APPARATUS AND METHOD FOR INSPECTING POWDER PARTICLE MASS, AND APPARATUS FOR PRODUCING POWDER CONTAINING ARTICLE AND METHOD FOR PRODUCING THE SAME
To provide a powder particle mass inspection apparatus capable of measuring the mass of a powder particle during spraying it with high accuracy.SOLUTION: A powder particle mass inspection apparatus 100 includes a data acquisition unit 90 which acquires an image pickup area of the particle based on t...
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creator | NAKAZAWA TOMOHIRO MANABE RYOSUKE |
description | To provide a powder particle mass inspection apparatus capable of measuring the mass of a powder particle during spraying it with high accuracy.SOLUTION: A powder particle mass inspection apparatus 100 includes a data acquisition unit 90 which acquires an image pickup area of the particle based on the 2-value image data generated from the image data of a free falling particle; a reference calibration curve creating unit 50 for creating a reference calibration curve that shows a relationship between the image pickup area and the mass of the particle measured at a predetermined time, and the reference calibration curve which is an approximation line of the reference calibration data group; a calibration curve calculating unit 55 that prepares a calibration curve by dividing the reference calibration curve into a plurality of sections based on a predetermined dividing reference and creating an approximation line of a reference calibration curve in each of the partitions; and a mass calculation unit 70 for selecting the mass of the powder to be inspected based on the calibration curve for a selected segment, based on the data of a predetermined selection criteria, and calculating the mass of the powder to be inspected based on the calibration curve in the selected category.SELECTED DRAWING: Figure 1
【課題】散布中の粉粒体の質量を、高い精度で測定することができる粉粒体質量検査装置を提供すること。【解決手段】粉粒体質量検査装置100であって、検査初期段階において、自由落下する粉粒体の画像データから生成した二値化画像データに基づいて、粉粒体の撮像面積を取得するデータ取得部90と、該撮像面積と、所定時間に測定された粉粒体の質量との対応関係を示す基準検量データ群又はその基準検量データ群の近似線である基準検量線を作成する基準検量線作成部50と、基準検量線を、所定の分割基準に基づいて複数の区分に区分けし、該区分それぞれにおいて、基準検量線の近似線を作成することにより、適合化検量線を作成する適合化検量線算出部55と、所定の選択基準項目のデータに基づいて前記区分を選択し、選択された前記区分における適合化検量線に基づいて、検査対象となる粉粒体の質量を算出する質量演算部70と、を有する。【選択図】図1 |
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【課題】散布中の粉粒体の質量を、高い精度で測定することができる粉粒体質量検査装置を提供すること。【解決手段】粉粒体質量検査装置100であって、検査初期段階において、自由落下する粉粒体の画像データから生成した二値化画像データに基づいて、粉粒体の撮像面積を取得するデータ取得部90と、該撮像面積と、所定時間に測定された粉粒体の質量との対応関係を示す基準検量データ群又はその基準検量データ群の近似線である基準検量線を作成する基準検量線作成部50と、基準検量線を、所定の分割基準に基づいて複数の区分に区分けし、該区分それぞれにおいて、基準検量線の近似線を作成することにより、適合化検量線を作成する適合化検量線算出部55と、所定の選択基準項目のデータに基づいて前記区分を選択し、選択された前記区分における適合化検量線に基づいて、検査対象となる粉粒体の質量を算出する質量演算部70と、を有する。【選択図】図1</description><language>eng ; jpn</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING ; WEIGHING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190117&DB=EPODOC&CC=JP&NR=2019007901A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190117&DB=EPODOC&CC=JP&NR=2019007901A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NAKAZAWA TOMOHIRO</creatorcontrib><creatorcontrib>MANABE RYOSUKE</creatorcontrib><title>APPARATUS AND METHOD FOR INSPECTING POWDER PARTICLE MASS, AND APPARATUS FOR PRODUCING POWDER CONTAINING ARTICLE AND METHOD FOR PRODUCING THE SAME</title><description>To provide a powder particle mass inspection apparatus capable of measuring the mass of a powder particle during spraying it with high accuracy.SOLUTION: A powder particle mass inspection apparatus 100 includes a data acquisition unit 90 which acquires an image pickup area of the particle based on the 2-value image data generated from the image data of a free falling particle; a reference calibration curve creating unit 50 for creating a reference calibration curve that shows a relationship between the image pickup area and the mass of the particle measured at a predetermined time, and the reference calibration curve which is an approximation line of the reference calibration data group; a calibration curve calculating unit 55 that prepares a calibration curve by dividing the reference calibration curve into a plurality of sections based on a predetermined dividing reference and creating an approximation line of a reference calibration curve in each of the partitions; and a mass calculation unit 70 for selecting the mass of the powder to be inspected based on the calibration curve for a selected segment, based on the data of a predetermined selection criteria, and calculating the mass of the powder to be inspected based on the calibration curve in the selected category.SELECTED DRAWING: Figure 1
