INSPECTION DEVICE
PROBLEM TO BE SOLVED: To provide an inspection device capable of accurately detecting foreign matter in an object to be inspected.SOLUTION: An inspection device 1 includes a main body part 2, a belt conveyor 51 which conveys an object to be inspected 61 in a Y direction, and a control device which c...
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| creator | TANNO TOSHIHIRO SAKATA KOICHI HAYASHI HIROYUKI |
| description | PROBLEM TO BE SOLVED: To provide an inspection device capable of accurately detecting foreign matter in an object to be inspected.SOLUTION: An inspection device 1 includes a main body part 2, a belt conveyor 51 which conveys an object to be inspected 61 in a Y direction, and a control device which controls the operation of each part of the inspection device 1. The main body part 2 includes a casing 4, an X-ray source 5 which irradiates the object to be inspected 61 with X-rays, and imaging parts 6 and 7 which image the object to be inspected 61 by using the X-rays. Each of the X-ray source 5 and the imaging parts 6 and 7 is installed in the casing 4. The imaging part 7 is arranged in a position different from the imaging part 6. In inspection, the object to be inspected 61 is irradiated with the X-rays by the X-ray source 5 and the object to be inspected 61 is imaged by the imaging parts 6 and 7 respectively. In the control device, the presence or absence of the foreign matter in the object to be inspected 61 is determined on the basis of each image data by a determination part.SELECTED DRAWING: Figure 3
【課題】被検物中の異物を精度良く検出することができる検査装置を提供する。【解決手段】検査装置１は、本体部２と、被検物６１をＹ方向に搬送するベルトコンベア５１と、検査装置１の各部の作動を制御する制御装置とを有している。本体部２は、ケーシング４と、被検物６１にＸ線を照射するＸ線源５と、Ｘ線を用いて被検物６１を撮像する撮像部６および７とを有している。Ｘ線源５、撮像部６および７は、それぞれ、ケーシング４に設置されている。撮像部７は、撮像部６とは異なる位置に配置されている。検査の際は、Ｘ線源５により被検物６１にＸ線を照射し、撮像部６および７により、それぞれ、被検物６１を撮像する。制御装置では、判別部により、各画像データに基づいて、被検物６１中の異物の有無を判別する。【選択図】図３ |
| format | Patent |
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【課題】被検物中の異物を精度良く検出することができる検査装置を提供する。【解決手段】検査装置１は、本体部２と、被検物６１をＹ方向に搬送するベルトコンベア５１と、検査装置１の各部の作動を制御する制御装置とを有している。本体部２は、ケーシング４と、被検物６１にＸ線を照射するＸ線源５と、Ｘ線を用いて被検物６１を撮像する撮像部６および７とを有している。Ｘ線源５、撮像部６および７は、それぞれ、ケーシング４に設置されている。撮像部７は、撮像部６とは異なる位置に配置されている。検査の際は、Ｘ線源５により被検物６１にＸ線を照射し、撮像部６および７により、それぞれ、被検物６１を撮像する。制御装置では、判別部により、各画像データに基づいて、被検物６１中の異物の有無を判別する。【選択図】図３</description><language>eng ; jpn</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171005&DB=EPODOC&CC=JP&NR=2017181402A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25544,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171005&DB=EPODOC&CC=JP&NR=2017181402A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TANNO TOSHIHIRO</creatorcontrib><creatorcontrib>SAKATA KOICHI</creatorcontrib><creatorcontrib>HAYASHI HIROYUKI</creatorcontrib><title>INSPECTION DEVICE</title><description>PROBLEM TO BE SOLVED: To provide an inspection device capable of accurately detecting foreign matter in an object to be inspected.SOLUTION: An inspection device 1 includes a main body part 2, a belt conveyor 51 which conveys an object to be inspected 61 in a Y direction, and a control device which controls the operation of each part of the inspection device 1. The main body part 2 includes a casing 4, an X-ray source 5 which irradiates the object to be inspected 61 with X-rays, and imaging parts 6 and 7 which image the object to be inspected 61 by using the X-rays. Each of the X-ray source 5 and the imaging parts 6 and 7 is installed in the casing 4. The imaging part 7 is arranged in a position different from the imaging part 6. In inspection, the object to be inspected 61 is irradiated with the X-rays by the X-ray source 5 and the object to be inspected 61 is imaged by the imaging parts 6 and 7 respectively. In the control device, the presence or absence of the foreign matter in the object to be inspected 61 is determined on the basis of each image data by a determination part.SELECTED DRAWING: Figure 3
