INSPECTION DEVICE
To provide an inspection device for inspecting an inspection object, with which it is possible to shorten an inspection object replacement time while simplifying the configuration.SOLUTION: This inspection device comprises a holding unit 6 having a holding mechanism 34 at one end and a holding mecha...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; jpn |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | YOSHIDA SHIYOUGO AKAHA MASATOSHI |
| description | To provide an inspection device for inspecting an inspection object, with which it is possible to shorten an inspection object replacement time while simplifying the configuration.SOLUTION: This inspection device comprises a holding unit 6 having a holding mechanism 34 at one end and a holding mechanism 35 at the other end, and a rotation mechanism 7 for rotating the holding unit 6 around the center position of the holding unit 6 as the center of rotation, the vertical direction being the axial direction of rotation. The rotation mechanism 7 rotates the holding unit 6 to a first replacement position where the holding mechanism 34 is arranged upward of a first placement unit 3 during lighting inspection on which an inspection object 2 before and after lighting inspection is placed and the holding mechanism 35 is arranged upward of a second placement unit 4 on which the inspection object 2 is placed, and a second replacement position where the holding unit 6 rotates 180 degrees from the first replacement position and the holding mechanism 34 is arranged upward of the second placement unit 4 and the holding mechanism 35 is arranged upward of the first placement unit 3.SELECTED DRAWING: Figure 2
【課題】検査対象物を点灯検査するための検査装置において、構成を簡素化しつつ、検査対象物の入替時間を短縮することが可能な検査装置を提供する。【解決手段】この検査装置は、保持機構３４を一端側に有するとともに保持機構３５を他端側に有する保持部６と、上下方向を回転の軸方向としてかつ保持部６の中心位置を回転中心にして保持部６を回転させる回転機構７とを備えている。回転機構７は、点灯検査時に検査対象物２が載置される第１載置部３の上側に保持機構３４が配置されるとともに点灯検査前および点灯検査後の検査対象物２が載置される第２載置部４の上側に保持機構３５が配置される第１入替位置と、第１入替位置から保持部６が１８０°回転して保持機構３４が第２載置部４の上側に配置されるとともに保持機構３５が第１載置部３の上側に配置される第２入替位置とに保持部６を回転させている。【選択図】図２ |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2019052914A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2019052914A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2019052914A3</originalsourceid><addsrcrecordid>eNrjZBD09AsOcHUO8fT3U3BxDfN0duVhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGhpYGpkaWhiaOxkQpAgBbuh46</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>INSPECTION DEVICE</title><source>esp@cenet</source><creator>YOSHIDA SHIYOUGO ; AKAHA MASATOSHI</creator><creatorcontrib>YOSHIDA SHIYOUGO ; AKAHA MASATOSHI</creatorcontrib><description>To provide an inspection device for inspecting an inspection object, with which it is possible to shorten an inspection object replacement time while simplifying the configuration.SOLUTION: This inspection device comprises a holding unit 6 having a holding mechanism 34 at one end and a holding mechanism 35 at the other end, and a rotation mechanism 7 for rotating the holding unit 6 around the center position of the holding unit 6 as the center of rotation, the vertical direction being the axial direction of rotation. The rotation mechanism 7 rotates the holding unit 6 to a first replacement position where the holding mechanism 34 is arranged upward of a first placement unit 3 during lighting inspection on which an inspection object 2 before and after lighting inspection is placed and the holding mechanism 35 is arranged upward of a second placement unit 4 on which the inspection object 2 is placed, and a second replacement position where the holding unit 6 rotates 180 degrees from the first replacement position and the holding mechanism 34 is arranged upward of the second placement unit 4 and the holding mechanism 35 is arranged upward of the first placement unit 3.SELECTED DRAWING: Figure 2
【課題】検査対象物を点灯検査するための検査装置において、構成を簡素化しつつ、検査対象物の入替時間を短縮することが可能な検査装置を提供する。【解決手段】この検査装置は、保持機構３４を一端側に有するとともに保持機構３５を他端側に有する保持部６と、上下方向を回転の軸方向としてかつ保持部６の中心位置を回転中心にして保持部６を回転させる回転機構７とを備えている。回転機構７は、点灯検査時に検査対象物２が載置される第１載置部３の上側に保持機構３４が配置されるとともに点灯検査前および点灯検査後の検査対象物２が載置される第２載置部４の上側に保持機構３５が配置される第１入替位置と、第１入替位置から保持部６が１８０°回転して保持機構３４が第２載置部４の上側に配置されるとともに保持機構３５が第１載置部３の上側に配置される第２入替位置とに保持部６を回転させている。【選択図】図２</description><language>eng ; jpn</language><subject>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING ; FREQUENCY-CHANGING ; MEASURING ; NON-LINEAR OPTICS ; OPTICAL ANALOGUE/DIGITAL CONVERTERS ; OPTICAL LOGIC ELEMENTS ; OPTICS ; PHYSICS ; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190404&DB=EPODOC&CC=JP&NR=2019052914A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190404&DB=EPODOC&CC=JP&NR=2019052914A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YOSHIDA SHIYOUGO</creatorcontrib><creatorcontrib>AKAHA MASATOSHI</creatorcontrib><title>INSPECTION DEVICE</title><description>To provide an inspection device for inspecting an inspection object, with which it is possible to shorten an inspection object replacement time while simplifying the