【課題】散布中の粉粒体の質量を、高い精度で測定することができる粉粒体質量検査装置を提供すること。【解決手段】粉粒体質量検査装置100であって、検査初期段階において、自由落下する粉粒体の画像データから生成した二値化画像データに基づいて、粉粒体の撮像面積を取得するデータ取得部90と、該撮像面積と、所定時間に測定された粉粒体の質量との対応関係を示す基準検量データ群又はその基準検量データ群の近似線である基準検量線を作成する基準検量線作成部50と、基準検量線を、所定の分割基準に基づいて複数の区分に区分けし、該区分それぞれにおいて、基準検量線の近似線を作成することにより、適合化検量線を作成する適合化検量線算出部55と、所定の選択基準項目のデータに基づいて前記区分を選択し、選択された前記区分における適合化検量線に基づいて、検査対象となる粉粒体の質量を算出する質量演算部70と、を有する。【選択図】図1</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>WEIGHING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJjoGBDgGOQYEhqs4OjnouDrGuLh76Lg5h-k4OkXHODqHOLp564Q4B_u4hqkAFQY4uns46rg6xgcrANWj9AN0hIQ5O8S6oykw9nfL8TR0w8kAtOLZgtCS4iHq0Kwo68rDwNrWmJOcSovlOZmUHJzDXH20E0tyI9PLS5ITE7NSy2J9wowMjC0NDAwtzQwdDQmShEA_bVBDQ</recordid><startdate>20190117</startdate><enddate>20190117</enddate><creator>NAKAZAWA TOMOHIRO</creator><creator>MANABE RYOSUKE</creator><scope>EVB</scope></search><sort><creationdate>20190117</creationdate><title>APPARATUS AND METHOD FOR INSPECTING POWDER PARTICLE MASS, AND APPARATUS FOR PRODUCING POWDER CONTAINING ARTICLE AND METHOD FOR PRODUCING THE SAME</title><author>NAKAZAWA TOMOHIRO ; MANABE RYOSUKE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2019007901A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2019</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>WEIGHING</topic><toplevel>online_resources</toplevel><creatorcontrib>NAKAZAWA TOMOHIRO</creatorcontrib><creatorcontrib>MANABE RYOSUKE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAKAZAWA TOMOHIRO</au><au>MANABE RYOSUKE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>APPARATUS AND METHOD FOR INSPECTING POWDER PARTICLE MASS, AND APPARATUS FOR PRODUCING POWDER CONTAINING ARTICLE AND METHOD FOR PRODUCING THE SAME</title><date>2019-01-17</date><risdate>2019</risdate><abstract>To provide a powder particle mass inspection apparatus capable of measuring the mass of a powder particle during spraying it with high accuracy.SOLUTION: A powder particle mass inspection apparatus 100 includes a data acquisition unit 90 which acquires an image pickup area of the particle based on the 2-value image data generated from the image data of a free falling particle; a reference calibration curve creating unit 50 for creating a reference calibration curve that shows a relationship between the image pickup area and the mass of the particle measured at a predetermined time, and the reference calibration curve which is an approximation line of the reference calibration data group; a calibration curve calculating unit 55 that prepares a calibration curve by dividing the reference calibration curve into a plurality of sections based on a predetermined dividing reference and creating an approximation line of a reference calibration curve in each of the partitions; and a mass calculation unit 70 for selecting the mass of the powder to be inspected based on the calibration curve for a selected segment, based on the data of a predetermined selection criteria, and calculating the mass of the powder to be inspected based on the calibration curve in the selected category.SELECTED DRAWING: Figure 1
【課題】散布中の粉粒体の質量を、高い精度で測定することができる粉粒体質量検査装置を提供すること。【解決手段】粉粒体質量検査装置100であって、検査初期段階において、自由落下する粉粒体の画像データから生成した二値化画像データに基づいて、粉粒体の撮像面積を取得するデータ取得部90と、該撮像面積と、所定時間に測定された粉粒体の質量との対応関係を示す基準検量データ群又はその基準検量データ群の近似線である基準検量線を作成する基準検量線作成部50と、基準検量線を、所定の分割基準に基づいて複数の区分に区分けし、該区分それぞれにおいて、基準検量線の近似線を作成することにより、適合化検量線を作成する適合化検量線算出部55と、所定の選択基準項目のデータに基づいて前記区分を選択し、選択された前記区分における適合化検量線に基づいて、検査対象となる粉粒体の質量を算出する質量演算部70と、を有する。【選択図】図1</abstract><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING WEIGHING |
title | APPARATUS AND METHOD FOR INSPECTING POWDER PARTICLE MASS, AND APPARATUS FOR PRODUCING POWDER CONTAINING ARTICLE AND METHOD FOR PRODUCING THE SAME |
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