ELECTRICAL CONNECTION DEVICE AND INSPECTION METHOD
PROBLEM TO BE SOLVED: To accurately bring a probe into contact with a wiring terminal and reliably determine electrical contact of the probe to the wiring terminal.SOLUTION: An electrical connection device, in which electric contacts (8-1 and 8-2) are provided at positions of terminals (12-1 and 12-...
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| creator | FUKAMI YOSHIYUKI |
| description | PROBLEM TO BE SOLVED: To accurately bring a probe into contact with a wiring terminal and reliably determine electrical contact of the probe to the wiring terminal.SOLUTION: An electrical connection device, in which electric contacts (8-1 and 8-2) are provided at positions of terminals (12-1 and 12-2) of a plurality of wiring patterns (11-1 and 11-2) of an inspection target body 10 respectively, comprises: a changeover section 6-2 for changing over the electrical connection state between the respective terminals (12-1 and 12-2) and the electric contacts (8-1 and 8-2); an electric capacitance measurement section 3 for measuring electric capacitance between the wiring patterns (11-1 and 11-2) or between the wiring pattern (11-1 or 11-2) and a ground; and a control section 1 for determining the electrical contact state between the terminals (12-1 and 12-2) and the electric contacts (8-1 and 8-2), before measurement of insulation resistance between the wiring patterns (11-1 and 11-2), according to the result of the electric capacitance measurement.SELECTED DRAWING: Figure 1
【課題】配線端子にプローブを精度良く接触させ、又配線端子へのプローブの電気的な接触を確実に判断できるようにする。【解決手段】被検査体１０の複数の配線パターン（１１−１及び１１−２）のそれぞれの各端子（１２−１及び１２−２）の位置に、電気接触子（８−１及び８−２）を配設、及び各端子（１２−１及び１２−２）と電気接触子（８−１及び８−２）との間の電気的な接続状態を切り替える切替部６−２と、配線パターン（１１−１と１１−２）間、又は配線パターン（１１−１或いは１１−２）とグランドとの間の電気容量を測定する電気容量測定部３と、配線パターン（１１−１と１１−２）間の絶縁抵抗測定前に、電気容量測定結果に応じて、端子（１２−１及び１２−２）と電気接触子（８−１及び８−２）との電気的な接触状態を判断する制御部１と、を備える。【選択図】 図１ |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2017020965A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2017020965A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2017020965A3</originalsourceid><addsrcrecordid>eNrjZDBy9XF1DgnydHb0UXD29_MDcjz9_RRcXMM8nV0VHP1cFDz9ggOgor6uIR7-LjwMrGmJOcWpvFCam0HJzTXE2UM3tSA_PrW4IDE5NS-1JN4rwMjA0NzAyMDSzNTRmChFAL6WJzU</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ELECTRICAL CONNECTION DEVICE AND INSPECTION METHOD</title><source>esp@cenet</source><creator>FUKAMI YOSHIYUKI</creator><creatorcontrib>FUKAMI YOSHIYUKI</creatorcontrib><description>PROBLEM TO BE SOLVED: To accurately bring a probe into contact with a wiring terminal and reliably determine electrical contact of the probe to the wiring terminal.SOLUTION: An electrical connection device, in which electric contacts (8-1 and 8-2) are provided at positions of terminals (12-1 and 12-2) of a plurality of wiring patterns (11-1 and 11-2) of an inspection target body 10 respectively, comprises: a changeover section 6-2 for changing over the electrical connection state between the respective terminals (12-1 and 12-2) and the electric contacts (8-1 and 8-2); an electric capacitance measurement section 3 for measuring electric capacitance between the wiring patterns (11-1 and 11-2) or between the wiring pattern (11-1 or 11-2) and a ground; and a control section 1 for determining the electrical contact state between the terminals (12-1 and 12-2) and the electric contacts (8-1 and 8-2), before measurement of insulation resistance between the wiring patterns (11-1 and 11-2), according to the result of the electric capacitance measurement.SELECTED DRAWING: Figure 1
