PARTICLE DETECTION SYSTEM AND PARTICLE DETECTION METHOD
PROBLEM TO BE SOLVED: To provide a particle detection system capable of coping with a change in a measurement environment.SOLUTION: A particle detection system comprises: an inspection device 100 includes a flow channel 2 through which a sample liquid containing a particle, a light source which appl...
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| creator | FURUYA MASA OBARA TASUKE |
| description | PROBLEM TO BE SOLVED: To provide a particle detection system capable of coping with a change in a measurement environment.SOLUTION: A particle detection system comprises: an inspection device 100 includes a flow channel 2 through which a sample liquid containing a particle, a light source which applies inspection light to the sample liquid, a light detection section which detects reaction light generated in the particle irradiated the inspection light and issues a measurement signal, and a noise removal filter which removes a noise from the measurement signal; a flow meter 200 which measures a flow rate of the sample liquid; an output device 401 which outputs the measured flow rate; an input device 402 which receives a setting for a frequency of the noise removed by the noise removal filter; and a control section 301 which controls the frequency of the noise removed by the noise removal filter according to an input from the input device 402.SELECTED DRAWING: Figure 1
【課題】測定環境の変化に対応可能な粒子検出システムを提供する。【解決手段】粒子を含むサンプル液が流れる流路２と、サンプル液に検査光を照射する光源、検査光を照射された粒子で生じる反応光を検出し、測定信号を発する光検出部、及び測定信号からノイズを除去するノイズ除去フィルタを備える検査装置１００と、サンプル液の流量を測定する流量計２００と、測定された流量を出力する出力装置４０１と、ノイズ除去フィルタが除去するノイズの周波数の設定を受け付ける入力装置４０２と、入力装置４０２からの入力に従って、ノイズ除去フィルタが除去するノイズの周波数を制御する制御部３０１と、を備える、粒子検出システム。【選択図】図１ |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2017146240A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2017146240A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2017146240A3</originalsourceid><addsrcrecordid>eNrjZDAPcAwK8XT2cVVwcQ1xdQ7x9PdTCI4MDnH1VXD0c1HAIuvrGuLh78LDwJqWmFOcyguluRmU3FxDnD10Uwvy41OLCxKTU_NSS-K9AowMDM0NTcyMTAwcjYlSBACSaCin</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PARTICLE DETECTION SYSTEM AND PARTICLE DETECTION METHOD</title><source>esp@cenet</source><creator>FURUYA MASA ; OBARA TASUKE</creator><creatorcontrib>FURUYA MASA ; OBARA TASUKE</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a particle detection system capable of coping with a change in a measurement environment.SOLUTION: A particle detection system comprises: an inspection device 100 includes a flow channel 2 through which a sample liquid containing a particle, a light source which applies inspection light to the sample liquid, a light detection section which detects reaction light generated in the particle irradiated the inspection light and issues a measurement signal, and a noise removal filter which removes a noise from the measurement signal; a flow meter 200 which measures a flow rate of the sample liquid; an output device 401 which outputs the measured flow rate; an input device 402 which receives a setting for a frequency of the noise removed by the noise removal filter; and a control section 301 which controls the frequency of the noise removed by the noise removal filter according to an input from the input device 402.SELECTED DRAWING: Figure 1
