APPARATUS ABNORMALITY DIAGNOSIS METHOD AND APPARATUS ABNORMALITY DIAGNOSIS DEVICE

PROBLEM TO BE SOLVED: To obtain an abnormality diagnosis method with which it is possible to correctly detect a symptom of abnormality occurring in an object apparatus without being affected by a non-steady state change caused by spread of a state change in other apparatuses to the object apparatus,...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	YOKOHAMA KATSUHIKO, AOTA HIROMI, KOYAMA TOMONORI, ISHIZU YASUNORI, SHIBATA YASUNARI, KUBO HIROYOSHI
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASURING MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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