FILM DEPOSITION APPARATUS AND FILM DEPOSITION METHOD
To provide a technique capable of performing stable film deposition with small changes in film deposition speed and film quality by suppressing a rise in plasma impedance caused under an influence of stains on an antenna.SOLUTION: A film deposition apparatus 1 comprises: a vacuum chamber 10; a catho...
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Format: | Patent |
Sprache: | eng ; jpn |
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Zusammenfassung: | To provide a technique capable of performing stable film deposition with small changes in film deposition speed and film quality by suppressing a rise in plasma impedance caused under an influence of stains on an antenna.SOLUTION: A film deposition apparatus 1 comprises: a vacuum chamber 10; a cathode 51 capable of having a target 512 installed; high-frequency antenna 52, 53 arranged in the vicinity of the target; a substrate holding part 31 holding a substrate S opposite the target; a gas supply part 54 supplying a sputtering gas; a cathode power supply 571 supplying predetermined cathode electric power to a cathode; a high-frequency power supply 572 supplying high-frequency electric power to the high-frequency antennas to generate induction coupling plasma; and matching units 575, 576 electrically interposed between the high-frequency antennas and high-frequency power supply to perform impedance matching. The high-frequency power supply adjusts the level of the high-frequency electric power supplied to the high-frequency antennas based upon a measurement result of at least one of a current flowing through the cathode and a voltage across the cathode.SELECTED DRAWING: Figure 4
【課題】アンテナの汚れの影響によるプラズマインピーダンス上昇を抑えて、成膜速度および膜質の変動の少ない安定した成膜を行うことのできる技術を提供する。【解決手段】成膜装置1は、真空チャンバ10と、ターゲット512を設置可能なカソード51と、ターゲットの近傍に配置される高周波アンテナ52,53と、基板Sをターゲットに対向させて保持する基板保持部31と、スパッタガスを供給するガス供給部54と、カソードに所定のカソード電力を供給するカソード電源571と、高周波アンテナに高周波電力を供給して誘導結合プラズマを発生させる高周波電源572と、高周波アンテナと高周波電源との間に電気的に介挿されてインピーダンス整合を行う整合器575,576とを備え、高周波電源は、カソードに流れる電流およびカソードの電圧の少なくとも一方の計測結果に基づき高周波アンテナに与える高周波電力の大きさを調整する。【選択図】図4 |
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