【課題】配線端子にプローブを精度良く接触させ、又配線端子へのプローブの電気的な接触を確実に判断できるようにする。【解決手段】被検査体１０の複数の配線パターン（１１−１及び１１−２）のそれぞれの各端子（１２−１及び１２−２）の位置に、電気接触子（８−１及び８−２）を配設、及び各端子（１２−１及び１２−２）と電気接触子（８−１及び８−２）との間の電気的な接続状態を切り替える切替部６−２と、配線パターン（１１−１と１１−２）間、又は配線パターン（１１−１或いは１１−２）とグランドとの間の電気容量を測定する電気容量測定部３と、配線パターン（１１−１と１１−２）間の絶縁抵抗測定前に、電気容量測定結果に応じて、端子（１２−１及び１２−２）と電気接触子（８−１及び８−２）との電気的な接触状態を判断する制御部１と、を備える。【選択図】 図１</description><language>eng ; jpn</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170126&DB=EPODOC&CC=JP&NR=2017020965A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170126&DB=EPODOC&CC=JP&NR=2017020965A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FUKAMI YOSHIYUKI</creatorcontrib><title>ELECTRICAL CONNECTION DEVICE AND INSPECTION METHOD</title><description>PROBLEM TO BE SOLVED: To accurately bring a probe into contact with a wiring terminal and reliably determine electrical contact of the probe to the wiring terminal.SOLUTION: An electrical connection device, in which electric contacts (8-1 and 8-2) are provided at positions of terminals (12-1 and 12-2) of a plurality of wiring patterns (11-1 and 11-2) of an inspection target body 10 respectively, comprises: a changeover section 6-2 for changing over the electrical connection state between the respective terminals (12-1 and 12-2) and the electric contacts (8-1 and 8-2); an electric capacitance measurement section 3 for measuring electric capacitance between the wiring patterns (11-1 and 11-2) or between the wiring pattern (11-1 or 11-2) and a ground; and a control section 1 for determining the electrical contact state between the terminals (12-1 and 12-2) and the electric contacts (8-1 and 8-2), before measurement of insulation resistance between the wiring patterns (11-1 and 11-2), according to the result of the electric capacitance measurement.SELECTED DRAWING: Figure 1
【課題】配線端子にプローブを精度良く接触させ、又配線端子へのプローブの電気的な接触を確実に判断できるようにする。【解決手段】被検査体１０の複数の配線パターン（１１−１及び１１−２）のそれぞれの各端子（１２−１及び１２−２）の位置に、電気接触子（８−１及び８−２）を配設、及び各端子（１２−１及び１２−２）と電気接触子（８−１及び８−２）との間の電気的な接続状態を切り替える切替部６−２と、配線パターン（１１−１と１１−２）間、又は配線パターン（１１−１或いは１１−２）とグランドとの間の電気容量を測定する電気容量測定部３と、配線パターン（１１−１と１１−２）間の絶縁抵抗測定前に、電気容量測定結果に応じて、端子（１２−１及び１２−２）と電気接触子（８−１及び８−２）との電気的な接触状態を判断する制御部１と、を備える。【選択図】 図１</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBy9XF1DgnydHb0UXD29_MDcjz9_RRcXMM8nV0VHP1cFDz9ggOgor6uIR7-LjwMrGmJOcWpvFCam0HJzTXE2UM3tSA_PrW4IDE5NS-1JN4rwMjA0NzAyMDSzNTRmChFAL6WJzU</recordid><startdate>20170126</startdate><enddate>20170126</enddate><creator>FUKAMI YOSHIYUKI</creator><scope>EVB</scope></search><sort><creationdate>20170126</creationdate><title>ELECTRICAL CONNECTION DEVICE AND INSPECTION METHOD</title><author>FUKAMI YOSHIYUKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2017020965A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2017</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>FUKAMI YOSHIYUKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FUKAMI YOSHIYUKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ELECTRICAL CONNECTION DEVICE AND INSPECTION METHOD</title><date>2017-01-26</date><risdate>2017</risdate><abstract>PROBLEM TO BE SOLVED: To accurately bring a probe into contact with a wiring terminal and reliably determine electrical contact of the probe to the wiring terminal.SOLUTION: An electrical connection device, in which electric contacts (8-1 and 8-2) are provided at positions of terminals (12-1 and 12-2) of a plurality of wiring patterns (11-1 and 11-2) of an inspection target body 10 respectively, comprises: a changeover section 6-2 for changing over the electrical connection state between the respective terminals (12-1 and 12-2) and the electric contacts (8-1 and 8-2); an electric capacitance measurement section 3 for measuring electric capacitance between the wiring patterns (11-1 and 11-2) or between the wiring pattern (11-1 or 11-2) and a ground; and a control section 1 for determining the electrical contact state between the terminals (12-1 and 12-2) and the electric contacts (8-1 and 8-2), before measurement of insulation resistance between the wiring patterns (11-1 and 11-2), according to the result of the electric capacitance measurement.SELECTED DRAWING: Figure 1
【課題】配線端子にプローブを精度良く接触させ、又配線端子へのプローブの電気的な接触を確実に判断できるようにする。【解決手段】被検査体１０の複数の配線パターン（１１−１及び１１−２）のそれぞれの各端子（１２−１及び１２−２）の位置に、電気接触子（８−１及び８−２）を配設、及び各端子（１２−１及び１２−２）と電気接触子（８−１及び８−２）との間の電気的な接続状態を切り替える切替部６−２と、配線パターン（１１−１と１１−２）間、又は配線パターン（１１−１或いは１１−２）とグランドとの間の電気容量を測定する電気容量測定部３と、配線パターン（１１−１と１１−２）間の絶縁抵抗測定前に、電気容量測定結果に応じて、端子（１２−１及び１２−２）と電気接触子（８−１及び８−２）との電気的な接触状態を判断する制御部１と、を備える。【選択図】 図１</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | ELECTRICAL CONNECTION DEVICE AND INSPECTION METHOD |
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