configuration.SOLUTION: This inspection device comprises a holding unit 6 having a holding mechanism 34 at one end and a holding mechanism 35 at the other end, and a rotation mechanism 7 for rotating the holding unit 6 around the center position of the holding unit 6 as the center of rotation, the vertical direction being the axial direction of rotation. The rotation mechanism 7 rotates the holding unit 6 to a first replacement position where the holding mechanism 34 is arranged upward of a first placement unit 3 during lighting inspection on which an inspection object 2 before and after lighting inspection is placed and the holding mechanism 35 is arranged upward of a second placement unit 4 on which the inspection object 2 is placed, and a second replacement position where the holding unit 6 rotates 180 degrees from the first replacement position and the holding mechanism 34 is arranged upward of the second placement unit 4 and the holding mechanism 35 is arranged upward of the first placement unit 3.SELECTED DRAWING: Figure 2
【課題】検査対象物を点灯検査するための検査装置において、構成を簡素化しつつ、検査対象物の入替時間を短縮することが可能な検査装置を提供する。【解決手段】この検査装置は、保持機構３４を一端側に有するとともに保持機構３５を他端側に有する保持部６と、上下方向を回転の軸方向としてかつ保持部６の中心位置を回転中心にして保持部６を回転させる回転機構７とを備えている。回転機構７は、点灯検査時に検査対象物２が載置される第１載置部３の上側に保持機構３４が配置されるとともに点灯検査前および点灯検査後の検査対象物２が載置される第２載置部４の上側に保持機構３５が配置される第１入替位置と、第１入替位置から保持部６が１８０°回転して保持機構３４が第２載置部４の上側に配置されるとともに保持機構３５が第１載置部３の上側に配置される第２入替位置とに保持部６を回転させている。【選択図】図２</description><subject>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING</subject><subject>FREQUENCY-CHANGING</subject><subject>MEASURING</subject><subject>NON-LINEAR OPTICS</subject><subject>OPTICAL ANALOGUE/DIGITAL CONVERTERS</subject><subject>OPTICAL LOGIC ELEMENTS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBD09AsOcHUO8fT3U3BxDfN0duVhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGhpYGpkaWhiaOxkQpAgBbuh46</recordid><startdate>20190404</startdate><enddate>20190404</enddate><creator>YOSHIDA SHIYOUGO</creator><creator>AKAHA MASATOSHI</creator><scope>EVB</scope></search><sort><creationdate>20190404</creationdate><title>INSPECTION DEVICE</title><author>YOSHIDA SHIYOUGO ; AKAHA MASATOSHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2019052914A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2019</creationdate><topic>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING</topic><topic>FREQUENCY-CHANGING</topic><topic>MEASURING</topic><topic>NON-LINEAR OPTICS</topic><topic>OPTICAL ANALOGUE/DIGITAL CONVERTERS</topic><topic>OPTICAL LOGIC ELEMENTS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>YOSHIDA SHIYOUGO</creatorcontrib><creatorcontrib>AKAHA MASATOSHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YOSHIDA SHIYOUGO</au><au>AKAHA MASATOSHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INSPECTION DEVICE</title><date>2019-04-04</date><risdate>2019</risdate><abstract>To provide an inspection device for inspecting an inspection object, with which it is possible to shorten an inspection object replacement time while simplifying the configuration.SOLUTION: This inspection device comprises a holding unit 6 having a holding mechanism 34 at one end and a holding mechanism 35 at the other end, and a rotation mechanism 7 for rotating the holding unit 6 around the center position of the holding unit 6 as the center of rotation, the vertical direction being the axial direction of rotation. The rotation mechanism 7 rotates the holding unit 6 to a first replacement position where the holding mechanism 34 is arranged upward of a first placement unit 3 during lighting inspection on which an inspection object 2 before and after lighting inspection is placed and the holding mechanism 35 is arranged upward of a second placement unit 4 on which the inspection object 2 is placed, and a second replacement position where the holding unit 6 rotates 180 degrees from the first replacement position and the holding mechanism 34 is arranged upward of the second placement unit 4 and the holding mechanism 35 is arranged upward of the first placement unit 3.SELECTED DRAWING: Figure 2
【課題】検査対象物を点灯検査するための検査装置において、構成を簡素化しつつ、検査対象物の入替時間を短縮することが可能な検査装置を提供する。【解決手段】この検査装置は、保持機構３４を一端側に有するとともに保持機構３５を他端側に有する保持部６と、上下方向を回転の軸方向としてかつ保持部６の中心位置を回転中心にして保持部６を回転させる回転機構７とを備えている。回転機構７は、点灯検査時に検査対象物２が載置される第１載置部３の上側に保持機構３４が配置されるとともに点灯検査前および点灯検査後の検査対象物２が載置される第２載置部４の上側に保持機構３５が配置される第１入替位置と、第１入替位置から保持部６が１８０°回転して保持機構３４が第２載置部４の上側に配置されるとともに保持機構３５が第１載置部３の上側に配置される第２入替位置とに保持部６を回転させている。【選択図】図２</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; jpn |
| recordid | cdi_epo_espacenet_JP2019052914A |
| source | esp@cenet |
| subjects | DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING FREQUENCY-CHANGING MEASURING NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
| title | INSPECTION DEVICE |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-03T08%3A01%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YOSHIDA%20SHIYOUGO&rft.date=2019-04-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2019052914A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |