APPEARANCE INSPECTION DEVICE, APPEARANCE INSPECTION SYSTEM AND APPEARANCE INSPECTION METHOD
PROBLEM TO BE SOLVED: To provide an appearance inspection device, appearance inspection system and appearance method that allow an appearance inspection of a wire harness to be performed with constant accuracy in short time.SOLUTION: An appearance inspection device comprises: imaging means 15 that p...
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| creator | HIRAI KENGO ASAMI KAZUHIKO IKEDA TAKEHIDE IKEZAWA TADASHI FURUTA SHIGEYUKI |
| description | PROBLEM TO BE SOLVED: To provide an appearance inspection device, appearance inspection system and appearance method that allow an appearance inspection of a wire harness to be performed with constant accuracy in short time.SOLUTION: An appearance inspection device comprises: imaging means 15 that photographs a two-dimensional image on an assembly drawing board; three-dimensional measurement means 10 that measures the assembly drawing board by an optical cutting method; an imaging control unit 32 that controls the imaging means 15 so as to photograph the assembly drawing board having a wire harness W disposed, and acquires the two-dimensional image; a first computation unit 22 that controls the three-dimensional measurement means 10 so as to measure the assembly drawing board having the wire harness W disposed, and calculates three-dimensional data; a second computation unit 33 that allocates the calculated three-dimensional data to the acquired two-dimensional image and gives the two-dimensional image height information; and an image comparison unit 35 that compares the two-dimensional image having the height information given with a reference image having a preliminarily acquired height information.SELECTED DRAWING: Figure 2
【課題】ワイヤーハーネスの外観検査を短時間に一定の精度で行うことが可能な外観検査装置、外観検査システム、及び外観検査方法を提供する。【解決手段】組立図板上において二次元画像を撮像する撮像手段１５と、光切断法により組立図板上を計測する三次元計測手段１０と、ワイヤーハーネスＷが配設された組立図板上を撮像するように撮像手段１５を制御し、二次元画像を取得する撮像制御部３２と、ワイヤーハーネスＷが配設された組立図板上を計測するように三次元計測手段１０を制御し、三次元データを算出する第一の演算部２２と、算出した三次元データを、取得した二次元画像に割り当てて、二次元画像に高さの情報を付与する第二の演算部３３と、該高さの情報を付与した二次元画像と予め取得した高さの情報を有する基準画像とを比較する画像比較部３５とを備える。【選択図】図２ |
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【課題】ワイヤーハーネスの外観検査を短時間に一定の精度で行うことが可能な外観検査装置、外観検査システム、及び外観検査方法を提供する。【解決手段】組立図板上において二次元画像を撮像する撮像手段１５と、光切断法により組立図板上を計測する三次元計測手段１０と、ワイヤーハーネスＷが配設された組立図板上を撮像するように撮像手段１５を制御し、二次元画像を取得する撮像制御部３２と、ワイヤーハーネスＷが配設された組立図板上を計測するように三次元計測手段１０を制御し、三次元データを算出する第一の演算部２２と、算出した三次元データを、取得した二次元画像に割り当てて、二次元画像に高さの情報を付与する第二の演算部３３と、該高さの情報を付与した二次元画像と予め取得した高さの情報を有する基準画像とを比較する画像比較部３５とを備える。【選択図】図２</description><language>eng ; jpn</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160523&DB=EPODOC&CC=JP&NR=2016090401A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160523&DB=EPODOC&CC=JP&NR=2016090401A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HIRAI KENGO</creatorcontrib><creatorcontrib>ASAMI KAZUHIKO</creatorcontrib><creatorcontrib>IKEDA TAKEHIDE</creatorcontrib><creatorcontrib>IKEZAWA TADASHI</creatorcontrib><creatorcontrib>FURUTA SHIGEYUKI</creatorcontrib><title>APPEARANCE INSPECTION DEVICE, APPEARANCE INSPECTION SYSTEM AND APPEARANCE INSPECTION METHOD</title><description>PROBLEM TO BE SOLVED: To provide an appearance inspection device, appearance inspection system and appearance method that allow an appearance inspection of a wire harness to be performed with constant accuracy in short time.SOLUTION: An appearance inspection device comprises: imaging means 15 that photographs a two-dimensional image on an assembly drawing board; three-dimensional measurement means 10 that measures the assembly drawing board by an optical cutting method; an imaging control unit 32 that controls the imaging means 15 so as to photograph the assembly drawing board having a wire harness W disposed, and acquires the two-dimensional image; a first computation unit 22 that controls the three-dimensional measurement means 10 so as to measure the assembly drawing board having the wire harness W disposed, and calculates three-dimensional data; a second computation unit 33 that allocates the calculated three-dimensional data to the acquired two-dimensional image and gives the two-dimensional image height information; and an image comparison unit 35 that compares the two-dimensional image having the height information given with a reference image having a preliminarily acquired height information.SELECTED DRAWING: Figure 2
