processing for calculating, based on a fi...
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| creator | MIMURA KAZU TSUSHIMA YUJI IKEGAMI KOZO |
| description | To identify an error factor of a prediction error.SOLUTION: An analysis apparatus has a processor and a storage device storing a prediction model formula for predicting results for event group factors, and the processor executes: prediction error calculation processing for calculating, based on a first prediction value obtained by giving first appearance frequency for the first event factor in the event group to the prediction model formula and a result corresponding to the first appearance frequency, prediction error of the first prediction value; and error factor extraction processing of extracting an error factor of the prediction error from among the first event factors based on correlation between second appearance frequency for the second event factors in the event group and the prediction error calculated by the prediction error calculation processing.SELECTED DRAWING: Figure 8
【課題】予測誤差の誤差要因を特定すること。【解決手段】プロセッサと、事象群の要因に対する結果を予測する予測モデル式を記憶する記憶デバイスと、を有する分析装置であって、前記プロセッサは、前記事象群の中の第１事象の要因に対する第１出現頻度を前記予測モデル式に与えることで得られる第１予測値と、前記第１出現頻度に対応する結果と、に基づいて、前記第１予測値の予測誤差を算出する予測誤差算出処理と、前記事象群の中の第２事象の要因に対する第２出現頻度と、前記予測誤差算出処理によって算出された予測誤差と、の相関に基づいて、前記第１事象の要因の中から前記予測誤差の誤差要因を抽出する誤差要因抽出処理と、を実行する。【選択図】図８ |
| format | Patent |
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【課題】予測誤差の誤差要因を特定すること。【解決手段】プロセッサと、事象群の要因に対する結果を予測する予測モデル式を記憶する記憶デバイスと、を有する分析装置であって、前記プロセッサは、前記事象群の中の第１事象の要因に対する第１出現頻度を前記予測モデル式に与えることで得られる第１予測値と、前記第１出現頻度に対応する結果と、に基づいて、前記第１予測値の予測誤差を算出する予測誤差算出処理と、前記事象群の中の第２事象の要因に対する第２出現頻度と、前記予測誤差算出処理によって算出された予測誤差と、の相関に基づいて、前記第１事象の要因の中から前記予測誤差の誤差要因を抽出する誤差要因抽出処理と、を実行する。【選択図】図８</description><language>eng ; jpn</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190829&DB=EPODOC&CC=JP&NR=2019144970A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190829&DB=EPODOC&CC=JP&NR=2019144970A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MIMURA KAZU</creatorcontrib><creatorcontrib>TSUSHIMA YUJI</creatorcontrib><creatorcontrib>IKEGAMI KOZO</creatorcontrib><title>ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM</title><description>To identify an error factor of a prediction error.SOLUTION: An analysis apparatus has a processor and a storage device storing a prediction model formula for predicting results for event group factors, and the processor executes: prediction error calculation processing for calculating, based on a first prediction value obtained by giving first appearance frequency for the first event factor in the event group to the prediction model formula and a result corresponding to the first appearance frequency, prediction error of the first prediction value; and error factor extraction processing of extracting an error factor of the prediction error from among the first event factors based on correlation between second appearance frequency for the second event factors in the event group and the prediction error calculated by the prediction error calculation processing.SELECTED DRAWING: Figure 8
【課題】予測誤差の誤差要因を特定すること。【解決手段】プロセッサと、事象群の要因に対する結果を予測する予測モデル式を記憶する記憶デバイスと、を有する分析装置であって、前記プロセッサは、前記事象群の中の第１事象の要因に対する第１出現頻度を前記予測モデル式に与えることで得られる第１予測値と、前記第１出現頻度に対応する結果と、に基づいて、前記第１予測値の予測誤差を算出する予測誤差算出処理と、前記事象群の中の第２事象の要因に対する第２出現頻度と、前記予測誤差算出処理によって算出された予測誤差と、の相関に基づいて、前記第１事象の要因の中から前記予測誤差の誤差要因を抽出する誤差要因抽出処理と、を実行する。【選択図】図８</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB09HP0iQz2DFZwDAhwDHIMCQ3WUYCL-bqGePi7gARcEIIBQf7uQY6-PAysaYk5xam8UJqbQcnNNcTZQze1ID8-tbggMTk1L7Uk3ivAyMDQ0tDExNLcwNGYKEUA4Y4pPw</recordid><startdate>20190829</startdate><enddate>20190829</enddate><creator>MIMURA KAZU</creator><creator>TSUSHIMA YUJI</creator><creator>IKEGAMI KOZO</creator><scope>EVB</scope></search><sort><creationdate>20190829</creationdate><title>ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM</title><author>MIMURA KAZU ; TSUSHIMA YUJI ; IKEGAMI KOZO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2019144970A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2019</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>MIMURA KAZU</creatorcontrib><creatorcontrib>TSUSHIMA YUJI</creatorcontrib><creatorcontrib>IKEGAMI KOZO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MIMURA KAZU</au><au>TSUSHIMA YUJI</au><au>IKEGAMI KOZO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM</title><date>2019-08-29</date><risdate>2019</risdate><abstract>To identify an error factor of a prediction error.SOLUTION: An analysis apparatus has a processor and a storage device storing a prediction model formula for predicting results for event group factors, and the processor executes: prediction error calculation processing for calculating, based on a first prediction value obtained by giving first appearance frequency for the first event factor in the event group to the prediction model formula and a result corresponding to the first appearance frequency, prediction error of the first prediction value; and error factor extraction processing of extracting an error factor of the prediction error from among the first event factors based on correlation between second appearance frequency for the second event factors in the event group and the prediction error calculated by the prediction error calculation processing.SELECTED DRAWING: Figure 8
【課題】予測誤差の誤差要因を特定すること。【解決手段】プロセッサと、事象群の要因に対する結果を予測する予測モデル式を記憶する記憶デバイスと、を有する分析装置であって、前記プロセッサは、前記事象群の中の第１事象の要因に対する第１出現頻度を前記予測モデル式に与えることで得られる第１予測値と、前記第１出現頻度に対応する結果と、に基づいて、前記第１予測値の予測誤差を算出する予測誤差算出処理と、前記事象群の中の第２事象の要因に対する第２出現頻度と、前記予測誤差算出処理によって算出された予測誤差と、の相関に基づいて、前記第１事象の要因の中から前記予測誤差の誤差要因を抽出する誤差要因抽出処理と、を実行する。【選択図】図８</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
| title | ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM |
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