【課題】被検物中の異物を精度良く検出することができる検査装置を提供する。【解決手段】検査装置１は、本体部２と、被検物６１をＹ方向に搬送するベルトコンベア５１と、検査装置１の各部の作動を制御する制御装置とを有している。本体部２は、ケーシング４と、被検物６１にＸ線を照射するＸ線源５と、Ｘ線を用いて被検物６１を撮像する撮像部６および７とを有している。Ｘ線源５、撮像部６および７は、それぞれ、ケーシング４に設置されている。撮像部７は、撮像部６とは異なる位置に配置されている。検査の際は、Ｘ線源５により被検物６１にＸ線を照射し、撮像部６および７により、それぞれ、被検物６１を撮像する。制御装置では、判別部により、各画像データに基づいて、被検物６１中の異物の有無を判別する。【選択図】図３</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBD09AsOcHUO8fT3U3BxDfN0duVhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGhuaGFoYmBkaOxkQpAgBaex4s</recordid><startdate>20171005</startdate><enddate>20171005</enddate><creator>TANNO TOSHIHIRO</creator><creator>SAKATA KOICHI</creator><creator>HAYASHI HIROYUKI</creator><scope>EVB</scope></search><sort><creationdate>20171005</creationdate><title>INSPECTION DEVICE</title><author>TANNO TOSHIHIRO ; SAKATA KOICHI ; HAYASHI HIROYUKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2017181402A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2017</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TANNO TOSHIHIRO</creatorcontrib><creatorcontrib>SAKATA KOICHI</creatorcontrib><creatorcontrib>HAYASHI HIROYUKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TANNO TOSHIHIRO</au><au>SAKATA KOICHI</au><au>HAYASHI HIROYUKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INSPECTION DEVICE</title><date>2017-10-05</date><risdate>2017</risdate><abstract>PROBLEM TO BE SOLVED: To provide an inspection device capable of accurately detecting foreign matter in an object to be inspected.SOLUTION: An inspection device 1 includes a main body part 2, a belt conveyor 51 which conveys an object to be inspected 61 in a Y direction, and a control device which controls the operation of each part of the inspection device 1. The main body part 2 includes a casing 4, an X-ray source 5 which irradiates the object to be inspected 61 with X-rays, and imaging parts 6 and 7 which image the object to be inspected 61 by using the X-rays. Each of the X-ray source 5 and the imaging parts 6 and 7 is installed in the casing 4. The imaging part 7 is arranged in a position different from the imaging part 6. In inspection, the object to be inspected 61 is irradiated with the X-rays by the X-ray source 5 and the object to be inspected 61 is imaged by the imaging parts 6 and 7 respectively. In the control device, the presence or absence of the foreign matter in the object to be inspected 61 is determined on the basis of each image data by a determination part.SELECTED DRAWING: Figure 3
【課題】被検物中の異物を精度良く検出することができる検査装置を提供する。【解決手段】検査装置１は、本体部２と、被検物６１をＹ方向に搬送するベルトコンベア５１と、検査装置１の各部の作動を制御する制御装置とを有している。本体部２は、ケーシング４と、被検物６１にＸ線を照射するＸ線源５と、Ｘ線を用いて被検物６１を撮像する撮像部６および７とを有している。Ｘ線源５、撮像部６および７は、それぞれ、ケーシング４に設置されている。撮像部７は、撮像部６とは異なる位置に配置されている。検査の際は、Ｘ線源５により被検物６１にＸ線を照射し、撮像部６および７により、それぞれ、被検物６１を撮像する。制御装置では、判別部により、各画像データに基づいて、被検物６１中の異物の有無を判別する。【選択図】図３</abstract><oa>free_for_read</oa></addata></record> |
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| title | INSPECTION DEVICE |
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