【課題】ワイヤーハーネスの外観検査を短時間に一定の精度で行うことが可能な外観検査装置、外観検査システム、及び外観検査方法を提供する。【解決手段】組立図板上において二次元画像を撮像する撮像手段１５と、光切断法により組立図板上を計測する三次元計測手段１０と、ワイヤーハーネスＷが配設された組立図板上を撮像するように撮像手段１５を制御し、二次元画像を取得する撮像制御部３２と、ワイヤーハーネスＷが配設された組立図板上を計測するように三次元計測手段１０を制御し、三次元データを算出する第一の演算部２２と、算出した三次元データを、取得した二次元画像に割り当てて、二次元画像に高さの情報を付与する第二の演算部３３と、該高さの情報を付与した二次元画像と予め取得した高さの情報を有する基準画像とを比較する画像比較部３５とを備える。【選択図】図２</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZIh2DAhwdQxy9HN2VfD0Cw5wdQ7x9PdTcHEN83R21VHALhscGRzi6qvg6OeCQ4Gva4iHvwsPA2taYk5xKi-U5mZQcnMNcfbQTS3Ij08tLkhMTs1LLYn3CjAyMDQzsDQwMTB0NCZKEQDrazJ9</recordid><startdate>20160523</startdate><enddate>20160523</enddate><creator>HIRAI KENGO</creator><creator>ASAMI KAZUHIKO</creator><creator>IKEDA TAKEHIDE</creator><creator>IKEZAWA TADASHI</creator><creator>FURUTA SHIGEYUKI</creator><scope>EVB</scope></search><sort><creationdate>20160523</creationdate><title>APPEARANCE INSPECTION DEVICE, APPEARANCE INSPECTION SYSTEM AND APPEARANCE INSPECTION METHOD</title><author>HIRAI KENGO ; ASAMI KAZUHIKO ; IKEDA TAKEHIDE ; IKEZAWA TADASHI ; FURUTA SHIGEYUKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2016090401A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2016</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HIRAI KENGO</creatorcontrib><creatorcontrib>ASAMI KAZUHIKO</creatorcontrib><creatorcontrib>IKEDA TAKEHIDE</creatorcontrib><creatorcontrib>IKEZAWA TADASHI</creatorcontrib><creatorcontrib>FURUTA SHIGEYUKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HIRAI KENGO</au><au>ASAMI KAZUHIKO</au><au>IKEDA TAKEHIDE</au><au>IKEZAWA TADASHI</au><au>FURUTA SHIGEYUKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>APPEARANCE INSPECTION DEVICE, APPEARANCE INSPECTION SYSTEM AND APPEARANCE INSPECTION METHOD</title><date>2016-05-23</date><risdate>2016</risdate><abstract>PROBLEM TO BE SOLVED: To provide an appearance inspection device, appearance inspection system and appearance method that allow an appearance inspection of a wire harness to be performed with constant accuracy in short time.SOLUTION: An appearance inspection device comprises: imaging means 15 that photographs a two-dimensional image on an assembly drawing board; three-dimensional measurement means 10 that measures the assembly drawing board by an optical cutting method; an imaging control unit 32 that controls the imaging means 15 so as to photograph the assembly drawing board having a wire harness W disposed, and acquires the two-dimensional image; a first computation unit 22 that controls the three-dimensional measurement means 10 so as to measure the assembly drawing board having the wire harness W disposed, and calculates three-dimensional data; a second computation unit 33 that allocates the calculated three-dimensional data to the acquired two-dimensional image and gives the two-dimensional image height information; and an image comparison unit 35 that compares the two-dimensional image having the height information given with a reference image having a preliminarily acquired height information.SELECTED DRAWING: Figure 2
【課題】ワイヤーハーネスの外観検査を短時間に一定の精度で行うことが可能な外観検査装置、外観検査システム、及び外観検査方法を提供する。【解決手段】組立図板上において二次元画像を撮像する撮像手段１５と、光切断法により組立図板上を計測する三次元計測手段１０と、ワイヤーハーネスＷが配設された組立図板上を撮像するように撮像手段１５を制御し、二次元画像を取得する撮像制御部３２と、ワイヤーハーネスＷが配設された組立図板上を計測するように三次元計測手段１０を制御し、三次元データを算出する第一の演算部２２と、算出した三次元データを、取得した二次元画像に割り当てて、二次元画像に高さの情報を付与する第二の演算部３３と、該高さの情報を付与した二次元画像と予め取得した高さの情報を有する基準画像とを比較する画像比較部３５とを備える。【選択図】図２</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | APPEARANCE INSPECTION DEVICE, APPEARANCE INSPECTION SYSTEM AND APPEARANCE INSPECTION METHOD |
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