CONTROLLER, CONTROL METHOD, AND ANALYSIS SYSTEM
PROBLEM TO BE SOLVED: To provide a controller capable of improving operability of a spectroscopic analyzer.SOLUTION: A controller 100 is a controller for controlling a spectroscopic analyzer 101 and includes a sample image display controller 12 for controlling a display 30 to display a sample image...
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| creator | TACHIBANA KAZUHIRO ABE SEI ZAIKI HISASHI |
| description | PROBLEM TO BE SOLVED: To provide a controller capable of improving operability of a spectroscopic analyzer.SOLUTION: A controller 100 is a controller for controlling a spectroscopic analyzer 101 and includes a sample image display controller 12 for controlling a display 30 to display a sample image acquired by the spectroscopic analyzer 101 and an analyzer controller 14 for controlling the spectroscopic analyzer 101 to initiate analysis based on designation of the analysis position of the sample image by pointing means 20 and to terminate analysis for the spectroscopic analyzer 101 based on release of the designation of the analysis position by the pointing means 20.SELECTED DRAWING: Figure 1
【課題】分光分析装置の操作性を向上させることができる制御装置を提供する。【解決手段】制御装置１００は、分光分析装置１０１を制御する制御装置であって、分光分析装置１０１で取得された試料像を表示部３０に表示させる制御を行う試料像表示制御部１２と、ポインティング手段２０による試料像上の分析位置の指定に基づき分光分析装置１０１に対して分析を開始させる制御を行い、ポインティング手段２０による分析位置の指定の解除に基づき分光分析装置１０１に対して分析を終了させる制御を行う分析装置制御部１４と、を含む。【選択図】図１ |
| format | Patent |
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【課題】分光分析装置の操作性を向上させることができる制御装置を提供する。【解決手段】制御装置１００は、分光分析装置１０１を制御する制御装置であって、分光分析装置１０１で取得された試料像を表示部３０に表示させる制御を行う試料像表示制御部１２と、ポインティング手段２０による試料像上の分析位置の指定に基づき分光分析装置１０１に対して分析を開始させる制御を行い、ポインティング手段２０による分析位置の指定の解除に基づき分光分析装置１０１に対して分析を終了させる制御を行う分析装置制御部１４と、を含む。【選択図】図１</description><language>eng ; jpn</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20161208&DB=EPODOC&CC=JP&NR=2016206088A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25569,76552</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20161208&DB=EPODOC&CC=JP&NR=2016206088A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TACHIBANA KAZUHIRO</creatorcontrib><creatorcontrib>ABE SEI</creatorcontrib><creatorcontrib>ZAIKI HISASHI</creatorcontrib><title>CONTROLLER, CONTROL METHOD, AND ANALYSIS SYSTEM</title><description>PROBLEM TO BE SOLVED: To provide a controller capable of improving operability of a spectroscopic analyzer.SOLUTION: A controller 100 is a controller for controlling a spectroscopic analyzer 101 and includes a sample image display controller 12 for controlling a display 30 to display a sample image acquired by the spectroscopic analyzer 101 and an analyzer controller 14 for controlling the spectroscopic analyzer 101 to initiate analysis based on designation of the analysis position of the sample image by pointing means 20 and to terminate analysis for the spectroscopic analyzer 101 based on release of the designation of the analysis position by the pointing means 20.SELECTED DRAWING: Figure 1
【課題】分光分析装置の操作性を向上させることができる制御装置を提供する。【解決手段】制御装置１００は、分光分析装置１０１を制御する制御装置であって、分光分析装置１０１で取得された試料像を表示部３０に表示させる制御を行う試料像表示制御部１２と、ポインティング手段２０による試料像上の分析位置の指定に基づき分光分析装置１０１に対して分析を開始させる制御を行い、ポインティング手段２０による分析位置の指定の解除に基づき分光分析装置１０１に対して分析を終了させる制御を行う分析装置制御部１４と、を含む。【選択図】図１</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNB39vcLCfL38XEN0lGAshV8XUM8_F10FBz9XIDY0Scy2DNYITgyOMTVl4eBNS0xpziVF0pzMyi5uYY4e-imFuTHpxYXJCan5qWWxHsFGBkYmhkZmBlYWDgaE6UIAFpxJoY</recordid><startdate>20161208</startdate><enddate>20161208</enddate><creator>TACHIBANA KAZUHIRO</creator><creator>ABE SEI</creator><creator>ZAIKI HISASHI</creator><scope>EVB</scope></search><sort><creationdate>20161208</creationdate><title>CONTROLLER, CONTROL METHOD, AND ANALYSIS SYSTEM</title><author>TACHIBANA KAZUHIRO ; ABE SEI ; ZAIKI HISASHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2016206088A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2016</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TACHIBANA KAZUHIRO</creatorcontrib><creatorcontrib>ABE SEI</creatorcontrib><creatorcontrib>ZAIKI HISASHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TACHIBANA KAZUHIRO</au><au>ABE SEI</au><au>ZAIKI HISASHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CONTROLLER, CONTROL METHOD, AND ANALYSIS SYSTEM</title><date>2016-12-08</date><risdate>2016</risdate><abstract>PROBLEM TO BE SOLVED: To provide a controller capable of improving operability of a spectroscopic analyzer.SOLUTION: A controller 100 is a controller for controlling a spectroscopic analyzer 101 and includes a sample image display controller 12 for controlling a display 30 to display a sample image acquired by the spectroscopic analyzer 101 and an analyzer controller 14 for controlling the spectroscopic analyzer 101 to initiate analysis based on designation of the analysis position of the sample image by pointing means 20 and to terminate analysis for the spectroscopic analyzer 101 based on release of the designation of the analysis position by the pointing means 20.SELECTED DRAWING: Figure 1
【課題】分光分析装置の操作性を向上させることができる制御装置を提供する。【解決手段】制御装置１００は、分光分析装置１０１を制御する制御装置であって、分光分析装置１０１で取得された試料像を表示部３０に表示させる制御を行う試料像表示制御部１２と、ポインティング手段２０による試料像上の分析位置の指定に基づき分光分析装置１０１に対して分析を開始させる制御を行い、ポインティング手段２０による分析位置の指定の解除に基づき分光分析装置１０１に対して分析を終了させる制御を行う分析装置制御部１４と、を含む。【選択図】図１</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | CONTROLLER, CONTROL METHOD, AND ANALYSIS SYSTEM |
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