【課題】測定環境の変化に対応可能な粒子検出システムを提供する。【解決手段】粒子を含むサンプル液が流れる流路２と、サンプル液に検査光を照射する光源、検査光を照射された粒子で生じる反応光を検出し、測定信号を発する光検出部、及び測定信号からノイズを除去するノイズ除去フィルタを備える検査装置１００と、サンプル液の流量を測定する流量計２００と、測定された流量を出力する出力装置４０１と、ノイズ除去フィルタが除去するノイズの周波数の設定を受け付ける入力装置４０２と、入力装置４０２からの入力に従って、ノイズ除去フィルタが除去するノイズの周波数を制御する制御部３０１と、を備える、粒子検出システム。【選択図】図１</description><language>eng ; jpn</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170824&DB=EPODOC&CC=JP&NR=2017146240A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170824&DB=EPODOC&CC=JP&NR=2017146240A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FURUYA MASA</creatorcontrib><creatorcontrib>OBARA TASUKE</creatorcontrib><title>PARTICLE DETECTION SYSTEM AND PARTICLE DETECTION METHOD</title><description>PROBLEM TO BE SOLVED: To provide a particle detection system capable of coping with a change in a measurement environment.SOLUTION: A particle detection system comprises: an inspection device 100 includes a flow channel 2 through which a sample liquid containing a particle, a light source which applies inspection light to the sample liquid, a light detection section which detects reaction light generated in the particle irradiated the inspection light and issues a measurement signal, and a noise removal filter which removes a noise from the measurement signal; a flow meter 200 which measures a flow rate of the sample liquid; an output device 401 which outputs the measured flow rate; an input device 402 which receives a setting for a frequency of the noise removed by the noise removal filter; and a control section 301 which controls the frequency of the noise removed by the noise removal filter according to an input from the input device 402.SELECTED DRAWING: Figure 1
【課題】測定環境の変化に対応可能な粒子検出システムを提供する。【解決手段】粒子を含むサンプル液が流れる流路２と、サンプル液に検査光を照射する光源、検査光を照射された粒子で生じる反応光を検出し、測定信号を発する光検出部、及び測定信号からノイズを除去するノイズ除去フィルタを備える検査装置１００と、サンプル液の流量を測定する流量計２００と、測定された流量を出力する出力装置４０１と、ノイズ除去フィルタが除去するノイズの周波数の設定を受け付ける入力装置４０２と、入力装置４０２からの入力に従って、ノイズ除去フィルタが除去するノイズの周波数を制御する制御部３０１と、を備える、粒子検出システム。【選択図】図１</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAPcAwK8XT2cVVwcQ1xdQ7x9PdTCI4MDnH1VXD0c1HAIuvrGuLh78LDwJqWmFOcyguluRmU3FxDnD10Uwvy41OLCxKTU_NSS-K9AowMDM0NTcyMTAwcjYlSBACSaCin</recordid><startdate>20170824</startdate><enddate>20170824</enddate><creator>FURUYA MASA</creator><creator>OBARA TASUKE</creator><scope>EVB</scope></search><sort><creationdate>20170824</creationdate><title>PARTICLE DETECTION SYSTEM AND PARTICLE DETECTION METHOD</title><author>FURUYA MASA ; OBARA TASUKE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2017146240A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2017</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>FURUYA MASA</creatorcontrib><creatorcontrib>OBARA TASUKE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FURUYA MASA</au><au>OBARA TASUKE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PARTICLE DETECTION SYSTEM AND PARTICLE DETECTION METHOD</title><date>2017-08-24</date><risdate>2017</risdate><abstract>PROBLEM TO BE SOLVED: To provide a particle detection system capable of coping with a change in a measurement environment.SOLUTION: A particle detection system comprises: an inspection device 100 includes a flow channel 2 through which a sample liquid containing a particle, a light source which applies inspection light to the sample liquid, a light detection section which detects reaction light generated in the particle irradiated the inspection light and issues a measurement signal, and a noise removal filter which removes a noise from the measurement signal; a flow meter 200 which measures a flow rate of the sample liquid; an output device 401 which outputs the measured flow rate; an input device 402 which receives a setting for a frequency of the noise removed by the noise removal filter; and a control section 301 which controls the frequency of the noise removed by the noise removal filter according to an input from the input device 402.SELECTED DRAWING: Figure 1
【課題】測定環境の変化に対応可能な粒子検出システムを提供する。【解決手段】粒子を含むサンプル液が流れる流路２と、サンプル液に検査光を照射する光源、検査光を照射された粒子で生じる反応光を検出し、測定信号を発する光検出部、及び測定信号からノイズを除去するノイズ除去フィルタを備える検査装置１００と、サンプル液の流量を測定する流量計２００と、測定された流量を出力する出力装置４０１と、ノイズ除去フィルタが除去するノイズの周波数の設定を受け付ける入力装置４０２と、入力装置４０２からの入力に従って、ノイズ除去フィルタが除去するノイズの周波数を制御する制御部３０１と、を備える、粒子検出システム。【選択図】図１</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | PARTICLE DETECTION SYSTEM AND PARTICLE DETECTION METHOD |
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